ETSI 301 489-17 V1
Sem
Test Report
Accelera, Inc. SR100 SR-100 2A99U-SR100 2A99USR100 sr100
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Document DEVICE REPORTGetApplicationAttachment.html?id=6420107TEST REPORT Reference No..................... : FCC ID ................................ : Applicant ........................... : Address.............................. : Manufacturer ..................... : Address.............................. : Product Name ................... : Model No............................ : Standards .......................... : Date of Receipt sample .... : Date of Test........................ : Date of Issue ..................... : Test Report Form No. ....... : Test Result......................... : WTX23X02022389W 2A99U-SR100 Accelera, Inc. 215 Main Street, Biddeford, Maine 04005 The same as Applicant The same as Applicant SR-100 SR-100 FCC Part 15.247 2023-02-16 2023-02-16 to 2023-02-27 2023-02-27 WTX_Part 15_247W Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Silin Chen Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 36 Reference No.: WTX23X02022389W TABLE OF CONTENTS 1. GENERAL INFORMATION ....................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) .........................................................................4 1.2 TEST STANDARDS.................................................................................................................................................5 1.3 TEST METHODOLOGY ...........................................................................................................................................5 1.4 TEST FACILITY ......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE ..............................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS ...................................................................................................................8 2. SUMMARY OF TEST RESULTS.........................................................................................................................11 3. ANTENNA REQUIREMENT.................................................................................................................................12 3.1 STANDARD APPLICABLE .....................................................................................................................................12 3.2 EVALUATION INFORMATION ................................................................................................................................12 4. POWER SPECTRAL DENSITY...........................................................................................................................13 4.1 STANDARD APPLICABLE .....................................................................................................................................13 4.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................13 4.3 TEST PROCEDURE ..............................................................................................................................................13 4.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................13 5. DTS BANDWIDTH .................................................................................................................................................14 5.1 STANDARD APPLICABLE .....................................................................................................................................14 5.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................14 5.3 TEST PROCEDURE ..............................................................................................................................................14 5.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................14 6. RF OUTPUT POWER............................................................................................................................................15 6.1 STANDARD APPLICABLE .....................................................................................................................................15 6.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................15 6.3 TEST PROCEDURE ..............................................................................................................................................15 6.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................15 7. FIELD STRENGTH OF SPURIOUS EMISSIONS.............................................................................................16 7.1 STANDARD APPLICABLE .....................................................................................................................................16 7.2 TEST PROCEDURE ..............................................................................................................................................16 7.3 CORRECTED AMPLITUDE & MARGIN CALCULATION...........................................................................................18 7.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................18 8. OUT OF BAND EMISSIONS ................................................................................................................................22 8.1 STANDARD APPLICABLE .....................................................................................................................................22 8.2 TEST PROCEDURE ..............................................................................................................................................22 8.3 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................23 9. CONDUCTED EMISSIONS ..................................................................................................................................26 9.1 TEST PROCEDURE ..............................................................................................................................................26 9.2 BASIC TEST SETUP BLOCK DIAGRAM ................................................................................................................26 9.3 TEST RECEIVER SETUP ......................................................................................................................................26 9.4 SUMMARY OF TEST RESULTS/PLOTS.................................................................................................................26 APPENDIX SUMMARY .............................................................................................................................................27 APPENDIX A...............................................................................................................................................................28 APPENDIX B...............................................................................................................................................................30 APPENDIX C...............................................................................................................................................................32 APPENDIX D...............................................................................................................................................................34 APPENDIX PHOTOGRAPHS...................................................................................................................................36 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 36 Reference No.: WTX23X02022389W Report version Version No. Rev.00 / Date of issue 2023-02-27 / Description Original / Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 36 Reference No.: WTX23X02022389W 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) General Description of EUT Product Name: Trade Name Model No.: Adding Model(s): Rated Voltage: Capacity: Power Adapter: SR-100 / SR-100 / Battery:3.7V / / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Bluetooth Version: Frequency Range: RF Output Power: Data Rate: Modulation: Quantity of Channels: Channel Separation: Type of Antenna: Antenna Gain: V4.0 (BLE mode) 2402-2480MHz -13.37dBm (Conducted) 1Mbps GFSK 40 2MHz Ceramic Antenna 2.5dBi Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 36 Reference No.: WTX23X02022389W 1.2 Test Standards The tests were performed according to following standards: FCC Rules Part 15.247: Frequency Hopping, Direct Spread Spectrum and Hybrid Systems that are in operation within the bands of 902-928MHz, 2400-2483.5MHz, and 5725-5850MHz. 558074 D01 15.247 Meas Guidance v05r02: Guidance for Compliance Measurements on Digital Transmission System, Frequency Hopping Spread Spectrum System, and Hybrid System Devices Operating under section 15.247 of the Fcc rules. ANSI C63.10-2013: American National Standard for Testing Unlicensed Wireless Devices. Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which result in lowering the emission, should be checked to ensure compliance has been maintained. 1.3 Test Methodology All measurements contained in this report were conducted with ANSI C63.10-2013, KDB 558074 D01 15.247 Meas Guidance v05r02. The equipment under test (EUT) was configured to measure its highest possible emission level. The test modes were adapted accordingly in reference to the Operating Instructions. 1.4 Test Facility Address of the test laboratory Laboratory: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China FCC Registration No.: 125990 Waltek Testing Group (Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the FCC (Federal Communications Commission). The acceptance letter from the FCC is mai ntained in our files. The Designation Number is CN5010, and Test Firm Registration Number is 125990. Industry Canada (IC) Registration No.: 11464A The 3m Semi-anechoic chamber of Waltek Testing Group (Shenzhen) Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.: 11464A and the CAB identifier is CN0057. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 5 of 36 Reference No.: WTX23X02022389W 1.5 EUT Setup and Test Mode The EUT was operated in the engineering mode to fix the Tx frequency that was for the purpose of the measurements. All testing shall be performed under maximum output power condition, with a duty cycle equal to 100%, and to measure its highest possible emissions level, more detailed description as follows: Test Mode List Test Mode TM1 TM2 TM3 Description Low Middle High Test Conditions Temperature: Relative Humidity: ATM Pressure: EUT Cable List and Details Cable Description / Length (m) / Special Cable List and Details Cable Description / Length (m) / Remark 2402MHz 2440MHz 2480MHz 22~25 C 45~55 % 1019 mbar Shielded/Unshielded / With / Without Ferrite / Shielded/Unshielded / With / Without Ferrite / Auxiliary Equipment List and Details Description Manufacturer / / Model / Serial Number / Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 6 of 36 Reference No.: WTX23X02022389W 1.6 Measurement Uncertainty Measurement uncertainty Parameter RF Output Power Occupied Bandwidth Power Spectral Density Conducted Spurious Emission Conducted Emissions Transmitter Spurious Emissions Conditions Conducted Conducted Conducted Conducted Conducted Radiated Uncertainty ±0.42dB ±1.5% ±1.8dB ±2.17dB 9-150kHz ±3.74dB 0.15-30MHz ±3.34dB 30-200MHz ±4.52dB 0.2-1GHz ±5.56dB 1-6GHz ±3.84dB 6-26GHz ±3.92dB Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 7 of 36 Reference No.: WTX23X02022389W 1.7 Test Equipment List and Details No. Description Communication SEMT-1075 Tester SEMT-1063 GSM Tester SEMT-1072 SEMT-1079 SMET-1313 SEMT-1080 SEMT-1081 SEMT-1028 Spectrum Analyzer Spectrum Analyzer Spectrum Analyzer Signal Generator Vector Signal Generator Power Divider SEMT-1082 Power Divider SEMT-C001 Cable SEMT-C002 Cable SEMT-C003 Cable SEMT-C004 Cable SEMT-C005 Cable SEMT-C006 Cable Chamber A: Below 1GHz SEMT-1031 Spectrum Analyzer SEMT-1007 EMI Test Receiver SEMT-1008 Amplifier SEMT-1069 Loop Antenna SEMT-1068 Broadband Antenna Chamber A: Above 1GHz SEMT-1031 Spectrum Analyzer Manufacturer Rohde & Schwarz Rohde & Schwarz Agilent Agilent Agilent Agilent Agilent Weinschel RF-Lambda Zheng DI Zheng DI Zheng DI Zheng DI Zheng DI Zheng DI Rohde & Schwarz Rohde & Schwarz HP Schwarz beck Schwarz beck Rohde & Schwarz Model CMW500 Serial No. Cal Date 148650 2022-03-22 CMU200 114403 2022-03-22 E4407B N9020A N9020A 83752A N5182A 1506A RFLT4W5M18 G LL142-07-07-1 0M(A) ZT40-2.92J-2.9 2J-6M ZT40-2.92J-2.9 2J-2.5M 2M0RFC 1M0RFC 1M0RFC MY414404 00 US471401 02 MY543205 48 3610A014 53 MY470702 02 PM204 14110400 027 / / / / / / 2022-03-25 2022-03-22 2022-03-22 2022-03-22 2022-03-22 2022-03-22 2022-03-22 / / / / / / FSP30 ESVB 8447F FMZB 1516 836079/03 5 825471/00 5 2805A034 75 9773 2022-03-22 2022-03-22 2022-12-30 2021-03-20 VULB9163 9163-333 2021-03-20 FSP30 836079/03 2022-03-22 5 Due. Date 2023-03-21 2023-03-21 2023-03-24 2023-03-21 2023-03-21 2023-03-21 2023-03-21 2023-03-21 2023-03-21 / / / / / / 2023-03-21 2023-03-21 2023-12-29 2023-03-19 2023-03-19 2023-03-21 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 8 of 36 Reference No.: WTX23X02022389W SEMT-1007 SEMT-1043 SEMT-1042 EMI Test Receiver Amplifier Horn Antenna SEMT-1121 Horn Antenna SEMT-1216 Pre-amplifier SEMT-1163 Spectrum Analyzer Chamber B:Below 1GHz Trilog SEMT-1068 Broadband Antenna SEMT-1067 Amplifier SEMT-1066 EMI Test Receiver Chamber C:Below 1GHz SEMT-1319 EMI Test Receiver Trilog SEMT-1343 Broadband Antenna SEMT-1333 Amplifier Conducted Room 1# SEMT-1001 EMI Test Receiver SEMT-1002 Pulse Limiter SEMT-1003 AC LISN Conducted Room 2# SEMT-1334 EMI Test Receiver SEMT-1336 LISN Rohde & Schwarz C&D ETS Schwarzbeck Schwarzbeck Rohde & Schwarz Schwarz beck Agilent Rohde & Schwarz Rohde & Schwarz Schwarz beck HP Rohde & Schwarz Rohde & Schwarz Schwarz beck Rohde & Schwarz Rohde & Schwarz ESVB PAP-1G18 3117 BBHA 9170 BBV 9721 FSP40 825471/00 5 2002 00086197 BBHA917 0582 9721-031 2022-03-22 2022-03-22 2021-03-19 2021-04-27 2022-03-25 2023-03-21 2023-03-21 2023-03-18 2023-04-26 2023-03-24 100612 2022-03-22 2023-03-21 VULB9163(B) 9163-635 2021-04-09 2023-04-08 8447D ESPI 2944A101 2022-03-22 2023-03-21 79 101391 2022-03-22 2023-03-21 ESIB 26 100401 2022-12-30 2023-12-29 VULB 9168 1194 2021-05-28 2023-05-27 8447F 2944A038 2022-03-22 2023-03-21 69 ESPI 101611 2022-03-21 2023-03-20 ESH3-Z2 NSLK8126 100911 2022-03-25 2023-03-24 8126-224 2022-03-22 2023-03-21 ESPI ENV 216 101259 2022-03-22 2023-03-21 100097 2022-03-22 2023-03-21 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 9 of 36 Reference No.: WTX23X02022389W Description EMI Test Software (Radiated Emission)* EMI Test Software (Conducted Emission)* Software List Manufacturer Farad Farad Model EZ-EMC EZ-EMC *Remark: indicates software version used in the compliance certification testing. Version RA-03A1 RA-03A1 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 10 of 36 Reference No.: WTX23X02022389W 2. SUMMARY OF TEST RESULTS FCC Rules §15.203; §15.247(b)(4)(i) §15.205 §15.207(a) §15.247(e) §15.247(a)(2) §15.247(b)(3) §15.209(a) §15.247(d) N/A: Not applicable. Description of Test Item Antenna Requirement Restricted Band of Operation Conducted Emission Power Spectral Density DTS Bandwidth RF Output Power Radiated Emission Band Edge (Out of Band Emissions) Result Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 11 of 36 Reference No.: WTX23X02022389W 3. Antenna Requirement 3.1 Standard Applicable According to FCC Part 15.203, an intentional radiator shall be designed to ensure that no antenna other than that furnished by the responsible party shall be used with the device. The use of a permanently attached antenna or of an antenna that uses a unique coupling to the intentional radiator shall be considered sufficient to comply with the provisions of this section. 3.2 Evaluation Information This product has a Ceramic Antenna, fulfill the requirement of this section. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 12 of 36 Reference No.: WTX23X02022389W 4. Power Spectral Density 4.1 Standard Applicable According to 15.247(a)(1)(iii), for digitally modulated systems, the power spectral density conducted from the intentional radiator to the antenna shall not be greater than 8dBm in any 3kHz band during any time interval of continuous transmission. 4.2 Test Setup Block Diagram 4.3 Test Procedure According to the KDB 558074 D01 v05r02 Subclause 8.4 and ANSI C63.10-2013 Subclause 11.10.2, the test method of power spectral density as below: a) Set analyzer center frequency to DTS channel center frequency. b) Set the span to 1.5 times the DTS bandwidth. c) Set the RBW to: 3kHz RBW 100kHz. d) Set the VBW 3 × RBW. e) Detector = peak. f) Sweep time = auto couple. g) Trace mode = max hold. h) Allow trace to fully stabilize. i) Use the peak marker function to determine the maximum amplitude level within the RBW. j) If measured value exceeds limit, reduce RBW (no less than 3kHz) and repeat. 4.4 Summary of Test Results/Plots Please refer to Appendix A Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 13 of 36 Reference No.: WTX23X02022389W 5. DTS Bandwidth 5.1 Standard Applicable According to 15.247(a)(2), systems using digital modulation techniques may operate in the 902928MHz, 24002483.5MHz, and 57255850 MHz bands. The minimum 6dB bandwidth shall be at least 500kHz. 5.2 Test Setup Block Diagram 5.3 Test Procedure According to the KDB 558074 D01 v05r02 Subclause 8.2 and ANSI C63.10-2013 Subclause 11.8.1, the test method of DTS Bandwidth as below: a) Set RBW = 100kHz. b) Set the video bandwidth (VBW) 3 × RBW. c) Detector = Peak. d) Trace mode = max hold. e) Sweep = auto couple. f) Allow the trace to stabilize. g) Measure the maximum width of the emission that is constrained by the frequencies associated with the two outermost amplitude points (upper and lower frequencies) that are attenuated by 6dB relative to the maximum level measured in the fundamental emission. 5.4 Summary of Test Results/Plots Please refer to Appendix B Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 14 of 36 Reference No.: WTX23X02022389W 6. RF Output Power 6.1 Standard Applicable According to 15.247(b)(3), for systems using digital modulation in the 902928MHz, 24002483.5MHz, and 57255850MHz bands: 1 Watt. 6.2 Test Setup Block Diagram 6.3 Test Procedure According to the KDB-558074 D01 v05r02 Subclause 8.3.1.1 and ANSI C63.10-2013 Subclause 11.9.1.1, this procedure shall be used when the measurement instrument has available a resolution bandwidth that is greater than the DTS bandwidth. a) Set the RBW DTS bandwidth. b) Set VBW 3 × RBW. c) Set span 3 x RBW d) Sweep time = auto couple. e) Detector = peak. f) Trace mode = max hold. g) Allow trace to fully stabilize. h) Use peak marker function to determine the peak amplitude level. 6.4 Summary of Test Results/Plots Please refer to Appendix C Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 15 of 36 Reference No.: WTX23X02022389W 7. Field Strength of Spurious Emissions 7.1 Standard Applicable According to §15.247(d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a). The emission limit in this paragraph is based on measurement instrumentation employing an average detector. The provisions in §15.35 for limiting peak emissions apply. Spurious Radiated Emissions measurements starting below or at the lowest crystal frequency. 7.2 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.205 15.247(a) and FCC Part 15.209 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. The test setup for emission measurement below 30MHz. Semi-anechoic 3m Chamber Turn Table From 0°to 360° 3m EUT 0.8m Turn Table PC System Spectrum Analyzer Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 16 of 36 AMP Combining Network Reference No.: WTX23X02022389W The test setup for emission measurement from 30MHz to 1GHz. Semi-anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360° 3m EUT 0.8m Turn Table PC System Spectrum Analyzer The test setup for emission measurement above 1GHz. AMP Combining Network Anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360° EUT 3m 1.5m Turn Table Absorbers PC System Spectrum Analyzer Frequency :9kHz-30MHz RBW=10KHz, VBW =30KHz Sweep time= Auto Trace = max hold Frequency :30MHz-1GHz RBW=120KHz, VBW=300KHz Sweep time= Auto Trace = max hold Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 17 of 36 AMP Combining Network Frequency :Above 1GHz RBW=1MHz, VBW=3MHz(Peak), 10Hz(AV) Sweep time= Auto Trace = max hold Reference No.: WTX23X02022389W Detector function = peak Detector function = peak, QP 7.3 Corrected Amplitude & Margin Calculation Detector function = peak, AV The Corrected Amplitude is calculated by adding the Antenna Factor and the Cable Factor, and subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows: Corr. Ampl. = Indicated Reading + Ant. Factor + Cable Loss Ampl. Gain The "Margin" column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of -6dBV means the emission is 6dBV below the maximum limit. The equation for margin calculation is as follows: Margin = Corr. Ampl. FCC Part 15 Limit 7.4 Summary of Test Results/Plots Note: this EUT was tested in 3 orthogonal positions and the worst case position data was reported. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 18 of 36 Reference No.: WTX23X02022389W Spurious Emissions Below 1GHz Test Channel Low Polarity: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) (cm) 1 30.7455 34.46 -9.15 25.31 40.00 -14.69 - - peak 2 46.9948 26.75 -7.26 19.49 40.00 -20.51 - - peak 3 100.5806 28.01 -8.07 19.94 43.50 -23.56 - - peak 4 256.5211 29.11 -6.49 22.62 46.00 -23.38 - - peak 5 477.1694 28.15 -2.46 25.69 46.00 -20.31 - - peak 6 766.0572 28.01 1.98 29.99 46.00 -16.01 - - peak Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 19 of 36 Reference No.: WTX23X02022389W Test Channel Low Polarity: Vertical No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) (cm) 1 30.1054 34.62 -9.30 25.32 40.00 -14.68 - - peak 2 99.5281 27.10 -8.18 18.92 43.50 -24.58 - - peak 3 311.0867 26.68 -4.82 21.86 46.00 -24.14 - - peak 4 400.4319 28.15 -3.30 24.85 46.00 -21.15 - - peak 5 616.3718 28.93 0.09 29.02 46.00 -16.98 - - peak 6 945.4399 27.59 4.09 31.68 46.00 -14.32 - - peak Remark: `-'Means' the test Degree and Height are not recorded by the test software and only show the worst case in the test report. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 20 of 36 Reference No.: WTX23X02022389W Spurious Emissions Above 1GHz Frequency Reading (MHz) (dBuV/m) 4804 4804 7206 7206 4804 4804 7206 7206 52.79 48.66 51.55 43.69 51.98 46.36 43.87 41.78 4880 4880 7320 7320 4880 4880 7320 7320 50.83 49.85 53.22 42.69 53.41 45.78 44.42 41.74 4960 4960 7440 7440 4960 4960 7440 7440 50.51 48.62 52.99 43.09 50.91 45.75 41.93 41.81 Correct dB -3.59 -3.59 -0.52 -0.52 -3.59 -3.59 -0.52 -0.52 -3.49 -3.49 -0.47 -0.47 -3.49 -3.49 -0.47 -0.47 -3.41 -3.41 -0.42 -0.42 -3.41 -3.41 -0.42 -0.42 Result Limit (dBuV/m) (dBuV/m) Low Channel-2402MHz 49.20 74 45.07 54 51.03 74 43.17 54 48.39 74 42.77 54 43.35 74 41.26 54 Middle Channel-2440MHz 47.34 74 46.36 54 52.75 74 42.22 54 49.92 74 42.29 54 43.95 74 41.27 54 High Channel-2480MHz 47.10 74 45.21 54 52.57 74 42.67 54 47.50 74 42.34 54 41.51 74 41.39 54 Margin (dB) -24.80 -8.93 -22.97 -10.83 -25.61 -11.23 -30.65 -12.74 -26.66 -7.64 -21.25 -11.78 -24.08 -11.71 -30.05 -12.73 -26.90 -8.79 -21.43 -11.33 -26.50 -11.66 -32.49 -12.61 Polar H/V H H H H V V V V H H H H V V V V H H H H V V V V Detector PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV Note: Testing is carried out with frequency rang 9kHz to the tenth harmonics, other than listed in the table above are attenuated more than 20dB below the permissible limits or the field strength is too small to be measured. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 21 of 36 Reference No.: WTX23X02022389W 8. Out of Band Emissions 8.1 Standard Applicable According to §15.247(d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a). 8.2 Test Procedure According to the KDB 558074 D01 v05r02 Subclause 8.4 and ANSI C63.10-2013 Subclause 11.11, the Emissions in nonrestricted frequency bands test method as follows: a) Set the center frequency and span to encompass frequency range to be measured. b) Set the RBW = 100kHz. c) Set the VBW [3 × RBW]. d) Detector = peak. e) Sweep time = auto couple. f) Trace mode = max hold. g) Allow trace to fully stabilize. h) Use the peak marker function to determine the maximum amplitude level. According to the KDB 558074 D01 v05r02 Subclause 8.5 and ANSI C63.10-2013 Subclause 11.12, the Emissions in restricted frequency bands test method as follows: A. Radiated emission measurements: Set span = wide enough to capture the peak level of the emission operating on the channel closest to the bandedge, as well as any modulation products which fall outside of the authorized band of operation (2310MHz to 2420MHz for low bandedge, 2460MHz to 2500MHz for the high bandedge) RBW = 1MHz, VBW = 1MHz for peak value measured RBW = 1MHz, VBW = 10Hz for average value measured Sweep = auto; Detector function = peak/average; Trace = max hold All the trace to stabilize, set the marker on the emission at the bandedge, or on the highest modulation product outside of the band, if this level is greater than that at the bandedge. Enable the marker-delta function, then use the marker-to-peak function to move the marker to the peak of the in-band emission. Those emission Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 22 of 36 Reference No.: WTX23X02022389W must comply with the 15.209 limit for fall in the restricted bands listed in section 15.205. Note that the method of measurement KDB publication number: 913591 may be used for the radiated bandedge measurements. B. Antenna-port conducted measurements Peak emission levels are measured by setting the instrument as follows: a) RBW = as specified in Table 9. b) VBW [3 × RBW]. c) Detector = peak. d) Sweep time = auto. e) Trace mode = max hold. f) Allow sweeps to continue until the trace stabilizes. (Note that the required measurement time may be lengthened for low-duty-cycle applications.) RBW as a function of frequency Frequency RBW 9kHz to 150kHz 200Hz to 300Hz 0.15MHz to 30MHz 9kHz to 10kHz 30MHz to 1000MHz 100kHz to 120kHz >1000MHz 1MHz If the peak-detected amplitude can be shown to comply with the average limit, then it is not necessary to perform a separate average measurement. Ensure that the amplitude of all unwanted emissions outside of the authorized frequency band (excluding restricted frequency bands) are attenuated by at least the minimum requirements specified in section 8.1. Report the three highest emissions relative to the limit. 8.3 Summary of Test Results/Plots Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 23 of 36 Reference No.: WTX23X02022389W Radiated test Test Channel Low Polarity: Horizontal (worst case) No. Frequency Reading Correct Result Limit Margin (MHz) (dBuV/m) Factor(dB) (dBuV/m) (dBuV/m) (dB) 1 2310.000 42.09 -8.78 33.31 54.00 -20.69 2310.000 56.75 -8.78 47.97 74.00 -26.03 2 2390.000 43.71 -8.48 35.23 54.00 -18.77 2390.000 55.90 -8.48 47.42 74.00 -26.58 3 2402.000 87.39 -8.44 78.95 / / 2402.400 89.84 -8.44 81.40 / / Remark Average Detector Peak Detector Average Detector Peak Detector Average Detector Peak Detector Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 24 of 36 Reference No.: WTX23X02022389W Test Channel High Polarity: Horizontal (worst case) No. Frequency Reading Correct Result Limit Margin (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) 1 2479.975 86.99 -8.15 78.84 / / 2479.700 88.04 -8.15 79.89 / / 2 2483.500 50.05 -8.14 41.91 54.00 -12.09 2483.500 59.52 -8.14 51.38 74.00 -22.62 3 2500.000 41.61 -8.08 33.53 54.00 -20.47 2500.000 54.85 -8.08 46.77 74.00 -27.23 Remark Average Detector Peak Detector Average Detector Peak Detector Average Detector Peak Detector Conducted test Please refer to Appendix D Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 25 of 36 Reference No.: WTX23X02022389W 9. Conducted Emissions 9.1 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.207 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. 9.2 Basic Test Setup Block Diagram 0.4m 0.8m EUT LISN Receiver PC System 0.8m :50 Terminator 9.3 Test Receiver Setup During the conducted emission test, the test receiver was set with the following configurations: Start Frequency ..................................................................... 150kHz Stop Frequency ..................................................................... 30MHz Sweep Speed ........................................................................ Auto IF Bandwidth.......................................................................... 10kHz Quasi-Peak Adapter Bandwidth ............................................ 9kHz Quasi-Peak Adapter Mode .................................................... Normal 9.4 Summary of Test Results/Plots Not applicable Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 26 of 36 Reference No.: WTX23X02022389W APPENDIX SUMMARY Project No. Start date Temperature RF specifications APPENDIX A B C D WTX23X02022389W 2023/2/22 22 BT-BLE Test Engineer Finish date Humidity Description of Test Item Power Spectral Density DTS Bandwidth RF Output Power Conducted Out of Band Emissions BAIdi Zhong 2023/2/23 46% Result Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 27 of 36 Reference No.: WTX23X02022389W APPENDIX A Power Spectral Density Test Mode GFSK(BLE) Test Channel Low Middle High Power Spectral Density dBm/3kHz -25.07 -27.83 -30.79 Limit dBm/3kHz 8 8 8 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 28 of 36 Reference No.: WTX23X02022389W Low Middle High Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.402 GHz * Att 20 dB * RBW 3 kHz * VBW 10 kHz SWT 170 ms Marker 1 [T1 ] -25.07 dBm 2.401880000 GHz A LVL 1 3DB 150 kHz/ Span 1.5 MHz Date: 22.FEB.2023 13:21:15 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.44 GHz * Att 20 dB * RBW 3 kHz * VBW 10 kHz SWT 170 ms Marker 1 [T1 ] -27.83 dBm 2.439949000 GHz A LVL 1 3DB 150 kHz/ Span 1.5 MHz Date: 22.FEB.2023 13:24:55 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.48 GHz * Att 20 dB * RBW 3 kHz * VBW 10 kHz SWT 170 ms Marker 1 [T1 ] -30.79 dBm 2.479868000 GHz A LVL 1 3DB 150 kHz/ Span 1.5 MHz Date: 22.FEB.2023 13:28:58 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 29 of 36 Reference No.: WTX23X02022389W APPENDIX B Test Mode GFSK(BLE) Test Channel Low Middle High 6 dB Bandwidth kHz 696 690 690 Limit kHz 500 500 500 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 30 of 36 Reference No.: WTX23X02022389W Low Middle High Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.402 GHz * Att 20 dB T1 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 1 [T1 ] -13.90 dBm 2.402210000 GHz 1 T2 ndB [T1] 6.00 dB BW 696.000000000 kHz Temp 1 [T1 ndB] A -19.89 dBm 2.401622000 GHz Temp 2 [T1 ndB] LVL -19.97 dBm 2.402318000 GHz 3DB 300 kHz/ Span 3 MHz Date: 22.FEB.2023 13:21:43 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.44 GHz * Att 20 dB T1 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 1 [T1 ] -16.24 dBm 2.440216000 GHz 1 T2 ndB [T1] 6.00 dB BW 690.000000000 kHz Temp 1 [T1 ndB] A -22.12 dBm 2.439628000 GHz Temp 2 [T1 ndB] LVL -22.31 dBm 2.440318000 GHz 3DB 300 kHz/ Span 3 MHz Date: 22.FEB.2023 13:25:20 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.48 GHz * Att 20 dB 1 T1 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 1 [T1 ] -18.22 dBm 2.479718000 GHz ndB [T1] 6.00 dB BW 690.000000000 kHz Temp 1 [T1 ndB] A -24.29 dBm 2.479610000 GHz Temp 2 [T1 ndB] LVL -24.49 dBm 2.480300000 GHz T2 3DB 300 kHz/ Span 3 MHz Date: 22.FEB.2023 13:29:22 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 31 of 36 Reference No.: WTX23X02022389W APPENDIX C RF Output Power Test Mode GFSK(BLE) Test Channel Low Middle High Reading dBm -13.37 -15.58 -17.78 Limit dBm 30.00 30.00 30.00 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 32 of 36 Reference No.: WTX23X02022389W Low Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.402 GHz * Att 20 dB * RBW 1 MHz * VBW 3 MHz SWT 2.5 ms Marker 1 [T1 ] -13.37 dBm 2.402240000 GHz A 1 LVL 3DB 500 kHz/ Span 5 MHz Middle Date: 22.FEB.2023 13:20:57 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.44 GHz * Att 20 dB * RBW 1 MHz * VBW 3 MHz SWT 2.5 ms Marker 1 [T1 ] -15.58 dBm 2.440210000 GHz A 1 LVL 3DB 500 kHz/ Span 5 MHz High Date: 22.FEB.2023 13:24:29 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 -30 -40 -50 -60 -70 -80 -90 Center 2.48 GHz * Att 20 dB * RBW 1 MHz * VBW 3 MHz SWT 2.5 ms Marker 1 [T1 ] -17.78 dBm 2.479770000 GHz A LVL 1 3DB 500 kHz/ Span 5 MHz Date: 22.FEB.2023 13:28:32 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 33 of 36 Reference No.: WTX23X02022389W APPENDIX D Conducted Out of Band Emissions Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 * Att 20 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -44.49 dBm 2.400000000 GHz Marker 1 [T1 ] -14.05 dBm 2.402000000 GHz A 1 LVL -30 -40 D1 -34.05 dBm -50 2 3DB -60 -70 -80 -90 Center 2.393 GHz 2.5 MHz/ Span 25 MHz Low Date: 22.FEB.2023 13:22:28 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 * Att 20 dB * RBW 100 kHz * VBW 300 kHz SWT 2.6 s Marker 1 [T1 ] -50.54 dBm 25.117020000 GHz A LVL -30 -40 D1 -34.05 dBm -50 1 3DB -60 -70 -80 -90 Start 30 MHz 2.597 GHz/ Stop 26 GHz Middle Date: 22.FEB.2023 13:22:47 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 * Att 20 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 1 [T1 ] -15.92 dBm 2.440192000 GHz A 1 LVL -30 -40 D1 -35.92 dBm -50 3DB -60 -70 -80 -90 Center 2.44 GHz 1.2 MHz/ Span 12 MHz Date: 22.FEB.2023 13:26:17 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 34 of 36 Reference No.: WTX23X02022389W Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 * Att 20 dB * RBW 100 kHz * VBW 300 kHz SWT 2.6 s Marker 1 [T1 ] -48.68 dBm 25.065080000 GHz A LVL -30 -40 D1 -35.92 dBm -50 1 3DB -60 -70 -80 -90 Start 30 MHz 2.597 GHz/ Stop 26 GHz Date: 22.FEB.2023 13:26:37 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 1 -20 * Att 20 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -57.77 dBm 2.483500000 GHz Marker 1 [T1 ] -18.15 dBm 2.479732000 GHz A LVL -30 -40 D1 -38.15 dBm -50 2 -60 3DB -70 -80 -90 Center 2.4835 GHz 1.2 MHz/ Span 12 MHz High Date: 22.FEB.2023 13:30:27 Ref 10 dBm 10 Offset 1 dB 0 1 PK MAXH -10 -20 * Att 20 dB * RBW 100 kHz * VBW 300 kHz SWT 2.6 s Marker 1 [T1 ] -50.45 dBm 25.272840000 GHz A LVL -30 -40 D1 -38.15 dBm -50 1 3DB -60 -70 -80 -90 Start 30 MHz 2.597 GHz/ Stop 26 GHz Date: 22.FEB.2023 13:30:45 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 35 of 36 Reference No.: WTX23X02022389W APPENDIX PHOTOGRAPHS Please refer to "ANNEX" ***** END OF REPORT ***** Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 36 of 36
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