WTX24X10242157W001-FCC Part 15.247B BLE
Test Report
PIN GENIE, INC. DBA LOCKLY PGD728FN21 Lockly Guard Deadbolt Flow Edition 728FN 2ASIVPGD728FN21 2ASIVPGD728FN21 pgd728fn21
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Document DEVICE REPORTGetApplicationAttachment.html?id=7781347TEST REPORT Reference No..................... : FCC ID ................................ : Applicant ........................... : Address ............................. : Manufacturer ..................... : Address ............................. : Product Name ................... : Model No............................ : Standards .......................... : Date of Receipt sample .... : Date of Test........................ : Date of Issue ..................... : Test Report Form No. ....... : Test Result......................... : WTX24X10242157W001 2ASIVPGD728FN21 PIN GENIE, INC. DBA LOCKLY 676 Transfer Rd., St. Paul, MN 55114 Smart Electronic Industrial (Dong Guan) Co., Ltd. Qing Long Road, Long Jian Tian Village, Huang Jiang Town, Dong Guan, Guang Dong, China Lockly Guard Deadbolt Flow Edition 728FN PGD728F FCC Part 15.247 2024-10-21 2024-10-21 to 2024-10-25 2024-10-25 WTX_Part 15_247W Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Dashan Chen Jason Su Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 37 Reference No.: WTX24X10242157W001 TABLE OF CONTENTS 1. GENERAL INFORMATION ....................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) .........................................................................4 1.2 TEST STANDARDS.................................................................................................................................................5 1.3 TEST METHODOLOGY ...........................................................................................................................................5 1.4 TEST FACILITY ......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE ..............................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY.............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS ...................................................................................................................8 2. SUMMARY OF TEST RESULTS.........................................................................................................................12 3. ANTENNA REQUIREMENT.................................................................................................................................13 3.1 STANDARD APPLICABLE .....................................................................................................................................13 3.2 EVALUATION INFORMATION ................................................................................................................................13 4. POWER SPECTRAL DENSITY...........................................................................................................................14 4.1 STANDARD APPLICABLE .....................................................................................................................................14 4.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................14 4.3 TEST PROCEDURE ..............................................................................................................................................14 4.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................14 5. DTS BANDWIDTH .................................................................................................................................................15 5.1 STANDARD APPLICABLE .....................................................................................................................................15 5.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................15 5.3 TEST PROCEDURE ..............................................................................................................................................15 5.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................15 6. RF OUTPUT POWER............................................................................................................................................16 6.1 STANDARD APPLICABLE .....................................................................................................................................16 6.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................16 6.3 TEST PROCEDURE ..............................................................................................................................................16 6.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................16 7. FIELD STRENGTH OF SPURIOUS EMISSIONS.............................................................................................17 7.1 STANDARD APPLICABLE .....................................................................................................................................17 7.2 TEST PROCEDURE ..............................................................................................................................................17 7.3 CORRECTED AMPLITUDE & MARGIN CALCULATION...........................................................................................19 7.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................19 8. OUT OF BAND EMISSIONS................................................................................................................................23 8.1 STANDARD APPLICABLE .....................................................................................................................................23 8.2 TEST PROCEDURE ..............................................................................................................................................23 8.3 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................24 9. CONDUCTED EMISSIONS ..................................................................................................................................27 9.1 TEST PROCEDURE ..............................................................................................................................................27 9.2 BASIC TEST SETUP BLOCK DIAGRAM ................................................................................................................27 9.3 TEST RECEIVER SETUP ......................................................................................................................................27 9.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................27 APPENDIX SUMMARY .............................................................................................................................................28 APPENDIX A...............................................................................................................................................................29 APPENDIX B...............................................................................................................................................................31 APPENDIX C...............................................................................................................................................................33 APPENDIX D...............................................................................................................................................................35 APPENDIX PHOTOGRAPHS...................................................................................................................................37 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 37 Reference No.: WTX24X10242157W001 Report version Version No. Rev.00 / Date of issue 2024-10-25 / Description Original / Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 37 Reference No.: WTX24X10242157W001 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) General Description of EUT Product Name: Lockly Guard Deadbolt Flow Edition 728FN Trade Name LOCKLY Model No.: PGD728F Adding Model(s): / Rated Voltage: DC6V Power Adapter: / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Bluetooth Version: V5.0 (BLE mode) Frequency Range: 2402-2480MHz RF Output Power: -1.80dBm (Conducted) Data Rate: 1Mbps Modulation: GFSK Quantity of Channels: 40 Channel Separation: 2MHz Type of Antenna: FPC Antenna Antenna Gain: 1.8dBi Note The Antenna Gain is provided by the customer and can affect the validity of results. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 37 Reference No.: WTX24X10242157W001 1.2 Test Standards The tests were performed according to following standards: FCC Rules Part 15.247: Frequency Hopping, Direct Spread Spectrum and Hybrid Systems that are in operation within the bands of 902-928MHz, 2400-2483.5MHz, and 5725-5850MHz. 558074 D01 15.247 Meas Guidance v05r02: Guidance for Compliance Measurements on Digital Transmission System, Frequency Hopping Spread Spectrum System, and Hybrid System Devices Operating under section 15.247 of the Fcc rules. ANSI C63.10-2013: American National Standard for Testing Unlicensed Wireless Devices. Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which result in lowering the emission, should be checked to ensure compliance has been maintained. 1.3 Test Methodology All measurements contained in this report were conducted with ANSI C63.10-2013, KDB 558074 D01 15.247 Meas Guidance v05r02. The equipment under test (EUT) was configured to measure its highest possible emission level. The test modes were adapted accordingly in reference to the Operating Instructions. 1.4 Test Facility Address of the test laboratory Laboratory: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China FCC Registration No.: 125990 Waltek Testing Group (Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the FCC (Federal Communications Commission). The acceptance letter from the FCC is mai ntained in our files. The Designation Number is CN5010, and Test Firm Registration Number is 125990. Industry Canada (IC) Registration No.: 11464A The 3m Semi-anechoic chamber of Waltek Testing Group (Shenzhen) Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.: 11464A and the CAB identifier is CN0057. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 5 of 37 Reference No.: WTX24X10242157W001 1.5 EUT Setup and Test Mode The EUT was operated in the engineering mode to fix the Tx frequency that was for the purpose of the measurements. All testing shall be performed under maximum output power condition, with a duty cycle equal to 100%, and to measure its highest possible emissions level, more detailed description as follows: Test Mode List Test Mode TM1 TM2 TM3 Description Low Middle High Test Conditions Temperature: Relative Humidity: ATM Pressure: EUT Cable List and Details Cable Description / Length (m) / Special Cable List and Details Cable Description / Length (m) / Remark 2402MHz 2440MHz 2480MHz 22~25 C 45~75 % 1019 mbar Shielded/Unshielded / With / Without Ferrite / Shielded/Unshielded / With / Without Ferrite / Auxiliary Equipment List and Details Description Manufacturer / / Model / Serial Number / Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 6 of 37 Reference No.: WTX24X10242157W001 1.6 Measurement Uncertainty Measurement uncertainty Parameter RF Output Power Occupied Bandwidth Power Spectral Density Conducted Spurious Emission Conducted Emissions Transmitter Spurious Emissions Conditions Conducted Conducted Conducted Conducted Conducted Radiated Uncertainty ±0.42dB ±1.5% ±1.8dB ±2.17dB 9-150kHz ±3.74dB 0.15-30MHz ±3.34dB 30-200MHz ±4.52dB 0.2-1GHz ±5.56dB 1-6GHz ±3.84dB 6-26GHz ±3.92dB Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 7 of 37 Reference No.: WTX24X10242157W001 1.7 Test Equipment List and Details Fixed asset Number Description WTXE1041A Communication 1001 Tester WTXE1005A Spectrum 1005 Analyzer WTXE1084A Spectrum 1001 Analyzer WTXE1004A Spectrum 1-001 Analyzer WTXE1103A 1003 Attenuator WTXE1003A 1-005 Coaxial Cable Chamber A: Below 1GHz WTXE1005A Spectrum 1003 Analyzer WTXE1001A EMI Test 1001 Receiver WTXE1007A 1001 Amplifier WTXE1010A 1007 Loop Antenna WTXE1010A Broadband 1006 Antenna WTXE1104A 1032-1 Coaxial Cable WTXE1104A 1032-2 Coaxial Cable WTXE1104A Coaxial Cable 1032-3 Chamber A: Above 1GHz WTXE1005A Spectrum 1003 Analyzer WTXE1001A EMI Test 1001 Receiver WTXE1065A 1001 Amplifier WTXE1010A 1005 Horn Antenna Manufacturer Rohde & Schwarz Agilent Agilent Rohde & Schwarz Pasternack / Rohde & Schwarz Rohde & Schwarz HP Schwarz beck Schwarz beck / / / Rohde & Schwarz Rohde & Schwarz C&D ETS Model CMW500 N9020A N9020A FSP40 PE4007-4 0M4RFC FSP30 ESPI 8447F FMZB 1516 VULB9163 RC_6G-N-M RC_6G-N-M RC_6G-N-M FSP30 ESPI PAP-1G18 3117 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 8 of 37 Serial No. Cal Date Due. Date 148650 2024-02-24 2025-02-23 US471401 02 MY543205 48 2024-03-19 2024-02-24 2025-03-18 2025-02-23 100612 2024-02-27 2025-02-26 / 2024-02-24 2025-02-23 / 2024-07-03 2025-01-03 836079/03 5 2024-02-24 2025-02-23 101611 2024-03-19 2025-03-18 2805A034 75 2024-02-24 2025-02-23 9773 2024-02-26 2025-02-25 9163-333 2024-02-24 2025-02-23 / 2024-03-15 2025-03-14 / 2024-03-15 2025-03-14 / 2024-03-15 2025-03-14 836079/03 5 2024-02-24 2025-02-23 101611 2024-03-19 2025-03-18 2002 2024-02-27 2025-02-26 00086197 2024-02-26 2025-02-25 Reference No.: WTX24X10242157W001 WTXE1010A DRG Horn 1010 Antenna WTXE1003A 1001 Pre-amplifier WTXE1104A 1033-1 Coaxial Cable WTXE1104A 1033-2 Coaxial Cable WTXE1104A 1033-3 Coaxial Cable Chamber B:Below 1GHz WTXE1010A 1006 Trilog Broadband Antenna WTXE1038A 1001 Amplifier WTXE1001A EMI Test 1002 Receiver WTXE1104A 1031-1 Coaxial Cable WTXE1104A 1031-2 Coaxial Cable WTXE1104A Coaxial Cable 1031-3 Chamber C:Below 1GHz WTXE1093A EMI Test 1001 Receiver WTXE1010A 1013-1 Trilog Broadband Antenna WTXE1010A 1007 Loop Antenna WTXE1007A 1002 Amplifier WTXE1104A 1034-1 Coaxial Cable WTXE1104A 1034-2 Coaxial Cable WTXE1104A 1034-3 Coaxial Cable Chamber C: Above 1GHz WTXE1093A EMI Test A.H. SYSTEMS Schwarzbeck / / / Schwarz beck Agilent Rohde & Schwarz / / / Rohde & Schwarz Schwarz beck Schwarz beck HP / / / Rohde & SAS-574 BBV 9721 C16-07-07 C16-07-07 C16-07-07 VULB9163(B) 8447D ESPI 1.5MRFC-LWB3 RG 316 RG 316 ESIB 26 VULB 9168 FMZB 1516 8447F RC_6G-N-M RC_6G-N-M RC_6G-N-M ESIB 26 571 9721-031 / / / 9163-635 2944A104 57 101391 / / / 100401 1194 9773 2944A038 69 / / / 100401 2024-03-17 2024-02-29 2024-03-15 2024-03-15 2024-03-15 2024-03-17 2024-02-24 2024-02-24 2024-07-03 2024-07-03 2024-07-03 2024-02-27 2024-04-18 2024-02-26 2024-02-24 2024-07-03 2024-07-03 2024-07-03 2024-02-27 2025-03-16 2025-02-28 2025-03-14 2025-03-14 2025-03-14 2027-03-16 2025-02-23 2025-02-23 2025-07-02 2025-07-02 2025-07-02 2025-02-26 2027-04-17 2025-02-25 2025-02-23 2025-07-02 2025-07-02 2025-07-02 2025-02-26 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 9 of 37 Reference No.: WTX24X10242157W001 1001 Receiver WTXE1103A 1005 Horn Antenna WTXE1103A 1006 Amplifier WTXE1010A DRG Horn 1010 Antenna WTXE1003A 1001 Pre-amplifier WTXE1104A 1035-1 Coaxial Cable WTXE1104A Coaxial Cable 1035-2 WTXE1104A 1035-3 Coaxial Cable Conducted Room 1# WTXE1104A EMI Test 1029 Receiver WTXE1002A Pulse Limiter 1001 WTXE1003A 1001 AC LISN WTXE1104A 1036 Coaxial Cable WTXE1104A 1038 Coaxial Cable Conducted Room 2# WTXE1001A EMI Test 1004 Receiver WTXE1003A 1003 LISN WTXE1104A 1037 Coaxial Cable Schwarz POAM Tonscend A.H. SYSTEMS Schwarzbeck / / / Rohde & Schwarz Rohde & Schwarz Schwarz beck / / Rohde & Schwarz Rohde & Schwarz / RTF-118A TAP01018050 SAS-574 BBV 9721 RC-18G-N-M RC-18G-N-M RC-18G-N-M ESCI ESH3-Z2 NSLK8126 RG 316 6MRFC-DP ESPI ENV 216 RG 316 1820 2023-03-10 2026-03-09 AP22E806 235 2024-02-27 2025-02-26 571 2024-03-17 2025-03-16 9721-031 2024-02-29 2025-02-28 / 2024-07-03 2025-07-02 / 2024-07-03 2025-07-02 / 2024-07-03 2025-07-02 100525 2023-12-12 2024-12-11 100911 2024-02-24 2025-02-23 8126-279 2024-02-24 2025-02-23 / 2024-07-03 2025-07-02 / 2024-07-03 2025-07-02 101259 2024-02-24 2025-02-23 100097 2024-02-24 2025-02-23 / 2024-07-03 2025-07-02 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 10 of 37 Reference No.: WTX24X10242157W001 Description EMI Test Software (Radiated Emission A) EMI Test Software (Radiated Emission B) EMI Test Software (Radiated Emission C) EMI Test Software (Conducted Emission Room 1#) EMI Test Software (Conducted Emission Room 2#) Software List Manufacturer Farad Farad Farad Farad Farad Model EZ-EMC EZ-EMC EZ-EMC EZ-EMC EZ-EMC *Remark: indicates software version used in the compliance certification testing. Version RA-03A1 (1.1.4.2) RA-03A1 (1.1.4.2) RA-03A1-2 (1.1.4.2) 3A1*CE-RE 1.1.4.3 3A1*CE-RE 1.1.4.3 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 11 of 37 Reference No.: WTX24X10242157W001 2. SUMMARY OF TEST RESULTS FCC Rules §15.203; §15.247(b)(4)(i) §15.205 §15.207(a) §15.247(e) §15.247(a)(2) §15.247(b)(3) §15.209(a) §15.247(d) N/A: Not applicable. Description of Test Item Antenna Requirement Restricted Band of Operation Conducted Emission Power Spectral Density DTS Bandwidth RF Output Power Radiated Emission Band Edge (Out of Band Emissions) Result Compliant Compliant N/A Compliant Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 12 of 37 Reference No.: WTX24X10242157W001 3. Antenna Requirement 3.1 Standard Applicable According to FCC Part 15.203, an intentional radiator shall be designed to ensure that no antenna other than that furnished by the responsible party shall be used with the device. The use of a permanently attached antenna or of an antenna that uses a unique coupling to the intentional radiator shall be considered sufficient to comply with the provisions of this section. 3.2 Evaluation Information This product has a FPC antenna, fulfill the requirement of this section. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 13 of 37 Reference No.: WTX24X10242157W001 4. Power Spectral Density 4.1 Standard Applicable According to 15.247(a)(1)(iii), for digitally modulated systems, the power spectral density conducted from the intentional radiator to the antenna shall not be greater than 8dBm in any 3kHz band during any time interval of continuous transmission. 4.2 Test Setup Block Diagram 4.3 Test Procedure According to the KDB 558074 D01 v05r02 Subclause 8.4 and ANSI C63.10-2013 Subclause 11.10.2, the test method of power spectral density as below: a) Set analyzer center frequency to DTS channel center frequency. b) Set the span to 1.5 times the DTS bandwidth. c) Set the RBW to: 3kHz RBW 100kHz. d) Set the VBW 3 × RBW. e) Detector = peak. f) Sweep time = auto couple. g) Trace mode = max hold. h) Allow trace to fully stabilize. i) Use the peak marker function to determine the maximum amplitude level within the RBW. j) If measured value exceeds limit, reduce RBW (no less than 3kHz) and repeat. 4.4 Summary of Test Results/Plots Please refer to Appendix A Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 14 of 37 Reference No.: WTX24X10242157W001 5. DTS Bandwidth 5.1 Standard Applicable According to 15.247(a)(2), systems using digital modulation techniques may operate in the 902928MHz, 24002483.5MHz, and 57255850 MHz bands. The minimum 6dB bandwidth shall be at least 500kHz. 5.2 Test Setup Block Diagram 5.3 Test Procedure According to the KDB 558074 D01 v05r02 Subclause 8.2 and ANSI C63.10-2013 Subclause 11.8.1, the test method of DTS Bandwidth as below: a) Set RBW = 100kHz. b) Set the video bandwidth (VBW) 3 × RBW. c) Detector = Peak. d) Trace mode = max hold. e) Sweep = auto couple. f) Allow the trace to stabilize. g) Measure the maximum width of the emission that is constrained by the frequencies associated with the two outermost amplitude points (upper and lower frequencies) that are attenuated by 6dB relative to the maximum level measured in the fundamental emission. 5.4 Summary of Test Results/Plots Please refer to Appendix B Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 15 of 37 Reference No.: WTX24X10242157W001 6. RF Output Power 6.1 Standard Applicable According to 15.247(b)(3), for systems using digital modulation in the 902928MHz, 24002483.5MHz, and 57255850MHz bands: 1 Watt. 6.2 Test Setup Block Diagram 6.3 Test Procedure According to the KDB-558074 D01 v05r02 Subclause 8.3.1.1 and ANSI C63.10-2013 Subclause 11.9.1.1, this procedure shall be used when the measurement instrument has available a resolution bandwidth that is greater than the DTS bandwidth. a) Set the RBW DTS bandwidth. b) Set VBW 3 × RBW. c) Set span 3 x RBW d) Sweep time = auto couple. e) Detector = peak. f) Trace mode = max hold. g) Allow trace to fully stabilize. h) Use peak marker function to determine the peak amplitude level. 6.4 Summary of Test Results/Plots Please refer to Appendix C Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 16 of 37 Reference No.: WTX24X10242157W001 7. Field Strength of Spurious Emissions 7.1 Standard Applicable According to §15.247(d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a). The emission limit in this paragraph is based on measurement instrumentation employing an average detector. The provisions in §15.35 for limiting peak emissions apply. Spurious Radiated Emissions measurements starting below or at the lowest crystal frequency. 7.2 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.205 15.247(a) and FCC Part 15.209 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. The test setup for emission measurement below 30MHz. Semi-anechoic 3m Chamber Turn Table From 0°to 360° 3m EUT 0.8m Turn Table PC System Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Spectrum Analyzer Page 17 of 37 AMP Combining Network Reference No.: WTX24X10242157W001 The test setup for emission measurement from 30MHz to 1GHz. Semi-anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360° 3m EUT 0.8m Turn Table PC System Spectrum Analyzer The test setup for emission measurement above 1GHz. AMP Combining Network Anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360° EUT 3m 1.5m Turn Table Absorbers PC System Spectrum Analyzer Frequency :9kHz-30MHz RBW=10KHz, VBW =30KHz Sweep time= Auto Trace = max hold Frequency :30MHz-1GHz RBW=120KHz, VBW=300KHz Sweep time= Auto Trace = max hold Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 18 of 37 AMP Combining Network Frequency :Above 1GHz RBW=1MHz, VBW=3MHz(Peak), 10Hz(AV) Sweep time= Auto Trace = max hold Reference No.: WTX24X10242157W001 Detector function = peak Detector function = peak, QP 7.3 Corrected Amplitude & Margin Calculation Detector function = peak, AV The Corrected Amplitude is calculated by adding the Antenna Factor and the Cable Factor, and subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows: Corr. Ampl. = Indicated Reading + Ant. Factor + Cable Loss Ampl. Gain The "Margin" column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of -6dBV means the emission is 6dBV below the maximum limit. The equation for margin calculation is as follows: Margin = Corr. Ampl. FCC Part 15 Limit 7.4 Summary of Test Results/Plots Note: this EUT was tested in 3 orthogonal positions and the worst case position data was reported. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 19 of 37 Reference No.: WTX24X10242157W001 Spurious Emissions Below 1GHz Test Channel Low(wost case) Polarity: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 44.7793 28.54 -7.96 20.58 40.00 -19.42 - - peak 2 106.2811 33.54 -11.41 22.13 43.50 -21.37 - - peak 3 205.7458 36.91 -11.51 25.40 43.50 -18.10 - - peak 4 464.8867 29.31 -5.06 24.25 46.00 -21.75 - - peak 5 689.0509 31.33 -1.22 30.11 46.00 -15.89 - - peak 6 965.4742 31.00 3.37 34.37 54.00 -19.63 - - peak Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 20 of 37 Reference No.: WTX24X10242157W001 Test Channel Low(wost case) Polarity: Vertical No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 30.2116 45.24 -9.62 35.62 40.00 -4.38 - - peak 2 49.4087 34.46 -7.63 26.83 40.00 -13.17 - - peak 3 74.2696 33.81 -11.18 22.63 40.00 -17.37 - - peak 4 124.9249 31.86 -9.67 22.19 43.50 -21.31 - - peak 5 313.6483 29.93 -7.57 22.36 46.00 -23.64 - - peak 6 468.1651 29.31 -5.05 24.26 46.00 -21.74 - - peak Remark: `-'Means' the test Degree and Height are not recorded by the test software and only show the worst case in the test report. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 21 of 37 Reference No.: WTX24X10242157W001 Spurious Emissions Above 1GHz Frequency Reading (MHz) (dBuV/m) 4795.868 7206.000 4795.868 7206.000 63.68 54.98 65.84 53.77 4870.396 7320.000 4870.396 7320.000 57.85 54.50 60.94 53.97 4960.000 7440.000 4971.571 7440.000 56.44 55.23 60.44 53.80 Correct dB -13.51 -7.36 -13.51 -7.36 -13.44 -7.72 -13.44 -7.72 -13.32 -8.08 -13.31 -8.08 Result Limit (dBuV/m) (dBuV/m) Low Channel-2402MHz 50.17 74.00 47.62 74.00 52.33 74.00 46.41 74.00 Middle Channel-2440MHz 44.41 74.00 46.78 74.00 47.50 74.00 46.25 74.00 High Channel-2480MHz 43.12 74.00 47.15 74.00 47.13 74.00 45.72 74.00 Margin (dB) -23.83 -26.38 -21.67 -27.59 -29.59 -27.22 -26.50 -27.75 -30.88 -26.85 -26.87 -28.28 Polar H/V H H V V H H V V H H V V Detector PK PK PK PK PK PK PK PK PK PK PK PK Note: Testing is carried out with frequency rang 9kHz to the tenth harmonics, other than listed in the table above are attenuated more than 20dB below the permissible limits or the field strength is too small to be measured. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 22 of 37 Reference No.: WTX24X10242157W001 8. Out of Band Emissions 8.1 Standard Applicable According to §15.247(d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a). 8.2 Test Procedure According to the KDB 558074 D01 v05r02 Subclause 8.4 and ANSI C63.10-2013 Subclause 11.11, the Emissions in nonrestricted frequency bands test method as follows: a) Set the center frequency and span to encompass frequency range to be measured. b) Set the RBW = 100kHz. c) Set the VBW [3 × RBW]. d) Detector = peak. e) Sweep time = auto couple. f) Trace mode = max hold. g) Allow trace to fully stabilize. h) Use the peak marker function to determine the maximum amplitude level. According to the KDB 558074 D01 v05r02 Subclause 8.5 and ANSI C63.10-2013 Subclause 11.12, the Emissions in restricted frequency bands test method as follows: A. Radiated emission measurements: Set span = wide enough to capture the peak level of the emission operating on the channel closest to the bandedge, as well as any modulation products which fall outside of the authorized band of operation (2310MHz to 2420MHz for low bandedge, 2460MHz to 2500MHz for the high bandedge) RBW = 1MHz, VBW = 1MHz for peak value measured RBW = 1MHz, VBW = 10Hz for average value measured Sweep = auto; Detector function = peak/average; Trace = max hold All the trace to stabilize, set the marker on the emission at the bandedge, or on the highest modulation product outside of the band, if this level is greater than that at the bandedge. Enable the marker-delta function, then use the marker-to-peak function to move the marker to the peak of the in-band emission. Those emission Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 23 of 37 Reference No.: WTX24X10242157W001 must comply with the 15.209 limit for fall in the restricted bands listed in section 15.205. Note that the method of measurement KDB publication number: 913591 may be used for the radiated bandedge measurements. B. Antenna-port conducted measurements Peak emission levels are measured by setting the instrument as follows: a) RBW = as specified in Table 9. b) VBW [3 × RBW]. c) Detector = peak. d) Sweep time = auto. e) Trace mode = max hold. f) Allow sweeps to continue until the trace stabilizes. (Note that the required measurement time may be lengthened for low-duty-cycle applications.) RBW as a function of frequency Frequency RBW 9kHz to 150kHz 200Hz to 300Hz 0.15MHz to 30MHz 9kHz to 10kHz 30MHz to 1000MHz 100kHz to 120kHz >1000MHz 1MHz If the peak-detected amplitude can be shown to comply with the average limit, then it is not necessary to perform a separate average measurement. Ensure that the amplitude of all unwanted emissions outside of the authorized frequency band (excluding restricted frequency bands) are attenuated by at least the minimum requirements specified in section 8.1. Report the three highest emissions relative to the limit. 8.3 Summary of Test Results/Plots Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 24 of 37 Reference No.: WTX24X10242157W001 Radiated test Test Channel Low Polarity: Vertical(worst case) No. Frequency Reading Correct Result Limit Margin (MHz) (dBuV/m) Factor(dB) (dBuV/m) (dBuV/m) (dB) 1 2310.000 44.43 -19.67 24.76 54.00 -29.24 2310.000 57.92 -19.67 38.25 74.00 -35.75 2 2390.000 43.29 -19.49 23.80 54.00 -30.20 2390.000 56.89 -19.49 37.40 74.00 -36.60 3 2402.184 86.69 -19.48 67.21 / / 2401.784 108.40 -19.48 88.92 / / Remark Average Detector Peak Detector Average Detector Peak Detector Average Detector Peak Detector Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 25 of 37 Reference No.: WTX24X10242157W001 Test Channel High Polarity: Vertical(worst case) No. Frequency Reading Correct Result Limit Margin (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) 1 2480.060 87.04 -19.29 67.75 / / 2480.210 109.00 -19.29 89.71 / / 2 2483.500 52.85 -19.29 33.56 54.00 -20.44 2483.500 74.15 -19.29 54.86 74.00 -19.14 3 2500.000 43.82 -19.25 24.57 54.00 -29.43 2500.000 56.82 -19.25 37.57 74.00 -36.43 Remark Average Detector Peak Detector Average Detector Peak Detector Average Detector Peak Detector Conducted test Please refer to Appendix D Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 26 of 37 Reference No.: WTX24X10242157W001 9. Conducted Emissions 9.1 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.207 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. 9.2 Basic Test Setup Block Diagram 0.4m 0.8m EUT LISN Receiver PC System 0.8m :50 Terminator 9.3 Test Receiver Setup During the conducted emission test, the test receiver was set with the following configurations: Start Frequency ..................................................................... 150kHz Stop Frequency ..................................................................... 30MHz Sweep Speed ........................................................................ Auto IF Bandwidth.......................................................................... 10kHz Quasi-Peak Adapter Bandwidth ............................................ 9kHz Quasi-Peak Adapter Mode .................................................... Normal 9.4 Summary of Test Results/Plots Not applicable Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 27 of 37 Reference No.: WTX24X10242157W001 APPENDIX SUMMARY Project No. Start date Temperature RF specifications APPENDIX A B C D WTX24X10242157W 2024/10/22 23 BT-BLE Test Engineer Finish date Humidity Description of Test Item Power Spectral Density DTS Bandwidth RF Output Power Conducted Out of Band Emissions Elin Su 2024/10/24 52% Result Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 28 of 37 Reference No.: WTX24X10242157W001 APPENDIX A Power Spectral Density Test Mode Test Channel Low GFSK(BLE) Middle High Note: Result=Reading + Cable loss Margin=Result - Limit Result Power Spectral Density dBm/3kHz -18.65 -17.93 -17.75 Limit dBm/3kHz 8 8 8 Margin dBm/3kHz -26.65 -25.93 -25.75 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 29 of 37 Reference No.: WTX24X10242157W001 Low Middle High Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.402 GHz * Att 30 dB * RBW 3 kHz * VBW 10 kHz SWT 170 ms Marker 1 [T1 ] -18.65 dBm 2.401991000 GHz A LVL 1 3DB 150 kHz/ Span 1.5 MHz Date: 23.OCT.2024 14:44:05 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.44 GHz * Att 30 dB * RBW 3 kHz * VBW 10 kHz SWT 170 ms Marker 1 [T1 ] -17.93 dBm 2.439976000 GHz A LVL 1 3DB 150 kHz/ Span 1.5 MHz Date: 23.OCT.2024 14:44:29 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.48 GHz * Att 30 dB * RBW 3 kHz * VBW 10 kHz SWT 170 ms Marker 1 [T1 ] -17.75 dBm 2.479976000 GHz A LVL 1 3DB 150 kHz/ Span 1.5 MHz Date: 23.OCT.2024 14:44:53 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 30 of 37 Reference No.: WTX24X10242157W001 APPENDIX B Test Mode GFSK(BLE) Test Channel Low Middle High 6 dB Bandwidth kHz 702.0 702.0 696.0 Limit kHz 500 500 500 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 31 of 37 Reference No.: WTX24X10242157W001 Low Middle High Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.402 GHz * Att 30 dB T1 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms 1 T2 Marker 1 [T1 ] -2.89 dBm 2.402006000 GHz ndB [T1] 6.00 dB BW 702.000000000 kHz Temp 1 [T1 ndB] A -8.90 dBm 2.401658000 GHz Temp 2 [T1 ndB] LVL -8.96 dBm 2.402360000 GHz 3DB 300 kHz/ Span 3 MHz Date: 23.OCT.2024 14:40:23 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.44 GHz * Att 30 dB T1 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms 1 T2 Marker 1 [T1 ] -2.35 dBm 2.440006000 GHz ndB [T1] 6.00 dB BW 702.000000000 kHz Temp 1 [T1 ndB] A -8.43 dBm 2.439652000 GHz Temp 2 [T1 ndB] LVL -8.30 dBm 2.440354000 GHz 3DB 300 kHz/ Span 3 MHz Date: 23.OCT.2024 14:41:14 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.48 GHz * Att 30 dB T1 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms 1 T2 Marker 1 [T1 ] -1.90 dBm 2.480012000 GHz ndB [T1] 6.00 dB BW 696.000000000 kHz Temp 1 [T1 ndB] A -7.83 dBm 2.479664000 GHz Temp 2 [T1 ndB] LVL -7.94 dBm 2.480360000 GHz 3DB 300 kHz/ Span 3 MHz Date: 23.OCT.2024 14:41:48 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 32 of 37 Reference No.: WTX24X10242157W001 APPENDIX C RF Output Power Test Mode Test Channel GFSK(BLE) Note: Result=Reading + Cable loss Margin=Result - Limit Low Middle High Result dBm -2.79 -2.19 -1.80 Limit dBm 30.00 30.00 30.00 Margin dBm -32.79 -32.19 -31.80 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 33 of 37 Reference No.: WTX24X10242157W001 Low Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.402 GHz * Att 30 dB * RBW 1 MHz * VBW 3 MHz SWT 2.5 ms Marker 1 [T1 ] -2.79 dBm 2.402000000 GHz A 1 LVL 3DB 500 kHz/ Span 5 MHz Middle Date: 23.OCT.2024 14:42:34 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.44 GHz * Att 30 dB * RBW 1 MHz * VBW 3 MHz SWT 2.5 ms Marker 1 [T1 ] -2.19 dBm 2.439740000 GHz A 1 LVL 3DB 500 kHz/ Span 5 MHz High Date: 23.OCT.2024 14:42:57 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 -20 -30 -40 -50 -60 -70 -80 Center 2.48 GHz * Att 30 dB * RBW 1 MHz * VBW 3 MHz SWT 2.5 ms Marker 1 [T1 ] -1.80 dBm 2.480000000 GHz A 1 LVL 3DB 500 kHz/ Span 5 MHz Date: 23.OCT.2024 14:43:20 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 34 of 37 Reference No.: WTX24X10242157W001 APPENDIX D Conducted Out of Band Emissions Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 * Att 30 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -50.37 dBm 2.400000000 GHz Marker 1 [T1 ] -2.66 dBm 2.402050000 GHz A 1 LVL -20 D1 -22.96 dBm -30 -40 -50 3DB 2 -60 -70 -80 Center 2.393 GHz 2.5 MHz/ Span 25 MHz Low Date: 23.OCT.2024 14:46:19 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 * Att 30 dB * RBW 100 kHz * VBW 300 kHz SWT 2.6 s Marker 1 [T1 ] -39.19 dBm 25.168960000 GHz A LVL -20 D1 -22.96 dBm -30 -40 1 3DB -50 -60 -70 -80 Start 30 MHz 2.597 GHz/ Stop 26 GHz Middle Date: 23.OCT.2024 14:46:51 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 * Att 30 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 1 [T1 ] -2.25 dBm 2.440000000 GHz A 1 LVL -20 D1 -22.25 dBm -30 -40 3DB -50 -60 -70 -80 Center 2.44 GHz 1.2 MHz/ Span 12 MHz Date: 23.OCT.2024 14:47:42 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 35 of 37 Reference No.: WTX24X10242157W001 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 * Att 30 dB * RBW 100 kHz * VBW 300 kHz SWT 2.6 s Marker 1 [T1 ] -38.70 dBm 24.649560000 GHz A LVL -20 D1 -22.25 dBm -30 -40 1 3DB -50 -60 -70 -80 Start 30 MHz 2.597 GHz/ Stop 26 GHz Date: 23.OCT.2024 14:48:17 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 1 -10 * Att 30 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -50.16 dBm 2.483500000 GHz Marker 1 [T1 ] -1.89 dBm 2.480020000 GHz A LVL -20 D1 -21.89 dBm -30 -40 2 -50 3DB -60 -70 -80 Center 2.4835 GHz 1.2 MHz/ Span 12 MHz High Date: 23.OCT.2024 14:49:05 Ref 20 dBm 20 Offset 1 dB 10 1 PK MAXH 0 -10 * Att 30 dB * RBW 100 kHz * VBW 300 kHz SWT 2.6 s Marker 1 [T1 ] -39.11 dBm 25.688360000 GHz A LVL -20 D1 -21.89 dBm -30 -40 1 3DB -50 -60 -70 -80 Start 30 MHz 2.597 GHz/ Stop 26 GHz Date: 23.OCT.2024 14:49:30 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 36 of 37 Reference No.: WTX24X10242157W001 APPENDIX PHOTOGRAPHS Please refer to "ANNEX" ***** END OF REPORT ***** Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 37 of 37
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