BTEK240308013AE001 FCC ID BT
LAB02 SGS-CSTC
Test Report
Jiang Su Yisin Tech Co., Ltd AMP10 2.4G remote control 2A8MI-AMP10 2A8MIAMP10 amp10
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Document DEVICE REPORTGetApplicationAttachment.html?id=7381506Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 1 of 89 FCC ID: 2A8MI-AMP10 TEST REPORT Application No.: BTEK240308013AE Version Number: V0 Applicant: Jiang Su Yisin Tech Co., Ltd Address of Applicant: Rm. 103, Bldg. 1, No. 10, Wenzhou Rd., ETDZ, Shuyang County, Suqian, Jiangsu, CN Manufacturer: Jiang Su Yisin Tech Co., Ltd Address of Manufacturer: Rm. 103, Bldg. 1, No. 10, Wenzhou Rd., ETDZ, Shuyang County, Suqian, Jiangsu, CN Factory: Rayson Technology (SZ)Co., Ltd. Address of Factory: No.1, Tongfu 1st Road,The 2nd industrial Zone,Loucun,Guangming New District,Shenzhen,China Equipment Under Test (EUT): EUT Name: TX Microphone Model No.: AMP10 Trade Mark: MoerLab Standard(s) : 47 CFR Part 15, Subpart C 15.247 Date of Receipt: 2024-03-08 Date of Test: 2024-03-08 to 2024-06-03 Date of Issue: 2024-06-03 Test Result: Pass* * In the configuration tested, the EUT complied with the standards specified above. Damon Su EMC Laboratory Manager Version V0 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 2 of 89 Chapter Revision Record Date 2024-06-03 Modifier Remark Original Authorized for issue by Carl Yang /Project Engineer Elma Yang /Reviewer Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 3 of 89 2 Test Summary Radio Spectrum Technical Requirement Item Standard Antenna Requirement Other requirements Frequency Hopping Spread Spectrum System Hopping Sequence 47 CFR Part 15, Subpart C 15.247 Method N/A N/A Requirement Result 47 CFR Part 15, Subpart C 15.203 & 15.247(b)(4) Pass 47 CFR Part 15, Subpart C 15.247(a)(1),(g),(h) Pass Radio Spectrum Matter Part Item Standard Method Requirement Result Conducted Emissions at AC Power Line (150kHz-30MHz) ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.2 C 15.207 Pass Conducted Peak Output Power ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 7.8.5 C 15.247(b)(1) Pass 20dB Bandwidth ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 7.8.7 C 15.247(a)(1) Pass Carrier Frequencies Separation ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 7.8.2 C 15.247a(1) Pass Hopping Channel Number ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 7.8.3 C 15.247a(1)(iii) Pass Dwell Time Conducted Band Edges Measurement 47 CFR Part 15, Subpart C 15.247 ANSI C63.10 (2013) Section 7.8.4 ANSI C63.10 (2013) Section 7.8.6 47 CFR Part 15, Subpart C 15.247a(1)(iii) 47 CFR Part 15, Subpart C 15.247(d) Pass Pass Conducted Spurious Emissions ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 7.8.8 C 15.247(d) Pass Radiated Emissions which fall in the restricted bands ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.10.5 C 15.205 & 15.209 Pass Radiated Spurious Emissions (Below 1GHz) ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.4,6.5,6.6 C 15.205 & 15.209 Pass Radiated Spurious Emissions (Above 1GHz) ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.4,6.5,6.6 C 15.205 & 15.209 Pass Note: E.U.T./EUT means Equipment Under Test. Pass means the test result passed the test standard requirement, please find the detailed decision rule in the report relative section. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 4 of 89 3 Contents Page 1 Cover Page ................................................................................................................................................1 2 Test Summary ...........................................................................................................................................3 3 Contents ....................................................................................................................................................4 4 General Information..................................................................................................................................6 4.1 Details of E.U.T. .................................................................................................................................6 4.2 Description of Support Units ..............................................................................................................6 4.3 Measurement Uncertainty ..................................................................................................................6 4.4 Test Location......................................................................................................................................7 4.5 Deviation from Standards...................................................................................................................7 4.6 Abnormalities from Standard Conditions ...........................................................................................7 5 Equipment List ..........................................................................................................................................8 6 Radio Spectrum Technical Requirement .............................................................................................10 6.1 Antenna Requirement ......................................................................................................................10 6.1.1 Test Requirement: .......................................................................................................................10 6.1.2 Conclusion ...................................................................................................................................10 6.2 Other requirements Frequency Hopping Spread Spectrum System Hopping Sequence ...............11 6.2.1 Test Requirement: .......................................................................................................................11 6.2.2 Conclusion ...................................................................................................................................12 7 Radio Spectrum Matter Test Results ....................................................................................................14 7.1 Conducted Emissions at AC Power Line (150kHz-30MHz).............................................................14 7.1.1 E.U.T. Operation ..........................................................................................................................14 7.1.2 Test Mode Description.................................................................................................................14 7.1.3 Test Setup Diagram .....................................................................................................................15 7.1.4 Measurement Procedure and Data.............................................................................................15 7.2 Conducted Peak Output Power........................................................................................................18 7.2.1 E.U.T. Operation ..........................................................................................................................18 7.2.2 Test Mode Description.................................................................................................................18 7.2.3 Test Setup Diagram .....................................................................................................................18 7.2.4 Measurement Procedure and Data.............................................................................................18 7.3 20dB Bandwidth ...............................................................................................................................19 7.3.1 E.U.T. Operation ..........................................................................................................................19 7.3.2 Test Mode Description.................................................................................................................19 7.3.3 Test Setup Diagram .....................................................................................................................19 7.3.4 Measurement Procedure and Data.............................................................................................19 7.4 Carrier Frequencies Separation .......................................................................................................20 7.4.1 E.U.T. Operation ..........................................................................................................................20 7.4.2 Test Mode Description.................................................................................................................20 7.4.3 Test Setup Diagram .....................................................................................................................20 7.4.4 Measurement Procedure and Data.............................................................................................20 7.5 Hopping Channel Number................................................................................................................21 7.5.1 E.U.T. Operation ..........................................................................................................................21 7.5.2 Test Mode Description.................................................................................................................21 7.5.3 Test Setup Diagram .....................................................................................................................21 7.5.4 Measurement Procedure and Data.............................................................................................21 7.6 Dwell Time........................................................................................................................................22 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 5 of 89 7.6.1 E.U.T. Operation ..........................................................................................................................22 7.6.2 Test Mode Description.................................................................................................................22 7.6.3 Test Setup Diagram .....................................................................................................................22 7.6.4 Measurement Procedure and Data.............................................................................................22 7.7 Conducted Band Edges Measurement ............................................................................................23 7.7.1 E.U.T. Operation ..........................................................................................................................23 7.7.2 Test Mode Description.................................................................................................................23 7.7.3 Test Setup Diagram .....................................................................................................................24 7.7.4 Measurement Procedure and Data.............................................................................................24 7.8 Conducted Spurious Emissions .......................................................................................................25 7.8.1 E.U.T. Operation ..........................................................................................................................25 7.8.2 Test Mode Description.................................................................................................................25 7.8.3 Test Setup Diagram .....................................................................................................................25 7.8.4 Measurement Procedure and Data.............................................................................................25 7.9 Radiated Emissions which fall in the restricted bands .....................................................................26 7.9.1 E.U.T. Operation ..........................................................................................................................26 7.9.2 Test Mode Description.................................................................................................................26 7.9.3 Test Setup Diagram .....................................................................................................................27 7.9.4 Measurement Procedure and Data.............................................................................................27 7.10 Radiated Spurious Emissions (Below 1GHz)...................................................................................29 7.10.1 E.U.T. Operation......................................................................................................................29 7.10.2 Test Mode Description.............................................................................................................29 7.10.3 Test Setup Diagram.................................................................................................................30 7.10.4 Measurement Procedure and Data ........................................................................................30 7.11 Radiated Spurious Emissions (Above 1GHz) ..................................................................................33 7.11.1 E.U.T. Operation......................................................................................................................33 7.11.2 Test Mode Description.............................................................................................................33 7.11.3 Test Setup Diagram.................................................................................................................33 7.11.4 Measurement Procedure and Data ........................................................................................34 8 Test Setup Photo ....................................................................................................................................37 9 EUT Constructional Details (EUT Photos) ...........................................................................................37 10 Appendix..................................................................................................................................................38 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 6 of 89 4 General Information 4.1 Details of E.U.T. Power supply: DC 4.35V/3.8V from battery or recharge by USB port Cable(s): / Frequency Range: 2402MHz to 2480MHz Bluetooth Version: V5.0 Classic This test report is for classic mode. Spectrum Spread Technology: Frequency Hopping Spread Spectrum(FHSS) Hopping Channel Type: Adaptive Frequency Hopping systems Modulation Type: GFSK, /4DQPSK, 8DPSK Number of Channels: 79 Sample Type: Portable device Antenna Type: FPC Antenna Antenna Gain: 2.66dBi Remark: The information in this section is provided by the applicant or manufacturer, BANTEK is not liable to the accuracy, suitability, reliability or/and integrity of the information. Sample No.: BTEK240308013AE-01 4.2 Description of Support Units Description Manufacturer Adapter JW Model No. 0441 Serial No. -- 4.3 Measurement Uncertainty Test Item Conducted Emissions at AC Power Line (150kHz- 30MHz) Conducted Peak Output Power 20dB Bandwidth Carrier Frequencies Separation Hopping Channel Number Dwell Time Conducted Band Edges Measurement Conducted Spurious Emissions Radiated Emissions which fall in the restricted bands Radiated Spurious Emissions (Below 1GHz) Radiated Spurious Emissions (Above 1GHz) Measurement Uncertainty ±3.12dB ± 0.75dB ± 3% ± 7.25 x 10-8 ± 7.25 x 10-8 ± 0.37% ± 0.75dB ± 0.75dB ±5.08dB (1GHz-6GHz);±5.14dB(above 6GHz) ±5.06dB (3m); ±4.46dB (10m) ±5.08dB (1GHz-6GHz);±5.14dB(above 6GHz) Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 7 of 89 4.4 Test Location All tests were performed at: Shenzhen BANTEK Testing Co., Ltd., A5&A6, Building B1&B2, No.45 Gangtou Road, Bogang Community, Shajing Street, Bao'an District, Shenzhen, Guangdong, China 518104 Tel:0755-2334 4200 Fax: 0755-2334 4200 FCC Registration Number: 264293 Designation Number: CN1356 No tests were sub-contracted. 4.5 Deviation from Standards None 4.6 Abnormalities from Standard Conditions None Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 8 of 89 5 Equipment List Conducted Test Description Manufacturer Shielding Room YIHENG ENECTRONIC EMI Test Receiver Rohde&Schwarz Measurement Software Fara LISN Rohde&Schwarz LISN Schwarzbeck Model 9*5*3.3 ESCI EZ_EMC Ver. FA-03A2 ENV216 NSLK 8128 Serial No. YH-BT-220304-04 101021 N/A 101472 05127 Cal. Date 2022-03-03 2023-06-12 N/A 2023-06-12 2023-06-12 Cal. Due 2025-03-02 2024-06-11 N/A 2024-06-11 2024-06-11 RF Conducted Equipment Shielding Room EXA Signal Analyzer DC Power Supply Attenuator Attenuator RF Control Unit RF Sensor Unit WIDEBAND RADIO COMMUNICATION TESTER MXG Vector Signal Generator Programmable Temperature&Humidity Chamber Measurement Software Manufacturer YIHENG ENECTRONIC KEYSIGHT E3632A RswTech RswTech Techy Techy R&S Agilent GRT TACHOY Model No 5.5*3.1*3 N9020A E3642A SMA-JK-6dB SMA-JK-3dB TR1029-1 TR1029-2 Serial No YH-BT- 220304-03 MY54230486 KR75304416 N/A N/A N/A N/A Cal Date Cal Due Date 2022-03-03 2025-03-02 2023-06-12 2023-06-12 2023-06-12 2023-06-12 2023-06-12 2023-06-12 2024-06-11 2024-06-11 2024-06-11 2024-06-11 2024-06-11 2024-06-11 CMW 500 141258 2023-06-12 2024-06-11 N5182A US46240522 2023-06-12 2024-06-11 GR-HWX1000 GR22051001 2023-06-12 2024-06-11 RF TestSoft N/A N/A N/A RSE Equipment 3m Semi-Anechoic Chamber EMI Test Receiver TRILOG Broadband Antenna Pre-Amplifier Measurement Software EXA Signal Analyzer Horn Antenna Pre-Amplifier Manufacturer YIHENG ENECTRONIC Rohde&Schwarz Schwarzbeck Schwarzbeck Fara Keysight Schwarzbeck Tonscend Model No 966 ESCI Serial No YH-BT220304-01 100694 Cal Date Cal Due Date 2022-05-06 2025-05-05 2023-06-12 2024-06-11 VULB 9168 01324 2022-06-15 2025-06-14 BBV 9745 EZ_EMC Ver. FA-03A2 N9020A BBHA 9120D TAP0118045 #180 N/A MY54440290 02695 AP20K806109 2023-06-12 2023-06-12 2023-06-12 2022-06-15 2023-06-12 2024-06-11 2024-06-11 2024-06-11 2025-06-14 2024-06-11 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 9 of 89 Horn Antenna SCHWARZBECK BBHA9170 1157 Low Noise Pre-amplifier SKET LNPA-1840G50 SK2022032902 Signal analyzer ROHDE&SCHWARZ FSQ40 100010 Loop Antenna ETS 6502 00201177 2022-06-15 2023-06-12 2023-06-12 2022-06-15 2025-06-14 2024-06-11 2024-06-11 2025-06-14 General used equipment Equipment Humidity/Temperature/B arometric Pressure Indicator Humidity/Temperature/B arometric Pressure Indicator Manufacturer KUMAR KUMAR Model No F132 Serial No Cal Date Cal Due Date N/A 2023-06-12 2024-06-11 F132 N/A 2023-06-12 2024-06-11 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 10 of 89 6 Radio Spectrum Technical Requirement 6.1 Antenna Requirement 6.1.1 Test Requirement: 47 CFR Part 15, Subpart C 15.203 & 15.247(b)(4) 6.1.2 Conclusion Standard Requirement: Testing shall be performed using the highest gain antenna of each combination of licence-exempt transmitter and antenna type, with the transmitter output power set at the maximum level. When a measurement at the antenna connector is used to determine RF output power, the effective gain of the device's antenna shall be stated, based on a measurement or on data from the antenna manufacturer. 15.247(b) (4) requirement: The conducted output power limit specified in paragraph (b) of this section is based on the use of antennas with directional gains that do not exceed 6 dBi. Except as shown in paragraph (c) of this section, if transmitting antennas of directional gain greater than 6 dBi are used, the conducted output power from the intentional radiator shall be reduced below the stated values in paragraphs (b)(1), (b)(2), and (b)(3) of this section, as appropriate, by the amount in dB that the directional gain of the antenna exceeds 6 dBi. EUT Antenna: The antenna is a FPC antenna and no consideration of replacement. The best case gain of the antenna is 2.66dBi. Please refer to internal photos. BT ANT Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 11 of 89 6.2 Other requirements Frequency Hopping Spread Spectrum System Hopping Sequence 6.2.1 Test Requirement: 47 CFR Part 15, Subpart C 15.247(a)(1),(g),(h) Limit: Standard Requirement: The system shall hop to channel frequencies that are selected at the system hopping rate from a Pseudorandom ordered list of hopping frequencies. Each frequency must be used equally on the average by each transmitter. The system receivers shall have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shall shift frequencies in synchronization with the transmitted signals. Frequency hopping spread spectrum systems are not required to employ all available hopping channels during each transmission. However, the system, consisting of both the transmitter and the receiver, must be designed to comply with all of the regulations in this section should the transmitter be presented with a continuous data (or information) stream. In addition, a system employing short transmission bursts must comply with the definition of a frequency hopping system and must distribute its transmissions over the minimum number of hopping channels specified in this section. The incorporation of intelligence within a frequency hopping spread spectrum system that permits the system to recognize other users within the spectrum band so that it individually and independently chooses and adapts its hopsets to avoid hopping on occupied channels is permitted. The coordination of frequency hopping systems in any other manner for the express purpose of avoiding the simultaneous occupancy of individual hopping frequencies by multiple transmitters is not permitted. Compliance for section 15.247(a)(1): According to Technical Specification, the pseudorandom sequence may be generated in a nine-stage shift register whose 5th and 9th stage outputs are added in a modulo-two addition stage. And the result is fed back to the input of the first stage. The sequence begins with the first ONE of 9 consecutive ONEs; i.e. the shift register is initialized with nine ones. > Number of shift register stages: 9 > Length of pseudo-random sequence: 29 -1 = 511 bits > Longest sequence of zeros: 8 (non-inverted signal) Linear Feedback Shift Register for Generation of the PRBS sequence An example of Pseudorandom Frequency Hopping Sequence as follow: Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 12 of 89 Each frequency used equally on the average by each transmitter. According to Technical Specification, the receivers are designed to have input and IF bandwidths that match the hopping channel bandwidths of any transmitters and shift frequencies in synchronization with the transmitted signals. Compliance for section 15.247(g): According to Technical Specification, the system transmits the packet with the pseudorandom hopping frequency with a continuous data and the short burst transmission from the Bluetooth system is also transmitted under the frequency hopping system with the pseudorandom hopping frequency system. Compliance for section 15.247(h): According to Technical specification, the system incorporates with an adaptive system to detect other user within the spectrum band so that it individually and independently to avoid hopping on the occupied channels. The system is designed not have the ability to coordinated with other FHSS System in an effort to avoid the simultaneous occupancy of individual hopping frequencies by multiple transmitter. 6.2.2 Conclusion Standard Requirement: The system shall hop to channel frequencies that are selected at the system hopping rate from a Pseudorandom ordered list of hopping frequencies. Each frequency must be used equally on the average by each transmitter. The system receivers shall have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shall shift frequencies in synchronization with the transmitted signals. Frequency hopping spread spectrum systems are not required to employ all available hopping channels during each transmission. However, the system, consisting of both the transmitter and the receiver, must be designed to comply with all of the regulations in this section should the transmitter be presented with a continuous data (or information) stream. In addition, a system employing short transmission bursts must comply with the definition of a frequency hopping system and must distribute its transmissions over the minimum number of hopping channels specified in this section. The incorporation of intelligence within a frequency hopping spread spectrum system that permits the system to recognize other users within the spectrum band so that it individually and independently chooses and adapts its hopsets to avoid hopping on occupied channels is permitted. The coordination of frequency hopping systems in any other manner for the express purpose of avoiding the simultaneous occupancy of individual hopping frequencies by multiple transmitters is not permitted. Compliance for section 15.247(a)(1): According to Technical Specification, the pseudorandom sequence may be generated in a nine-stage shift register whose 5th and 9th stage outputs are added in a modulo-two addition stage. And the result is fed back to the input of the first stage. The sequence begins with the first ONE of 9 consecutive ONEs; i.e. the shift register is initialized with nine ones. > Number of shift register stages: 9 > Length of pseudo-random sequence: 29 -1 = 511 bits > Longest sequence of zeros: 8 (non-inverted signal) Linear Feedback Shift Register for Generation of the PRBS sequence Each frequency used equally on the average by each transmitter. According to Technical Specification, the receivers are designed to have input and IF bandwidths that match the hopping channel bandwidths of any transmitters and shift frequencies in synchronization with the transmitted signals. Compliance for section 15.247(g): Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 13 of 89 According to Technical Specification, the system transmits the packet with the pseudorandom hopping frequency with a continuous data and the short burst transmission from the Bluetooth system is also transmitted under the frequency hopping system with the pseudorandom hopping frequency system. Compliance for section 15.247(h): According to Technical specification, the system incorporates with an adaptive system to detect other user within the spectrum band so that it individually and independently to avoid hopping on the occupied channels. The system is designed not have the ability to coordinated with other FHSS System in an effort to avoid the simultaneous occupancy of individual hopping frequencies by multiple transmitter. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 14 of 89 7 Radio Spectrum Matter Test Results 7.1 Conducted Emissions at AC Power Line (150kHz-30MHz) Test Requirement 47 CFR Part 15, Subpart C 15.207 Test Method: ANSI C63.10 (2013) Section 6.2 Limit: Frequency of emission(MHz) Conducted limit(dBV) Quasi-peak Average 0.15-0.5 66 to 56* 56 to 46* 0.5-5 56 46 5-30 60 50 *Decreases with the logarithm of the frequency. Detector: Peak for pre-scan (9kHz resolution bandwidth) 0.15M to 30MHz 7.1.1 E.U.T. Operation Operating Environment: Temperature: 22.2 °C Humidity: 60.5 % RH Atmospheric Pressure: 1010 mbar 7.1.2 Test Mode Description Pre-scan / Mode Final test Code Description Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Pre-scan 28 Charge + TX_Hop mode_Keep the EUT in charging and frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 15 of 89 7.1.3 Test Setup Diagram 7.1.4 Measurement Procedure and Data 1) The mains terminal disturbance voltage test was conducted in a shielded room. 2) The EUT was connected to AC power source through a LISN 1 (Line Impedance Stabilization Network) which provides a 50ohm/50H + 5ohm linear impedance. The power cables of all other units of the EUT were connected to a second LISN 2, which was bonded to the ground reference plane in the same way as the LISN 1 for the unit being measured. A multiple socket outlet strip was used to connect multiple power cables to a single LISN provided the rating of the LISN was not exceeded. 3) The tabletop EUT was placed upon a non-metallic table 0.8m above the ground reference plane. And for floor-standing arrangement, the EUT was placed on the horizontal ground reference plane. 4) The test was performed with a vertical ground reference plane. The rear of the EUT shall be 0.4 m from the vertical ground reference plane. The vertical ground reference plane was bonded to the horizontal ground reference plane. The LISN 1 was placed 0.8 m from the boundary of the unit under test and bonded to a ground reference plane for LISNs mounted on top of the ground reference plane. This distance was between the closest points of the LISN 1 and the EUT. All other units of the EUT and associated equipment was at least 0.8 m from the LISN 2. 5) In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to ANSI C63.10 on conducted measurement. Remark: LISN=Read Level+ Cable Loss+ LISN Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 16 of 89 Test Mode: 26; Line: Live line; Modulation:GFSK; ; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 17 of 89 Test Mode: 26; Line: Neutral Line; Modulation:GFSK; ; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 18 of 89 7.2 Conducted Peak Output Power Test Requirement 47 CFR Part 15, Subpart C 15.247(b)(1) Test Method: ANSI C63.10 (2013) Section 7.8.5 Limit: Frequency range(MHz) 902-928 2400-2483.5 5725-5850 Output power of the intentional radiator(watt) 1 for 50 hopping channels 0.25 for 25 hopping channels <50 1 for digital modulation 1 for 75 non-overlapping hopping channels 0.125 for all other frequency hopping systems 1 for digital modulation 1 for frequency hopping systems and digital modulation 7.2.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.2.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.2.3 Test Setup Diagram 7.2.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 19 of 89 7.3 20dB Bandwidth Test Requirement Test Method: 47 CFR Part 15, Subpart C 15.247(a)(1) ANSI C63.10 (2013) Section 7.8.7 7.3.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.3.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.3.3 Test Setup Diagram 7.3.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 20 of 89 7.4 Carrier Frequencies Separation Test Requirement 47 CFR Part 15, Subpart C 15.247a(1) Test Method: ANSI C63.10 (2013) Section 7.8.2 Limit: 2/3 of the 20dB bandwidth base on the transmission power is less than 0.125W. 7.4.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.4.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.4.3 Test Setup Diagram 7.4.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 21 of 89 7.5 Hopping Channel Number Test Requirement 47 CFR Part 15, Subpart C 15.247a(1)(iii) Test Method: ANSI C63.10 (2013) Section 7.8.3 Limit: Frequency range(MHz) Number of hopping channels (minimum) 902-928 50 for 20dB bandwidth <250kHz 25 for 20dB bandwidth 250kHz 2400-2483.5 15 5725-5850 75 7.5.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.5.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 27 TX_Hop mode_Keep the EUT in frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 28 Charge + TX_Hop mode_Keep the EUT in charging and frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.5.3 Test Setup Diagram 7.5.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 22 of 89 7.6 Dwell Time Test Requirement 47 CFR Part 15, Subpart C 15.247a(1)(iii) Test Method: ANSI C63.10 (2013) Section 7.8.4 Limit: Frequency(MHz) Limit 902-928 0.4s within a 20s period(20dB bandwidth<250kHz) 0.4s within a 10s period(20dB bandwidth250kHz) 2400-2483.5 0.4s within a period of 0.4s multiplied by the number of hopping channels 5725-5850 0.4s within a 30s period 7.6.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.6.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 27 TX_Hop mode_Keep the EUT in frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 28 Charge + TX_Hop mode_Keep the EUT in charging and frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.6.3 Test Setup Diagram 7.6.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 23 of 89 7.7 Conducted Band Edges Measurement Test Requirement 47 CFR Part 15, Subpart C 15.247(d) Test Method: ANSI C63.10 (2013) Section 7.8.6 Limit: In any 100 kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20 dB below that in the 100 kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30 dB instead of 20 dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a) (see §15.205(c). 7.7.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.7.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Pre-scan 27 TX_Hop mode_Keep the EUT in frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 28 Charge + TX_Hop mode_Keep the EUT in charging and frequency hopping mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 24 of 89 7.7.3 Test Setup Diagram 7.7.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 25 of 89 7.8 Conducted Spurious Emissions Test Requirement 47 CFR Part 15, Subpart C 15.247(d) Test Method: ANSI C63.10 (2013) Section 7.8.8 Limit: In any 100 kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20 dB below that in the 100 kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30 dB instead of 20 dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a) (see §15.205(c). 7.8.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.8.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.8.3 Test Setup Diagram 7.8.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 26 of 89 7.9 Radiated Emissions which fall in the restricted bands Test Requirement 47 CFR Part 15, Subpart C 15.205 & 15.209 Test Method: ANSI C63.10 (2013) Section 6.10.5 Limit: Frequency(MHz) Field strength(microvolts/meter) Measurement distance(meters) 0.009-0.490 2400/F(kHz) 300 0.490-1.705 24000/F(kHz) 30 1.705-30.0 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Remark: The emission limits shown in the above table are based on measurements employing a CISPR quasi-peak detector except for the frequency bands 9-90kHz, 110-490kHz and above 1000 MHz. Radiated emission limits in these three bands are based on measurements employing an average detector, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. 7.9.1 E.U.T. Operation Operating Environment: Temperature: 21.4 °C Humidity: 54.3 % RH Atmospheric Pressure: 1010 mbar 7.9.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 27 of 89 7.9.3 Test Setup Diagram 7.9.4 Measurement Procedure and Data a. For below 1GHz, the EUT was placed on the top of a rotating table 0.8 meters above the ground at a 3 or 10 meter semi-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. b. For above 1GHz, the EUT was placed on the top of a rotating table 1.5 meters above the ground at a 3 meter fully-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. c. The EUT was set 3 or 10 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. d. The antenna height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical polarizations of the antenna are set to make the measurement. e. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters (for the test frequency of below 30MHz, the antenna was tuned to heights 1 meter) and the rotatable table was turned from 0 degrees to 360 degrees to find the maximum reading. f. The test-receiver system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. g. If the emission level of the EUT in peak mode was 10dB lower than the limit specified, then testing could be stopped and the peak values of the EUT would be reported. Otherwise the emissions that did not have 10dB margin would be re-tested one by one using peak, quasi-peak or average method as specified and then reported in a data sheet. h. Test the EUT in the lowest channel, the Highest channel. i. The radiation measurements are performed in X, Y, Z axis positioning for Transmitting mode, and found the X axis positioning which it is the worst case. j. Repeat above procedures until all frequencies measured was complete. Remark 1: Level= Read Level+ Cable Loss+ Antenna Factor- Preamp Factor Remark 2: For frequencies above 1GHz, the field strength limits are based on average limits. However, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. For the emissions whose peak level is lower than the average limit, only the peak measurement is shown in the report. Remark 3: All the modes have been tested and the only shows the worst case GFSK mode Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 28 of 89 Test Mode: 26; Polarity: Horizontal; Modulation:GFSK; ; Channel:Low Frequency Reading Factor Level Limit Margin( No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) dB) Detector P/F 1 2310.000 68.09 -30.59 37.50 74.00 -36.50 peak P 2 2390.000 69.74 -30.49 39.25 74.00 -34.75 peak P 3 2400.000 79.25 -30.48 48.77 74.00 -25.23 peak P Test Mode: 26; Polarity: Vertical; Modulation:GFSK; ; Channel:Low Frequency Reading Factor Level Limit Margin( No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) dB) Detector P/F 1 2310.000 67.43 -30.59 36.84 74.00 -37.16 peak P 2 2390.000 68.92 -30.49 38.43 74.00 -35.57 peak P 3 2400.000 78.71 -30.48 48.23 74.00 -25.77 peak P Test Mode: 26; Polarity: Horizontal; Modulation:GFSK; ; Channel:High Frequency Reading Factor Level Limit Margin( No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) dB) Detector P/F 1 2483.500 79.43 -30.39 49.04 74.00 -24.96 peak P 2 2500.000 71.32 -30.37 40.95 74.00 -33.05 peak P Test Mode: 26; Polarity: Vertical; Modulation:GFSK; ; Channel:High Frequency Reading Factor Level Limit Margin( No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) dB) Detector P/F 1 2483.500 79.54 -30.39 49.15 74.00 -24.85 peak P 2 2500.000 71.05 -30.37 40.68 74.00 -33.32 peak P Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 29 of 89 7.10 Radiated Spurious Emissions (Below 1GHz) Test Requirement 47 CFR Part 15, Subpart C 15.205 & 15.209 Test Method: ANSI C63.10 (2013) Section 6.4,6.5,6.6 Limit: Frequency(MHz) Field strength(microvolts/meter) Measurement distance(meters) 0.009-0.490 2400/F(kHz) 300 0.490-1.705 24000/F(kHz) 30 1.705-30.0 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Remark: The emission limits shown in the above table are based on measurements employing a CISPR quasi-peak detector except for the frequency bands 9-90kHz, 110-490kHz and above 1000 MHz. Radiated emission limits in these three bands are based on measurements employing an average detector, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. 7.10.1 E.U.T. Operation Operating Environment: Temperature: 25.5 °C Humidity: 68.6 % RH Atmospheric Pressure: 1010 mbar 7.10.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 30 of 89 7.10.3 Test Setup Diagram 7.10.4 Measurement Procedure and Data a. For below 1GHz, the EUT was placed on the top of a rotating table 0.8 meters above the ground at a 3 or 10 meter semi-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. b. The EUT was set 3 or 10 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. c. The antenna height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical polarizations of the antenna are set to make the measurement. d. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters (for the test frequency of below 30MHz, the antenna was tuned to heights 1 meter) and the rotatable table was turned from 0 degrees to 360 degrees to find the maximum reading. e. The test-receiver system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. f. If the emission level of the EUT in peak mode was 10dB lower than the limit specified, then testing could be stopped and the peak values of the EUT would be reported. Otherwise the emissions that did not have 10dB margin would be re-tested one by one using peak, quasi-peak or average method as specified and then reported in a data sheet. g. Test the EUT in the lowest channel, the middle channel, the Highest channel. h. The radiation measurements are performed in X, Y, Z axis positioning for Transmitting mode, and found the X axis positioning which it is the worst case. i. Repeat above procedures until all frequencies measured was complete. Remark: 1) Through pre-scan found the worst case is the lowest channel. Only the worst case is recorded in the report. 2) The field strength is calculated by adding the Antenna Factor, Cable Factor & Preamplifier. The basic equation with a sample calculation is as follows: Final Test Level =Receiver Reading + Antenna Factor + Cable Factor - Preamplifier Factor 3) Scan from 9kHz to 1 GHz, the disturbance below 30MHz was very low. The points marked on above plots are the highest emissions could be found when testing, so only above points had been displayed. The amplitude of spurious emissions from the radiator which are attenuated more than 20dB below the limit need not be reported. 4) All the modes have been tested and the only shows the worst case GFSK mode Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 31 of 89 Test Mode: 26; Polarity: Horizontal; Modulation:GFSK; ; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 32 of 89 Test Mode: 26; Polarity: Vertical; Modulation:GFSK; ; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 33 of 89 7.11 Radiated Spurious Emissions (Above 1GHz) Test Requirement 47 CFR Part 15, Subpart C 15.205 & 15.209 Test Method: ANSI C63.10 (2013) Section 6.4,6.5,6.6 Limit: Frequency(MHz) Field strength(microvolts/meter) Measurement distance(meters) 0.009-0.490 2400/F(kHz) 300 0.490-1.705 24000/F(kHz) 30 1.705-30.0 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Remark: The emission limits shown in the above table are based on measurements employing a CISPR quasi-peak detector except for the frequency bands 9-90kHz, 110-490kHz and above 1000 MHz. Radiated emission limits in these three bands are based on measurements employing an average detector, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. 7.11.1 E.U.T. Operation Operating Environment: Temperature: 21.4 °C Humidity: 54.3 % RH Atmospheric Pressure: 1010 mbar 7.11.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 25 TX_non-Hop mode_Keep the EUT in continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. Final test 26 Charge + TX_non-Hop mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation, Pi/4DQPSK modulation, 8DPSK modulation. All modes have been tested and only the data of worst case is recorded in the report. 7.11.3 Test Setup Diagram Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 34 of 89 7.11.4 Measurement Procedure and Data a. For above 1GHz, the EUT was placed on the top of a rotating table 1.5 meters above the ground at a 3 meter fully-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. b. The EUT was set 3 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. c. The antenna height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical polarizations of the antenna are set to make the measurement. d. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters and the rotatable table was turned from 0 degrees to 360 degrees to find the maximum reading. e. The test-receiver system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. f. If the emission level of the EUT in peak mode was 10dB lower than the limit specified, then testing could be stopped and the peak values of the EUT would be reported. Otherwise the emissions that did not have 10dB margin would be re-tested one by one using peak, quasi-peak or average method as specified and then reported in a data sheet. g. Test the EUT in the lowest channel, the middle channel, the Highest channel. h. The radiation measurements are performed in X, Y, Z axis positioning for Transmitting mode, and found the X axis positioning which it is the worst case. i. Repeat above procedures until all frequencies measured was complete. Remark: 1) The field strength is calculated by adding the Antenna Factor, Cable Factor & Preamplifier. The basic equation with a sample calculation is as follows: Final Test Level =Receiver Reading + Antenna Factor + Cable Factor - Preamplifier Factor 2) Scan from 1GHz to 25GHz, the disturbance above 18GHz was very low. The points marked on above plots are the highest emissions could be found when testing, so only above points had been displayed. The amplitude of spurious emissions from the radiator which are attenuated more than 20dB below the limit need not be reported. 3) The field strength limits are based on average limits. However, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. For the emissions whose peak level is lower than the average limit, only the peak measurement is shown in the report. 4) All the modes have been tested and the only shows the worst case GFSK mode Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 35 of 89 Test Mode: 26; Polarity: Horizontal; Modulation:GFSK;Channel:Low Readin Frequency g Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2915.548 68.83 -29.46 39.37 74.00 -34.63 peak P 2 4276.448 68.49 -28.65 39.84 74.00 -34.16 peak P 3 6085.433 65.78 -25.20 40.58 74.00 -33.42 peak P 4 8646.187 70.33 -24.99 45.34 74.00 -28.66 peak P 5 11046.570 68.86 -22.82 46.03 74.00 -27.97 peak P 6 14218.043 70.29 -22.04 48.25 74.00 -25.75 peak P Test Mode: 26; Polarity: Vertical; Modulation:GFSK;Channel:Low Readin Frequency g Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2972.669 67.41 -29.72 37.69 74.00 -36.31 peak P 2 4313.021 69.10 -29.74 39.37 74.00 -34.63 peak P 3 6353.388 66.50 -26.03 40.47 74.00 -33.53 peak P 4 8576.270 70.65 -25.53 45.12 74.00 -28.88 peak P 5 11285.901 67.49 -22.35 45.14 74.00 -28.86 peak P 6 14955.792 71.07 -20.30 50.77 74.00 -23.23 peak P Test Mode: 26; Polarity: Horizontal; Modulation:GFSK;Channel:middle Readin Frequency g Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2914.716 69.63 -30.05 39.58 74.00 -34.42 peak P 2 4277.434 69.00 -29.45 39.54 74.00 -34.46 peak P 3 6085.046 65.58 -25.77 39.82 74.00 -34.18 peak P 4 8646.116 69.11 -25.71 43.41 74.00 -30.59 peak P 5 11048.024 68.18 -23.80 44.38 74.00 -29.62 peak P 6 14218.580 70.43 -20.27 50.17 74.00 -23.83 peak P Test Mode: 26; Polarity: Vertical; Modulation:GFSK;Channel:middle Readin Frequency g Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2973.261 66.71 -29.12 37.59 74.00 -36.41 peak P 2 4312.340 69.74 -29.67 40.07 74.00 -33.93 peak P 3 6353.802 66.49 -24.94 41.55 74.00 -32.45 peak P 4 8575.456 69.90 -24.47 45.43 74.00 -28.57 peak P 5 11286.620 68.75 -23.47 45.28 74.00 -28.72 peak P 6 14955.833 70.64 -19.79 50.85 74.00 -23.15 peak P Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 36 of 89 Test Mode: 26; Polarity: Horizontal; Modulation:GFSK; Channel:High Readin Frequency g Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2913.714 70.44 -28.72 41.72 74.00 -32.28 peak P 2 4277.464 67.27 -29.33 37.94 74.00 -36.06 peak P 3 6085.102 65.53 -24.99 40.55 74.00 -33.45 peak P 4 8645.579 68.91 -25.29 43.62 74.00 -30.38 peak P 5 11046.478 67.18 -23.36 43.82 74.00 -30.18 peak P 6 14217.975 71.36 -20.84 50.52 74.00 -23.48 peak P Test Mode: 26; Polarity: Vertical; Modulation:GFSK;Channel:High Readin Frequency g Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2972.567 67.02 -29.58 37.44 74.00 -36.56 peak P 2 4312.624 69.78 -29.26 40.52 74.00 -33.48 peak P 3 6354.251 67.01 -25.02 41.99 74.00 -32.01 peak P 4 8576.739 70.15 -25.08 45.07 74.00 -28.93 peak P 5 11286.417 67.06 -23.40 43.66 74.00 -30.34 peak P 6 14955.626 71.98 -19.84 52.14 74.00 -21.86 peak P Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 37 of 89 8 Test Setup Photo Please refer to the Appendix Test Setup Photos 9 EUT Constructional Details (EUT Photos) Please refer to the Appendix EUT Photos Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 38 of 89 10 Appendix Cable loss=0.9 dB 1. Dwell Time (Hopping) Condition NVNT NVNT NVNT NVNT NVNT NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Packet Type 1-DH1 1-DH3 1-DH5 2-DH1 2-DH3 2-DH5 3-DH1 3-DH3 3-DH5 Pulse Time(ms) 0.376 1.631 2.880 0.386 1.639 2.886 0.387 1.638 2.889 Hops 320.00 160.00 107.00 320.00 152.00 99.00 320.00 164.00 113.00 Dwell Time(ms) 120.320 260.960 308.160 123.520 249.128 285.714 123.840 268.632 326.457 Limit(s) 0.40 0.40 0.40 0.40 0.40 0.40 0.40 0.40 0.40 Result Pass Pass Pass Pass Pass Pass Pass Pass Pass Dwell_Time_(Hopping)_NVNT_ANT1_1-DH1_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 39 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_1-DH1_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_1-DH3_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 40 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_1-DH3_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_1-DH5_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 41 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_1-DH5_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_2-DH1_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 42 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_2-DH1_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_2-DH3_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 43 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_2-DH3_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_2-DH5_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 44 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_2-DH5_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_3-DH1_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 45 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_3-DH1_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_3-DH3_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 46 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_3-DH3_2441_Accumulated Dwell_Time_(Hopping)_NVNT_ANT1_3-DH5_2441_One_Burst_Time Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 47 of 89 Dwell_Time_(Hopping)_NVNT_ANT1_3-DH5_2441_Accumulated Shenzhen BANTEK Testing Co., Ltd. 2. -20dB Bandwidth Condition Antenna NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 Report No.: BTEK240308013AE001 Page: 48 of 89 Modulation 1-DH5 1-DH5 1-DH5 2-DH5 2-DH5 2-DH5 3-DH5 3-DH5 3-DH5 Frequency (MHz) 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 -20dB BW(MHz) 1.022 1.020 0.968 1.235 1.265 1.275 1.278 1.284 1.293 -20dB_Bandwidth_NVNT_ANT1_1-DH5_2402 if larger than CFS Yes Yes No Yes Yes Yes Yes Yes Yes Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 49 of 89 -20dB_Bandwidth_NVNT_ANT1_1-DH5_2441 -20dB_Bandwidth_NVNT_ANT1_1-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 50 of 89 -20dB_Bandwidth_NVNT_ANT1_2-DH5_2402 -20dB_Bandwidth_NVNT_ANT1_2-DH5_2441 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 51 of 89 -20dB_Bandwidth_NVNT_ANT1_2-DH5_2480 -20dB_Bandwidth_NVNT_ANT1_3-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 52 of 89 -20dB_Bandwidth_NVNT_ANT1_3-DH5_2441 -20dB_Bandwidth_NVNT_ANT1_3-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. 3. 99% Occupied Bandwidth Condition Antenna NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 Report No.: BTEK240308013AE001 Page: 53 of 89 Modulation 1-DH5 1-DH5 1-DH5 2-DH5 2-DH5 2-DH5 3-DH5 3-DH5 3-DH5 Frequency (MHz) 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 99%%BW(MHz) 0.895 0.893 0.887 1.157 1.165 1.176 1.161 1.171 1.188 99%_Occupied_Bandwidth_NVNT_ANT1_1-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 54 of 89 99%_Occupied_Bandwidth_NVNT_ANT1_1-DH5_2441 99%_Occupied_Bandwidth_NVNT_ANT1_1-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 55 of 89 99%_Occupied_Bandwidth_NVNT_ANT1_2-DH5_2402 99%_Occupied_Bandwidth_NVNT_ANT1_2-DH5_2441 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 56 of 89 99%_Occupied_Bandwidth_NVNT_ANT1_2-DH5_2480 99%_Occupied_Bandwidth_NVNT_ANT1_3-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 57 of 89 99%_Occupied_Bandwidth_NVNT_ANT1_3-DH5_2441 99%_Occupied_Bandwidth_NVNT_ANT1_3-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. 4. Peak Output Power Condition Antenna Modulation NVNT NVNT NVNT NVNT NVNT NVNT NVNT NVNT NVNT ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 1-DH5 1-DH5 1-DH5 2-DH5 2-DH5 2-DH5 3-DH5 3-DH5 3-DH5 Frequency (MHz) 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 Report No.: BTEK240308013AE001 Page: 58 of 89 Max. Conducted Power(dBm) 2.39 3.19 2.93 1.83 2.11 3.09 1.92 2.27 3.20 Max. Conducted Power(mW) 1.73 2.09 1.96 1.53 1.63 2.04 1.56 1.69 2.09 Limit(mW) Result 125 Pass 125 Pass 125 Pass 125 Pass 125 Pass 125 Pass 125 Pass 125 Pass 125 Pass Peak_Output_Power_NVNT_ANT1_1-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 59 of 89 Peak_Output_Power_NVNT_ANT1_1-DH5_2441 Peak_Output_Power_NVNT_ANT1_1-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 60 of 89 Peak_Output_Power_NVNT_ANT1_2-DH5_2402 Peak_Output_Power_NVNT_ANT1_2-DH5_2441 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 61 of 89 Peak_Output_Power_NVNT_ANT1_2-DH5_2480 Peak_Output_Power_NVNT_ANT1_3-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 62 of 89 Peak_Output_Power_NVNT_ANT1_3-DH5_2441 Peak_Output_Power_NVNT_ANT1_3-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. 5. Spurious Emissions Condition Antenna NVNT NVNT NVNT NVNT NVNT NVNT NVNT NVNT NVNT ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Report No.: BTEK240308013AE001 Page: 63 of 89 Modulation 1-DH5 1-DH5 1-DH5 2-DH5 2-DH5 2-DH5 3-DH5 3-DH5 3-DH5 TX Mode 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 2402.00 2441.00 2480.00 Spurious MAX.Value(dBm) -48.139 -48.594 -48.033 -50.176 -50.477 -49.406 -48.554 -50.979 -47.076 1_Reference_Level_NVNT_ANT1_1-DH5_2402 Limit -17.828 -16.863 -17.151 -18.432 -17.940 -17.056 -18.281 -17.872 -17.021 Result Pass Pass Pass Pass Pass Pass Pass Pass Pass Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 64 of 89 2_Spurious_Emissions_NVNT_ANT1_1-DH5_2402 1_Reference_Level_NVNT_ANT1_1-DH5_2441 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 65 of 89 2_Spurious_Emissions_NVNT_ANT1_1-DH5_2441 1_Reference_Level_NVNT_ANT1_1-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 66 of 89 2_Spurious_Emissions_NVNT_ANT1_1-DH5_2480 1_Reference_Level_NVNT_ANT1_2-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 67 of 89 2_Spurious_Emissions_NVNT_ANT1_2-DH5_2402 1_Reference_Level_NVNT_ANT1_2-DH5_2441 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 68 of 89 2_Spurious_Emissions_NVNT_ANT1_2-DH5_2441 1_Reference_Level_NVNT_ANT1_2-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 69 of 89 2_Spurious_Emissions_NVNT_ANT1_2-DH5_2480 1_Reference_Level_NVNT_ANT1_3-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 70 of 89 2_Spurious_Emissions_NVNT_ANT1_3-DH5_2402 1_Reference_Level_NVNT_ANT1_3-DH5_2441 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 71 of 89 2_Spurious_Emissions_NVNT_ANT1_3-DH5_2441 1_Reference_Level_NVNT_ANT1_3-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 72 of 89 2_Spurious_Emissions_NVNT_ANT1_3-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. 6. Bandedge Condition Antenna NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 NVNT ANT1 Report No.: BTEK240308013AE001 Page: 73 of 89 Modulation 1-DH5 1-DH5 1-DH5 1-DH5 2-DH5 2-DH5 2-DH5 2-DH5 3-DH5 3-DH5 3-DH5 3-DH5 TX Mode 2402.00 Hopping_LCH 2480.00 Hopping_HCH 2402.00 Hopping_LCH 2480.00 Hopping_HCH 2402.00 Hopping_LCH 2480.00 Hopping_HCH Bandedge MAX.Value -58.017 -59.652 -58.065 -58.829 -55.261 -55.712 -57.694 -61.608 -54.043 -56.185 -56.613 -63.483 1_Reference_Level_NVNT_ANT1_1-DH5_2402 Limit -17.828 -15.797 -17.151 -17.401 -18.432 -17.051 -16.25 -17.103 -18.281 -16.707 -17.021 -17.353 Result Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 74 of 89 2_Bandedge_NVNT_ANT1_1-DH5_2402 1_Reference_Level_Hopping_NVNT_ANT1_1-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 75 of 89 2_Band_Edge_(Hopping)_NVNT_ANT1_1-DH5_Hopping 1_Reference_Level_NVNT_ANT1_1-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 76 of 89 2_Bandedge_NVNT_ANT1_1-DH5_2480 1_Reference_Level_Hopping_NVNT_ANT1_1-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 77 of 89 2_Band_Edge_(Hopping)_NVNT_ANT1_1-DH5_Hopping 1_Reference_Level_NVNT_ANT1_2-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 78 of 89 2_Bandedge_NVNT_ANT1_2-DH5_2402 1_Reference_Level_Hopping_NVNT_ANT1_2-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 79 of 89 2_Band_Edge_(Hopping)_NVNT_ANT1_2-DH5_Hopping 1_Reference_Level_NVNT_ANT1_2-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 80 of 89 2_Bandedge_NVNT_ANT1_2-DH5_2480 1_Reference_Level_Hopping_NVNT_ANT1_2-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 81 of 89 2_Band_Edge_(Hopping)_NVNT_ANT1_2-DH5_Hopping 1_Reference_Level_NVNT_ANT1_3-DH5_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 82 of 89 2_Bandedge_NVNT_ANT1_3-DH5_2402 1_Reference_Level_Hopping_NVNT_ANT1_3-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 83 of 89 2_Band_Edge_(Hopping)_NVNT_ANT1_3-DH5_Hopping 1_Reference_Level_NVNT_ANT1_3-DH5_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 84 of 89 2_Bandedge_NVNT_ANT1_3-DH5_2480 1_Reference_Level_Hopping_NVNT_ANT1_3-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 85 of 89 2_Band_Edge_(Hopping)_NVNT_ANT1_3-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. 7. Carrier Frequencies Separation (Hopping) Hopping Condition Antenna Modulation Frequency(MHz) NO.0 (MHz) Hopping NO.1 (MHz) NVNT ANT1 1-DH5 2441.00 2441.161 2442.172 NVNT ANT1 2-DH5 2441.00 2440.843 2441.845 NVNT ANT1 3-DH5 2441.00 2441.161 2442.163 Report No.: BTEK240308013AE001 Page: 86 of 89 Carrier Frequencies Separation(MHz) 1.011 1.002 1.002 Limit(MHz) Result 0.680 0.843 0.856 Pass Pass Pass Carrier_Frequencies_Separation_(Hopping)_NVNT_ANT1_1-DH5_Hopping Carrier_Frequencies_Separation_(Hopping)_NVNT_ANT1_2-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 87 of 89 Carrier_Frequencies_Separation_(Hopping)_NVNT_ANT1_3-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. 8. Number of Hopping Channel (Hopping) Condition Antenna Modulation NVNT ANT1 1-DH5 NVNT ANT1 2-DH5 NVNT ANT1 3-DH5 Report No.: BTEK240308013AE001 Page: 88 of 89 Hopping Num 79 79 79 Limit 15 15 15 Result Pass Pass Pass Number_of_Hopping_Channel_(Hopping)_NVNT_ANT1_1-DH5_Hopping Number_of_Hopping_Channel_(Hopping)_NVNT_ANT1_2-DH5_Hopping Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE001 Page: 89 of 89 Number_of_Hopping_Channel_(Hopping)_NVNT_ANT1_3-DH5_Hopping - End of the Report -
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