BTEK240308013AE002 FCC ID BLE
LAB02 SGS-CSTC
Test Report
Jiang Su Yisin Tech Co., Ltd AMP10 2A8MI-AMP10 2A8MIAMP10 amp10
Not Your Device? Search For Manuals or Datasheets below:
File Info : application/pdf, 62 Pages, 4.48MB
Document DEVICE REPORTGetApplicationAttachment.html?id=7381271Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 1 of 62 FCC ID: 2A8MI-AMP10 TEST REPORT Application No.: BTEK240308013AE Applicant: V0 Address of Applicant: Jiang Su Yisin Tech Co., Ltd Manufacturer: Rm. 103, Bldg. 1, No. 10, Wenzhou Rd., ETDZ, Shuyang County, Suqian, Jiangsu, CN Address of Manufacturer: Jiang Su Yisin Tech Co., Ltd Factory: Rm. 103, Bldg. 1, No. 10, Wenzhou Rd., ETDZ, Shuyang County, Suqian, Jiangsu, CN Address of Factory: Rayson Technology (SZ)Co., Ltd. Equipment Under Test (EUT): EUT Name: TX Microphone Model No.: AMP10 Trade Mark: MoerLab Standard(s) : 47 CFR Part 15, Subpart C 15.247 Date of Receipt: 2024-03-08 Date of Test: 2024-03-08 to 2024-03-27 Date of Issue: 2024-04-01 Test Result: Pass* * In the configuration tested, the EUT complied with the standards specified above. Damon Su EMC Laboratory Manager Version V0 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 2 of 62 Chapter Revision Record Date 2024-04-01 Modifier Remark Original Authorized for issue by: Carl Yang /Project Engineer Elma Yang /Reviewer Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 3 of 62 2 Test Summary Radio Spectrum Technical Requirement Item Standard Antenna Requirement 47 CFR Part 15, Subpart C 15.247 Method N/A Requirement Result 47 CFR Part 15, Subpart C 15.203 & 15.247(b)(4) Pass Radio Spectrum Matter Part Item Standard Method Requirement Result Conducted Emissions at AC Power Line (150kHz-30MHz) ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.2 C 15.207 Pass Conducted Peak Output Power ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 11.9.1.3 C 15.247(b)(3) Pass Minimum 6dB Bandwidth ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 11.8.1 C 15.247a(2) Pass Power Spectrum Density ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 11.10.2 C 15.247(e) Pass Conducted Band Edges Measurement Conducted Spurious Emissions 47 CFR Part 15, Subpart C 15.247 ANSI C63.10 (2013) Section 11.13.3.2 ANSI C63.10 (2013) Section 11.11 47 CFR Part 15, Subpart C 15.247(d) 47 CFR Part 15, Subpart C 15.247(d) Pass Pass Radiated Emissions which fall in the restricted bands ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.10.5 C 15.205 & 15.209 Pass Radiated Spurious Emissions (Below 1GHz) ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.4,6.5,6.6 C 15.205 & 15.209 Pass Radiated Spurious Emissions (Above 1GHz) ANSI C63.10 (2013) 47 CFR Part 15, Subpart Section 6.4,6.5,6.6 C 15.205 & 15.209 Pass Note: E.U.T./EUT means Equipment Under Test. Pass means the test result passed the test standard requirement, please find the detailed decision rule in the report relative section. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 4 of 62 3 Contents Page 1 Cover Page ................................................................................................................................................1 2 Test Summary ...........................................................................................................................................3 3 Contents ....................................................................................................................................................4 4 General Information..................................................................................................................................6 4.1 Details of E.U.T. .................................................................................................................................6 4.2 Description of Support Units ..............................................................................................................6 4.3 Measurement Uncertainty ..................................................................................................................6 4.4 Test Location......................................................................................................................................7 4.5 Deviation from Standards...................................................................................................................7 4.6 Abnormalities from Standard Conditions ...........................................................................................7 5 Equipment List ..........................................................................................................................................8 6 Radio Spectrum Technical Requirement .............................................................................................10 6.1 Antenna Requirement ......................................................................................................................10 6.1.1 Test Requirement: .......................................................................................................................10 6.1.2 Conclusion ...................................................................................................................................10 7 Radio Spectrum Matter Test Results ....................................................................................................11 7.1 Conducted Emissions at AC Power Line (150kHz-30MHz) .............................................................11 7.1.1 E.U.T. Operation ..........................................................................................................................11 7.1.2 Test Mode Description .................................................................................................................11 7.1.3 Test Setup Diagram .....................................................................................................................11 7.1.4 Measurement Procedure and Data.............................................................................................12 7.2 Conducted Peak Output Power........................................................................................................15 7.2.1 E.U.T. Operation ..........................................................................................................................15 7.2.2 Test Mode Description .................................................................................................................15 7.2.3 Test Setup Diagram .....................................................................................................................15 7.2.4 Measurement Procedure and Data.............................................................................................15 7.3 Minimum 6dB Bandwidth .................................................................................................................16 7.3.1 E.U.T. Operation ..........................................................................................................................16 7.3.2 Test Mode Description .................................................................................................................16 7.3.3 Test Setup Diagram .....................................................................................................................16 7.3.4 Measurement Procedure and Data.............................................................................................16 7.4 Power Spectrum Density..................................................................................................................17 7.4.1 E.U.T. Operation ..........................................................................................................................17 7.4.2 Test Mode Description .................................................................................................................17 7.4.3 Test Setup Diagram .....................................................................................................................17 7.4.4 Measurement Procedure and Data.............................................................................................17 7.5 Conducted Band Edges Measurement ............................................................................................18 7.5.1 E.U.T. Operation ..........................................................................................................................18 7.5.2 Test Mode Description .................................................................................................................18 7.5.3 Test Setup Diagram .....................................................................................................................18 7.5.4 Measurement Procedure and Data.............................................................................................18 7.6 Conducted Spurious Emissions .......................................................................................................19 7.6.1 E.U.T. Operation ..........................................................................................................................19 7.6.2 Test Mode Description .................................................................................................................19 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 5 of 62 7.6.3 Test Setup Diagram .....................................................................................................................19 7.6.4 Measurement Procedure and Data.............................................................................................19 7.7 Radiated Emissions which fall in the restricted bands .....................................................................20 7.7.1 E.U.T. Operation ..........................................................................................................................20 7.7.2 Test Mode Description .................................................................................................................20 7.7.3 Test Setup Diagram .....................................................................................................................20 7.7.4 Measurement Procedure and Data.............................................................................................21 7.8 Radiated Spurious Emissions (Below 1GHz)...................................................................................23 7.8.1 E.U.T. Operation ..........................................................................................................................23 7.8.2 Test Mode Description .................................................................................................................23 7.8.3 Test Setup Diagram .....................................................................................................................23 7.8.4 Measurement Procedure and Data.............................................................................................24 7.9 Radiated Spurious Emissions (Above 1GHz) ..................................................................................27 7.9.1 E.U.T. Operation ..........................................................................................................................27 7.9.2 Test Mode Description .................................................................................................................27 7.9.3 Test Setup Diagram .....................................................................................................................28 7.9.4 Measurement Procedure and Data.............................................................................................29 8 Test Setup Photo ....................................................................................................................................32 9 EUT Constructional Details (EUT Photos) ...........................................................................................32 10 Appendix..................................................................................................................................................33 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 6 of 62 4 General Information 4.1 Details of E.U.T. Power supply: DC 4.35V/3.8V from battery or recharge by USB port Test Voltage: AC 120V, 60Hz Cable(s): / Frequency Range: 2402MHz to 2480MHz Bluetooth Version: V5.0 Classic This test report is for BLE mode. Modulation Type: GFSK Number of Channels: 40 Sample Type: Portable device Antenna Type: FPC Antenna Antenna Gain: 2.66dBi Remark: The information in this section is provided by the applicant or manufacturer, BANTEK is not liable to the accuracy, suitability, reliability or/and integrity of the information. Sample No.: BTEK240308013AE-01 4.2 Description of Support Units Description Manufacturer Adapter JW Model No. 0441 Serial No. -- 4.3 Measurement Uncertainty Test Item Conducted Emissions at AC Power Line (150kHz- 30MHz) Conducted Peak Output Power Minimum 6dB Bandwidth Power Spectrum Density Conducted Band Edges Measurement Conducted Spurious Emissions Radiated Emissions which fall in the restricted bands Radiated Spurious Emissions (Below 1GHz) Radiated Spurious Emissions (Above 1GHz) Measurement Uncertainty ±3.12dB ± 0.75dB ± 3% ± 2.84dB ± 0.75dB ± 0.75dB ±5.08dB (1GHz-6GHz);±5.14dB(above 6GHz) ±5.06dB (3m); ±4.46dB (10m) ±5.08dB (1GHz-6GHz);±5.14dB(above 6GHz) Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 7 of 62 4.4 Test Location All tests were performed at: Shenzhen BANTEK Testing Co., Ltd. A5&A6, Building B1&B2, No.45 Gangtou Road, Bogang Community, Shajing Street, Bao'an District, Shenzhen, Guangdong, China 518104 Tel: +86 0755-2334 4200 Fax: +86 0755-2334 4200 FCC Registration Number: 264293 Designation Number: CN1356 No tests were sub-contracted. 4.5 Deviation from Standards None 4.6 Abnormalities from Standard Conditions None Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 8 of 62 5 Equipment List Conducted Test Description Manufacturer Shielding Room YIHENG ENECTRONIC EMI Test Receiver Rohde&Schwarz Measurement Software Fara LISN Rohde&Schwarz LISN Schwarzbeck Model 9*5*3.3 ESCI EZ_EMC Ver. FA-03A2 ENV216 NSLK 8128 Serial No. YH-BT-220304-04 101021 N/A 101472 05127 Cal. Date 2022-03-03 2023-06-12 N/A 2023-06-12 2023-06-12 Cal. Due 2025-03-02 2024-06-11 N/A 2024-06-11 2024-06-11 RF Conducted Equipment Shielding Room EXA Signal Analyzer DC Power Supply Attenuator Attenuator RF Control Unit RF Sensor Unit WIDEBAND RADIO COMMUNICATION TESTER MXG Vector Signal Generator Programmable Temperature&Humidity Chamber Measurement Software Manufacturer YIHENG ENECTRONIC KEYSIGHT E3632A RswTech RswTech Techy Techy R&S Agilent GRT TACHOY Model No 5.5*3.1*3 N9020A E3642A SMA-JK-6dB SMA-JK-3dB TR1029-1 TR1029-2 Serial No YH-BT- 220304-03 MY54230486 KR75304416 N/A N/A N/A N/A Cal Date Cal Due Date 2022-03-03 2025-03-02 2023-06-12 2023-06-12 2023-06-12 2023-06-12 2023-06-12 2023-06-12 2024-06-11 2024-06-11 2024-06-11 2024-06-11 2024-06-11 2024-06-11 CMW 500 141258 2023-06-12 2024-06-11 N5182A US46240522 2023-06-12 2024-06-11 GR-HWX1000 GR22051001 2023-06-12 2024-06-11 RF TestSoft N/A N/A N/A RSE Equipment 3m Semi-Anechoic Chamber EMI Test Receiver TRILOG Broadband Antenna Pre-Amplifier Measurement Software EXA Signal Analyzer Horn Antenna Pre-Amplifier Manufacturer YIHENG ENECTRONIC Rohde&Schwarz Schwarzbeck Schwarzbeck Fara Keysight Schwarzbeck Tonscend Model No 966 ESCI Serial No YH-BT220304-01 100694 Cal Date Cal Due Date 2022-05-06 2025-05-05 2023-06-12 2024-06-11 VULB 9168 01324 2022-06-15 2025-06-14 BBV 9745 EZ_EMC Ver. FA-03A2 N9020A BBHA 9120D TAP0118045 #180 N/A MY54440290 02695 AP20K806109 2023-06-12 2023-06-12 2023-06-12 2022-06-15 2023-06-12 2024-06-11 2024-06-11 2024-06-11 2025-06-14 2024-06-11 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 9 of 62 Horn Antenna SCHWARZBECK BBHA9170 1157 Low Noise Pre-amplifier SKET LNPA-1840G50 SK2022032902 Signal analyzer ROHDE&SCHWARZ FSQ40 100010 Loop Antenna ETS 6502 00201177 2022-06-15 2023-06-12 2023-06-12 2022-06-15 2025-06-14 2024-06-11 2024-06-11 2025-06-14 General used equipment Equipment Humidity/Temperature/B arometric Pressure Indicator Humidity/Temperature/B arometric Pressure Indicator Manufacturer KUMAR KUMAR Model No F132 Serial No N/A Cal Date Cal Due Date 2023-06-12 2024-06-11 F132 N/A 2023-06-12 2024-06-11 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 10 of 62 6 Radio Spectrum Technical Requirement 6.1 Antenna Requirement 6.1.1 Test Requirement: 47 CFR Part 15, Subpart C 15.203 & 15.247(b)(4) 6.1.2 Conclusion Standard Requirement: Testing shall be performed using the highest gain antenna of each combination of licence-exempt transmitter and antenna type, with the transmitter output power set at the maximum level. When a measurement at the antenna connector is used to determine RF output power, the effective gain of the device's antenna shall be stated, based on a measurement or on data from the antenna manufacturer. 15.247(b) (4) requirement: The conducted output power limit specified in paragraph (b) of this section is based on the use of antennas with directional gains that do not exceed 6 dBi. Except as shown in paragraph (c) of this section, if transmitting antennas of directional gain greater than 6 dBi are used, the conducted output power from the intentional radiator shall be reduced below the stated values in paragraphs (b)(1), (b)(2), and (b)(3) of this section, as appropriate, by the amount in dB that the directional gain of the antenna exceeds 6 dBi. EUT Antenna: The antenna is a FPC antenna and no consideration of replacement. The best case gain of the antenna is 2.66dBi. Please refer to internal photos. BT ANT Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 11 of 62 7 Radio Spectrum Matter Test Results 7.1 Conducted Emissions at AC Power Line (150kHz-30MHz) Test Requirement 47 CFR Part 15, Subpart C 15.207 Test Method: ANSI C63.10 (2013) Section 6.2 Limit: Frequency of emission(MHz) Conducted limit(dBV) Quasi-peak Average 0.15-0.5 66 to 56* 56 to 46* 0.5-5 56 46 5-30 60 50 *Decreases with the logarithm of the frequency. Detector: Peak for pre-scan (9kHz resolution bandwidth) 0.15M to 30MHz 7.1.1 E.U.T. Operation Operating Environment: Temperature: 22.2 °C Humidity: 60.5 % RH Atmospheric Pressure: 1010 mbar 7.1.2 Test Mode Description Pre-scan / Mode Final test Code Description Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.1.3 Test Setup Diagram Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 12 of 62 7.1.4 Measurement Procedure and Data 1) The mains terminal disturbance voltage test was conducted in a shielded room. 2) The EUT was connected to AC power source through a LISN 1 (Line Impedance Stabilization Network) which provides a 50ohm/50H + 5ohm linear impedance. The power cables of all other units of the EUT were connected to a second LISN 2, which was bonded to the ground reference plane in the same way as the LISN 1 for the unit being measured. A multiple socket outlet strip was used to connect multiple power cables to a single LISN provided the rating of the LISN was not exceeded. 3) The tabletop EUT was placed upon a non-metallic table 0.8m above the ground reference plane. And for floor-standing arrangement, the EUT was placed on the horizontal ground reference plane. 4) The test was performed with a vertical ground reference plane. The rear of the EUT shall be 0.4 m from the vertical ground reference plane. The vertical ground reference plane was bonded to the horizontal ground reference plane. The LISN 1 was placed 0.8 m from the boundary of the unit under test and bonded to a ground reference plane for LISNs mounted on top of the ground reference plane. This distance was between the closest points of the LISN 1 and the EUT. All other units of the EUT and associated equipment was at least 0.8 m from the LISN 2. 5) In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to ANSI C63.10 on conducted measurement. Remark: LISN=Read Level+ Cable Loss+ LISN Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 13 of 62 Test Mode: 30; Line: Live line; Modulation:GFSK;Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 14 of 62 Test Mode: 30; Line: Neutral Line; Modulation:GFSK; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 15 of 62 7.2 Conducted Peak Output Power Test Requirement 47 CFR Part 15, Subpart C 15.247(b)(3) Test Method: ANSI C63.10 (2013) Section 11.9.1.3 Limit: Frequency range(MHz) Output power of the intentional radiator(watt) 1 for 50 hopping channels 902-928 0.25 for 25 hopping channels <50 1 for digital modulation 1 for 75 non-overlapping hopping channels 2400-2483.5 0.125 for all other frequency hopping systems 1 for digital modulation 5725-5850 1 for frequency hopping systems and digital modulation 7.2.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.2.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.2.3 Test Setup Diagram 7.2.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 16 of 62 7.3 Minimum 6dB Bandwidth Test Requirement 47 CFR Part 15, Subpart C 15.247a(2) Test Method: ANSI C63.10 (2013) Section 11.8.1 Limit: 500 kHz 7.3.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.3.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.3.3 Test Setup Diagram 7.3.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 17 of 62 7.4 Power Spectrum Density Test Requirement 47 CFR Part 15, Subpart C 15.247(e) Test Method: ANSI C63.10 (2013) Section 11.10.2 Limit: 8dBm in any 3 kHz band during any time interval of continuous transmission 7.4.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.4.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.4.3 Test Setup Diagram 7.4.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 18 of 62 7.5 Conducted Band Edges Measurement Test Requirement 47 CFR Part 15, Subpart C 15.247(d) Test Method: ANSI C63.10 (2013) Section 11.13.3.2 Limit: In any 100 kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20 dB below that in the 100 kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30 dB instead of 20 dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a) (see §15.205(c). 7.5.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.5.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.5.3 Test Setup Diagram 7.5.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 19 of 62 7.6 Conducted Spurious Emissions Test Requirement 47 CFR Part 15, Subpart C 15.247(d) Test Method: ANSI C63.10 (2013) Section 11.11 Limit: In any 100 kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20 dB below that in the 100 kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30 dB instead of 20 dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a) (see §15.205(c). 7.6.1 E.U.T. Operation Operating Environment: Temperature: 20.5 °C Humidity: 50.0 % RH Atmospheric Pressure: 1010 mbar 7.6.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.6.3 Test Setup Diagram 7.6.4 Measurement Procedure and Data cable loss=0.9dB Please Refer to Appendix for Details Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 20 of 62 7.7 Radiated Emissions which fall in the restricted bands Test Requirement 47 CFR Part 15, Subpart C 15.205 & 15.209 Test Method: ANSI C63.10 (2013) Section 6.10.5 Limit: Frequency(MHz) Field strength(microvolts/meter) Measurement distance(meters) 0.009-0.490 2400/F(kHz) 300 0.490-1.705 24000/F(kHz) 30 1.705-30.0 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Remark: The emission limits shown in the above table are based on measurements employing a CISPR quasi-peak detector except for the frequency bands 9-90kHz, 110-490kHz and above 1000 MHz. Radiated emission limits in these three bands are based on measurements employing an average detector, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. 7.7.1 E.U.T. Operation Operating Environment: Temperature: 21.4 °C Humidity: 54.3 % RH Atmospheric Pressure: 1010 mbar 7.7.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.7.3 Test Setup Diagram Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 21 of 62 7.7.4 Measurement Procedure and Data a. For below 1GHz, the EUT was placed on the top of a rotating table 0.8 meters above the ground at a 3 or 10 meter semi-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. b. For above 1GHz, the EUT was placed on the top of a rotating table 1.5 meters above the ground at a 3 meter fully-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. c. The EUT was set 3 or 10 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. d. The antenna height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical polarizations of the antenna are set to make the measurement. e. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters (for the test frequency of below 30MHz, the antenna was tuned to heights 1 meter) and the rotatable table was turned from 0 degrees to 360 degrees to find the maximum reading. f. The test-receiver system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. g. If the emission level of the EUT in peak mode was 10dB lower than the limit specified, then testing could be stopped and the peak values of the EUT would be reported. Otherwise the emissions that did not have 10dB margin would be re-tested one by one using peak, quasi-peak or average method as specified and then reported in a data sheet. h. Test the EUT in the lowest channel, the Highest channel. i. The radiation measurements are performed in X, Y, Z axis positioning for Transmitting mode, and found the X axis positioning which it is the worst case. j. Repeat above procedures until all frequencies measured was complete. Remark 1: Level= Read Level+ Cable Loss+ Antenna Factor- Preamp Factor Remark 2: For frequencies above 1GHz, the field strength limits are based on average limits. However, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. For the emissions whose peak level is lower than the average limit, only the peak measurement is shown in the report. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 22 of 62 Test Mode: 30; Polarity: Horizontal; Modulation:GFSK; ; Channel:Low Frequency Reading Factor Level Limit Margin(dB Detecto No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) ) r P/F 1 2310.000 68.52 -30.59 37.93 74.00 -36.07 peak P 2 2390.000 70.06 -30.49 39.57 74.00 -34.43 peak P 3 2400.000 77.66 -30.48 47.18 74.00 -26.82 peak P Test Mode: 30; Polarity: Vertical; Modulation:GFSK; ; Channel:Low Limit Frequency Reading Factor Level (dBuv/m Margin(dB No. (MHz) (dBuv) (dB/m) (dBuv/m) ) ) Detector P/F 1 2310.000 67.56 -30.59 36.97 74.00 -37.03 peak P 2 2390.000 70.22 -30.49 39.73 74.00 -34.27 peak P 3 2400.000 78.90 -30.48 48.42 74.00 -25.58 peak P Test Mode: 30; Polarity: Horizontal; Modulation:GFSK; ; Channel:High Limit Frequency Reading Factor Level (dBuv/m Margin(dB No. (MHz) (dBuv) (dB/m) (dBuv/m) ) ) Detector P/F 1 2483.500 79.22 -30.39 48.83 74.00 -25.17 peak P 2 2500.000 70.41 -30.37 40.04 74.00 -33.96 peak P Test Mode: 30; Polarity: Vertical; Modulation:GFSK; ; Channel:High Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2483.500 80.50 -30.39 50.11 74.00 -23.89 peak P 2 2500.000 71.40 -30.37 41.03 74.00 -32.97 peak P Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 23 of 62 7.8 Radiated Spurious Emissions (Below 1GHz) Test Requirement 47 CFR Part 15, Subpart C 15.205 & 15.209 Test Method: ANSI C63.10 (2013) Section 6.4,6.5,6.6 Limit: Frequency(MHz) Field strength(microvolts/meter) Measurement distance(meters) 0.009-0.490 2400/F(kHz) 300 0.490-1.705 24000/F(kHz) 30 1.705-30.0 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Remark: The emission limits shown in the above table are based on measurements employing a CISPR quasi-peak detector except for the frequency bands 9-90kHz, 110-490kHz and above 1000 MHz. Radiated emission limits in these three bands are based on measurements employing an average detector, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. 7.8.1 E.U.T. Operation Operating Environment: Temperature: 25.5 °C Humidity: 68.6 % RH Atmospheric Pressure: 1010 mbar 7.8.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. 7.8.3 Test Setup Diagram Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 24 of 62 7.8.4 Measurement Procedure and Data a. For below 1GHz, the EUT was placed on the top of a rotating table 0.8 meters above the ground at a 3 or 10 meter semi-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. b. The EUT was set 3 or 10 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. c. The antenna height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical polarizations of the antenna are set to make the measurement. d. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters (for the test frequency of below 30MHz, the antenna was tuned to heights 1 meter) and the rotatable table was turned from 0 degrees to 360 degrees to find the maximum reading. e. The test-receiver system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. f. If the emission level of the EUT in peak mode was 10dB lower than the limit specified, then testing could be stopped and the peak values of the EUT would be reported. Otherwise the emissions that did not have 10dB margin would be re-tested one by one using peak, quasi-peak or average method as specified and then reported in a data sheet. g. Test the EUT in the lowest channel, the middle channel, the Highest channel. h. The radiation measurements are performed in X, Y, Z axis positioning for Transmitting mode, and found the X axis positioning which it is the worst case. i. Repeat above procedures until all frequencies measured was complete. Remark: 1) Through pre-scan found the worst case is the lowest channel. Only the worst case is recorded in the report. 2) The field strength is calculated by adding the Antenna Factor, Cable Factor & Preamplifier. The basic equation with a sample calculation is as follows: Final Test Level =Receiver Reading + Antenna Factor + Cable Factor - Preamplifier Factor 3) Scan from 9kHz to 1 GHz, the disturbance below 30MHz was very low. The points marked on above plots are the highest emissions could be found when testing, so only above points had been displayed. The amplitude of spurious emissions from the radiator which are attenuated more than 20dB below the limit need not be reported. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 25 of 62 Test Mode: 30; Polarity: Horizontal; Modulation:GFSK; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 26 of 62 Test Mode: 30; Polarity: Vertical; Modulation:GFSK; Channel:Low NoteLevel =Read Level+Factor Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 27 of 62 7.9 Radiated Spurious Emissions (Above 1GHz) Test Requirement 47 CFR Part 15, Subpart C 15.205 & 15.209 Test Method: ANSI C63.10 (2013) Section 6.4,6.5,6.6 Limit: Frequency(MHz) Field strength(microvolts/meter) Measurement distance(meters) 0.009-0.490 2400/F(kHz) 300 0.490-1.705 24000/F(kHz) 30 1.705-30.0 30 30 30-88 100 3 88-216 150 3 216-960 200 3 Above 960 500 3 Remark: The emission limits shown in the above table are based on measurements employing a CISPR quasi-peak detector except for the frequency bands 9-90kHz, 110-490kHz and above 1000 MHz. Radiated emission limits in these three bands are based on measurements employing an average detector, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. 7.9.1 E.U.T. Operation Operating Environment: Temperature: 21.4 °C Humidity: 54.3 % RH Atmospheric Pressure: 1010 mbar 7.9.2 Test Mode Description Pre-scan / Mode Final test Code Description Pre-scan 29 TX mode_Keep the EUT in continuously transmitting mode with GFSK modulation. Final test 30 Charge + TX mode_Keep the EUT in charging and continuously transmitting mode with GFSK modulation. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 28 of 62 7.9.3 Test Setup Diagram Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 29 of 62 7.9.4 Measurement Procedure and Data a. For above 1GHz, the EUT was placed on the top of a rotating table 1.5 meters above the ground at a 3 meter fully-anechoic chamber. The table was rotated 360 degrees to determine the position of the highest radiation. b. The EUT was set 3 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. c. The antenna height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical polarizations of the antenna are set to make the measurement. d. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters and the rotatable table was turned from 0 degrees to 360 degrees to find the maximum reading. e. The test-receiver system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. f. If the emission level of the EUT in peak mode was 10dB lower than the limit specified, then testing could be stopped and the peak values of the EUT would be reported. Otherwise the emissions that did not have 10dB margin would be re-tested one by one using peak, quasi-peak or average method as specified and then reported in a data sheet. g. Test the EUT in the lowest channel, the middle channel, the Highest channel. h. The radiation measurements are performed in X, Y, Z axis positioning for Transmitting mode, and found the X axis positioning which it is the worst case. i. Repeat above procedures until all frequencies measured was complete. Remark: 1) The field strength is calculated by adding the Antenna Factor, Cable Factor & Preamplifier. The basic equation with a sample calculation is as follows: Final Test Level =Receiver Reading + Antenna Factor + Cable Factor - Preamplifier Factor 2) Scan from 1GHz to 25GHz, the disturbance above 18GHz was very low. The points marked on above plots are the highest emissions could be found when testing, so only above points had been displayed. The amplitude of spurious emissions from the radiator which are attenuated more than 20dB below the limit need not be reported. 3) The field strength limits are based on average limits. However, the peak field strength of any emission shall not exceed the maximum permitted average limits specified above by more than 20 dB under any condition of modulation. For the emissions whose peak level is lower than the average limit, only the peak measurement is shown in the report. Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 30 of 62 Test Mode: 30; Polarity: Horizontal; Modulation:GFSK; Channel:Low Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2914.504 68.98 -29.97 39.01 74.00 -34.99 peak P 2 4277.953 68.77 -29.15 39.63 74.00 -34.37 peak P 3 6086.142 64.46 -24.53 39.93 74.00 -34.07 peak P 4 8646.445 70.67 -24.46 46.22 74.00 -27.78 peak P 5 11047.792 68.61 -24.33 44.28 74.00 -29.72 peak P 6 14217.723 71.37 -20.97 50.39 74.00 -23.61 peak P Test Mode: 30; Polarity: Vertical; Modulation:GFSK; Channel:Low Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2973.893 66.73 -29.33 37.39 74.00 -36.61 peak P 2 4313.270 68.76 -29.57 39.18 74.00 -34.82 peak P 3 6352.331 66.76 -24.66 42.10 74.00 -31.90 peak P 4 8575.823 69.67 -25.01 44.66 74.00 -29.34 peak P 5 11285.173 67.43 -23.06 44.37 74.00 -29.63 peak P 6 14956.012 70.00 -19.66 50.34 74.00 -23.66 peak P Test Mode: 30; Polarity: Horizontal; Modulation:GFSK; Channel:middle Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2915.082 69.96 -29.65 40.32 74.00 -33.68 peak P 2 4277.030 67.46 -28.35 39.11 74.00 -34.89 peak P 3 6085.526 65.00 -25.58 39.43 74.00 -34.57 peak P 4 8646.012 70.53 -25.71 44.82 74.00 -29.18 peak P 5 11046.861 67.21 -23.88 43.32 74.00 -30.68 peak P 6 14218.917 71.37 -21.35 50.02 74.00 -23.98 peak P Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 31 of 62 Test Mode: 30; Polarity: Vertical; Modulation:GFSK; Channel:middle Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2973.421 66.28 -30.38 35.90 74.00 -38.10 peak P 2 4312.367 69.06 -28.08 40.98 74.00 -33.02 peak P 3 6353.643 67.73 -26.34 41.38 74.00 -32.62 peak P 4 8577.120 69.65 -25.94 43.71 74.00 -30.29 peak P 5 11286.362 67.57 -23.34 44.23 74.00 -29.77 peak P 6 14956.199 71.79 -19.70 52.09 74.00 -21.91 peak P Test Mode: 30; Polarity: Horizontal; Modulation:GFSK; Channel:High Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2914.269 69.25 -28.75 40.50 74.00 -33.50 peak P 2 4276.180 68.71 -28.38 40.33 74.00 -33.67 peak P 3 6085.517 64.38 -26.25 38.13 74.00 -35.87 peak P 4 8646.150 70.47 -24.96 45.50 74.00 -28.50 peak P 5 11046.899 67.37 -22.87 44.50 74.00 -29.50 peak P 6 14218.729 71.70 -21.39 50.31 74.00 -23.69 peak P Test Mode: 30; Polarity: Vertical; Modulation:GFSK; Channel:High Frequency Reading Factor Level Limit No. (MHz) (dBuv) (dB/m) (dBuv/m) (dBuv/m) Margin(dB) Detector P/F 1 2972.414 66.08 -30.35 35.73 74.00 -38.27 peak P 2 4312.266 69.15 -29.81 39.34 74.00 -34.66 peak P 3 6352.780 66.67 -24.47 42.20 74.00 -31.80 peak P 4 8577.156 70.23 -24.60 45.62 74.00 -28.38 peak P 5 11286.196 68.24 -24.02 44.21 74.00 -29.79 peak P 6 14955.334 70.27 -19.70 50.58 74.00 -23.42 peak P Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 32 of 62 8 Test Setup Photo Please refer to the Appendix Test Setup Photos 9 EUT Constructional Details (EUT Photos) Please refer to the Appendix EUT Photos Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 33 of 62 10 Appendix 1. -6dB Bandwidth Condition NVNT NVNT NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 1Mbps 2Mbps 2Mbps 2Mbps Frequency (MHz) 2402 2440.00 2480 2402 2440.00 2480 -6dB BW(kHz) 719.06 711.66 721.69 1248.76 1258.79 1259.93 limit(kHz) 500 500 500 500 500 500 Result Pass Pass Pass Pass Pass Pass -6dB_Bandwidth_NVNT_ANT1_1Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 34 of 62 -6dB_Bandwidth_NVNT_ANT1_1Mbps_2440 -6dB_Bandwidth_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 35 of 62 -6dB_Bandwidth_NVNT_ANT1_2Mbps_2402 -6dB_Bandwidth_NVNT_ANT1_2Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 36 of 62 -6dB_Bandwidth_NVNT_ANT1_2Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 37 of 62 2. 99% Occupied Bandwidth Condition NVNT NVNT NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 1Mbps 2Mbps 2Mbps 2Mbps Frequency (MHz) 2402 2440.00 2480 2402 2440.00 2480 99%%BW(MHz) 1.044 1.045 1.044 2.051 2.053 2.052 99%_Occupied_Bandwidth_NVNT_ANT1_1Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 38 of 62 99%_Occupied_Bandwidth_NVNT_ANT1_1Mbps_2440 99%_Occupied_Bandwidth_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 39 of 62 99%_Occupied_Bandwidth_NVNT_ANT1_2Mbps_2402 99%_Occupied_Bandwidth_NVNT_ANT1_2Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 40 of 62 99%_Occupied_Bandwidth_NVNT_ANT1_2Mbps_2480 3. Duty Cycle Condition NVNT NVNT NVNT NVNT NVNT NVNT Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 41 of 62 Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 1Mbps 2Mbps 2Mbps 2Mbps Frequency (MHz) 2402 2440.00 2480 2402 2440.00 2480 Dutycycle(%) 64.52 61.29 62.50 35.48 32.26 35.48 Duty_Cycle_NVNT_ANT1_1Mbps_2402 Duty_factor 1.90 2.13 2.04 4.50 4.91 4.50 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 42 of 62 Duty_Cycle_NVNT_ANT1_1Mbps_2440 Duty_Cycle_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 43 of 62 Duty_Cycle_NVNT_ANT1_2Mbps_2402 Duty_Cycle_NVNT_ANT1_2Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 44 of 62 Duty_Cycle_NVNT_ANT1_2Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 45 of 62 4. Peak Output Power Condition NVNT NVNT NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 1Mbps 2Mbps 2Mbps 2Mbps Frequency (MHz) 2402 2440.00 2480 2402 2440.00 2480 Max. Conducted Power(dBm) 2.33 3.14 3.76 2.41 3.17 3.85 Max. Conducted Power(mW) 1.71 2.06 2.38 1.74 2.08 2.43 Limit(mW) Result 1000 1000 1000 1000 1000 1000 Pass Pass Pass Pass Pass Pass Peak_Output_Power_NVNT_ANT1_1Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 46 of 62 Peak_Output_Power_NVNT_ANT1_1Mbps_2440 Peak_Output_Power_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 47 of 62 Peak_Output_Power_NVNT_ANT1_2Mbps_2402 Peak_Output_Power_NVNT_ANT1_2Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 48 of 62 Peak_Output_Power_NVNT_ANT1_2Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 49 of 62 5. Power Spectral Density Condition NVNT NVNT NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 1Mbps 2Mbps 2Mbps 2Mbps Frequency (MHz) 2402 2440.00 2480 2402 2440.00 2480 Power Spectral Density(dBm) -12.91 -12.06 -11.36 -15.13 -14.31 -13.57 Limit(dBm/3kHz) 8 8 8 8 8 8 Result Pass Pass Pass Pass Pass Pass Power_Spectral_Density_NVNT_ANT1_1Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 50 of 62 Power_Spectral_Density_NVNT_ANT1_1Mbps_2440 Power_Spectral_Density_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 51 of 62 Power_Spectral_Density_NVNT_ANT1_2Mbps_2402 Power_Spectral_Density_NVNT_ANT1_2Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 52 of 62 Power_Spectral_Density_NVNT_ANT1_2Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 53 of 62 6. Bandedge Condition NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 2Mbps 2Mbps TX_Frequency (MHz) 2402 2480 2402 2480 Max. Mark Frequency (MHz) 2399.965 2486.025 2399.965 2483.525 Spurious level(dBm) -57.210 -58.767 -29.903 -54.069 limit(dBm) -18.519 -16.951 -18.888 -17.301 Result Pass Pass Pass Pass 1_Reference_Level_NVNT_ANT1_1Mbps_2402 2_Bandedge_NVNT_ANT1_1Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 54 of 62 1_Reference_Level_NVNT_ANT1_1Mbps_2480 2_Bandedge_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 55 of 62 1_Reference_Level_NVNT_ANT1_2Mbps_2402 2_Bandedge_NVNT_ANT1_2Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 56 of 62 1_Reference_Level_NVNT_ANT1_2Mbps_2480 2_Bandedge_NVNT_ANT1_2Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 57 of 62 7. Spurious Emission Condition NVNT NVNT NVNT NVNT NVNT NVNT Antenna ANT1 ANT1 ANT1 ANT1 ANT1 ANT1 Rate 1Mbps 1Mbps 1Mbps 2Mbps 2Mbps 2Mbps TX_Frequency(MHz) Spurious MAX.Value(dBm) 2402 -50.008 2440.00 -50.918 2480 -49.149 2402 -51.123 2440.00 -50.665 2480 -47.741 Limit -18.519 -17.678 -16.951 -18.888 -18.076 -17.301 Result Pass Pass Pass Pass Pass Pass 1_Reference_Level_NVNT_ANT1_1Mbps_2402 2_Spurious_Emission_NVNT_ANT1_1Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 58 of 62 1_Reference_Level_NVNT_ANT1_1Mbps_2440 2_Spurious_Emission_NVNT_ANT1_1Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 59 of 62 1_Reference_Level_NVNT_ANT1_1Mbps_2480 2_Spurious_Emission_NVNT_ANT1_1Mbps_2480 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 60 of 62 1_Reference_Level_NVNT_ANT1_2Mbps_2402 2_Spurious_Emission_NVNT_ANT1_2Mbps_2402 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 61 of 62 1_Reference_Level_NVNT_ANT1_2Mbps_2440 2_Spurious_Emission_NVNT_ANT1_2Mbps_2440 Shenzhen BANTEK Testing Co., Ltd. Report No.: BTEK240308013AE002 Page: 62 of 62 1_Reference_Level_NVNT_ANT1_2Mbps_2480 2_Spurious_Emission_NVNT_ANT1_2Mbps_2480 - End of the Report -
Related FCC IDs:
- 2A8MI-AMP10 - Jiang Su Yisin Tech Co., Ltd 2.4G remote control [-AMP10] LAB02 Adobe PDF Library 22.1.117