ETSI 301 489-17 V1
Sem
Test Report
Controlid Industria e Comercio de Hardware e Servicos De Tecnologia Ltda IDUHFLITE iDUHF 2AKJ4-IDUHFLITE 2AKJ4IDUHFLITE iduhflite
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Document DEVICE REPORTGetApplicationAttachment.html?id=7306624TEST REPORT Reference No....................... : FCC ID.................................... : Applicant............................... : Address................................. : Manufacturer........................ : Address................................. : Product Name...................... : Model No............................... : Standards.............................. : Date of Receipt sample..... : Date of Test........................... : Date of Issue........................ : Test Report Form No.......... : Test Result............................ : WTX24X03058022W 2AKJ4-IDUHFLITE Controlid Industria e Comercio de Hardware e Servicos De Tecnologia Ltda Rua Hungria 888, 8th floor, São Paulo 01455-000, Brazil The same as Applicant The same as Applicant iDUHF iDUHF LITE FCC Part 15.247 2024-03-20 2024-03-20 to 2024-04-18 2024-04-18 WTX_Part 15_247W Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Jason Su Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 52 Reference No.: WTX24X03058022W TABLE OF CONTENTS 1. GENERAL INFORMATION .....................................................................................................................................5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ........................................................................5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY .......................................................................................................................................................6 1.5 EUT SETUP AND TEST MODE ..............................................................................................................................7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 8 1.7 TEST EQUIPMENT LIST AND DETAILS .................................................................................................................. 9 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................. 13 3.1 STANDARD APPLICABLE ......................................................................................................................................13 3.2 EVALUATION INFORMATION ................................................................................................................................ 13 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS .................................................................................... 14 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ....................................................16 5.1 STANDARD APPLICABLE ......................................................................................................................................16 5.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................16 5.3 TEST PROCEDURE .............................................................................................................................................. 16 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 17 6. DWELL TIME OF HOPPING CHANNEL ............................................................................................................18 6.1 STANDARD APPLICABLE ......................................................................................................................................18 6.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................18 6.3 TEST PROCEDURE .............................................................................................................................................. 18 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 19 7. 20DB BANDWIDTH ................................................................................................................................................20 7.1 STANDARD APPLICABLE ......................................................................................................................................20 7.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................20 7.3 TEST PROCEDURE .............................................................................................................................................. 20 7.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 21 8. RF OUTPUT POWER ............................................................................................................................................ 22 8.1 STANDARD APPLICABLE ......................................................................................................................................22 8.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................22 8.3 TEST PROCEDURE .............................................................................................................................................. 22 8.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 22 9. FIELD STRENGTH OF SPURIOUS EMISSIONS ............................................................................................. 23 9.1 STANDARD APPLICABLE ......................................................................................................................................23 9.2 TEST PROCEDURE .............................................................................................................................................. 23 9.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ..........................................................................................25 9.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 25 10. OUT OF BAND EMISSIONS .............................................................................................................................. 33 10.1 STANDARD APPLICABLE ................................................................................................................................... 33 10.2 TEST PROCEDURE ............................................................................................................................................ 33 10.3 SUMMARY OF TEST RESULTS/PLOTS .............................................................................................................. 34 11. CONDUCTED EMISSIONS ................................................................................................................................ 35 11.1 TEST PROCEDURE ............................................................................................................................................ 35 11.2 BASIC TEST SETUP BLOCK DIAGRAM ............................................................................................................. 35 11.3 TEST RECEIVER SETUP ....................................................................................................................................35 11.4 SUMMARY OF TEST RESULTS/PLOTS .............................................................................................................. 35 APPENDIX SUMMARY ..............................................................................................................................................38 APPENDIX A ................................................................................................................................................................39 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 52 Reference No.: WTX24X03058022W APPENDIX B ................................................................................................................................................................42 APPENDIX C ................................................................................................................................................................45 APPENDIX D ................................................................................................................................................................47 APPENDIX E ................................................................................................................................................................49 APPENDIX PHOTOGRAPHS ................................................................................................................................... 52 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 52 Reference No.: WTX24X03058022W Report version Version No. Rev.00 / Date of issue 2024-04-18 / Description Original / Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 52 Reference No.: WTX24X03058022W 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) General Description of EUT Product Name: iDUHF Trade Name: / Model No.: iDUHF LITE Adding Model(s): / Rated Voltage: DC12V Battery Capacity: / Power Adapter: / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Frequency Range: 902.25-927.75MHz RF Output Power: 25.10dBm (Conducted) Modulation: FHSS Quantity of Channels: 52 Channel Separation: 500kHz Type of Antenna: External Antenna Antenna Gain: 8.06dBi Note The Antenna Gain is provided by the customer and can affect the validity of results. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 5 of 52 Reference No.: WTX24X03058022W 1.2 Test Standards The tests were performed according to following standards: FCC Rules Part 15.247: Frequency Hopping, Direct Spread Spectrum and Hybrid Systems that are in operation within the bands of 902-928MHz, 2400-2483.5MHz, and 5725-5850MHz. 558074 D01 15.247 Meas Guidance v05r02: Guidance for Compliance Measurements on Digital Transmission System, Frequency Hopping Spread Spectrum System, and Hybrid System Devices Operating under section 15.247 of the FCC rules. ANSI C63.10-2013: American National Standard for Testing Unlicensed Wireless Devices. Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which result in lowering the emission, should be checked to ensure compliance has been maintained. 1.3 Test Methodology All measurements contained in this report were conducted with ANSI C63.10-2013, the equipment under test (EUT) was configured to measure its highest possible emission level. The test modes were adapted accordingly in reference to the Operating Instructions. 1.4 Test Facility Address of the test laboratory Laboratory: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China FCC Registration No.: 125990 Waltek Testing Group (Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the FCC (Federal Communications Commission). The acceptance letter from the FCC is mai ntained in our files. The Designation Number is CN5010, and Test Firm Registration Number is 125990. Industry Canada (IC) Registration No.: 11464A The 3m Semi-anechoic chamber of Waltek Testing Group (Shenzhen) Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.: 11464A and the CAB identifier is CN0057. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 6 of 52 Reference No.: WTX24X03058022W 1.5 EUT Setup and Test Mode The testing channels and the power were set through Control iD's firmware. All testing was performed under maximum output power condition, and to measure its highest possible emissions level, more detailed description as follows: Test Mode List Test Mode TM1 TM2 TM3 TM4 Description Low Channel Middle Channel High Channel Hopping Test Conditions Temperature: Relative Humidity: ATM Pressure: EUT Cable List and Details Cable Description / Length (m) / Special Cable List and Details Cable Description / Length (m) / Remark 902.25MHz 914.75MHz 927.75MHz 902.25-927.75MHz 22~25 C 45~55 %. 1019 mbar Shielded/Unshielded / With / Without Ferrite / Shielded/Unshielded / With / Without Ferrite / Auxiliary Equipment List and Details Description Manufacturer Adapter / Computer Lenovo Model PA-30360W-ZMX L13 Yoga Serial Number / / Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 7 of 52 Reference No.: WTX24X03058022W 1.6 Measurement Uncertainty Measurement uncertainty Parameter RF Output Power Occupied Bandwidth Conducted Spurious Emission Conducted Emissions Transmitter Spurious Emissions Conditions Conducted Conducted Conducted Conducted Radiated Uncertainty ±0.42dB ±1.5% ±2.17dB 9-150kHz ±3.74dB 0.15-30MHz ±3.34dB 30-200MHz ±4.52dB 0.2-1GHz ±5.56dB 1-6GHz ±3.84dB 6-18GHz ±3.92dB Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 8 of 52 Reference No.: WTX24X03058022W 1.7 Test Equipment List and Details Fixed asset Number Description Manufacturer WTXE1041A Communication Rohde & 1001 Tester Schwarz WTXE1022A 1002 GSM Tester Rohde & Schwarz WTXE1005A 1005 Spectrum Analyzer Agilent WTXE1084A 1001 Spectrum Analyzer Agilent WTXE1044A 1001 Signal Generator Agilent WTXE1045A Vector Signal 1001 Generator Agilent WTXE1018A Power Divider 1001 Weinschel Chamber A: Below 1GHz WTXE1005A Spectrum Rohde & 1003 Analyzer Schwarz WTXE1001A EMI Test Rohde & 1001 Receiver Schwarz WTXE1007A Amplifier HP 1001 WTXE1010A Loop Antenna Schwarz beck 1007 WTXE1010A 1006 Broadband Antenna Schwarz beck Chamber A: Above 1GHz WTXE1005A Spectrum Rohde & 1003 Analyzer Schwarz WTXE1001A EMI Test Rohde & 1001 Receiver Schwarz WTXE1065A 1001 Amplifier C&D WTXE1010A Horn Antenna ETS 1005 WTXE1010A 1010 DRG Horn Antenna A.H. SYSTEMS WTXE1003A Pre-amplifier 1001 Schwarzbeck Model CMW500 CMU200 N9020A N9020A 83752A N5182A 1506A FSP30 ESPI 8447F FMZB 1516 VULB9163 FSP30 ESPI PAP-1G18 3117 SAS-574 BBV 9721 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 9 of 52 Serial No. Cal Date Due. Date 148650 2024-02-24 2025-02-23 114403 2024-02-27 2025-02-26 US471401 02 MY543205 48 3610A014 53 MY470702 02 2024-03-19 2024-02-24 2024-02-24 2024-02-24 2025-03-18 2025-02-23 2025-02-23 2025-02-23 PM204 2024-02-29 2025-02-28 836079/03 2024-02-24 2025-02-23 5 101611 2024-03-19 2025-03-18 2805A034 2024-02-24 2025-02-23 75 9773 2024-02-26 2025-02-25 9163-333 2024-02-24 2025-02-23 836079/03 2024-02-24 2025-02-23 5 101611 2024-03-19 2025-03-18 2002 2024-02-27 2025-02-26 00086197 2024-02-26 2025-02-25 571 2024-03-17 2025-03-16 9721-031 2024-02-29 2025-02-28 Reference No.: WTX24X03058022W Chamber B:Below 1GHz WTXE1010A 1006 Trilog Broadband Antenna WTXE1038A 1001 Amplifier WTXE1001A EMI Test 1002 Receiver Chamber C:Below 1GHz WTXE1093A EMI Test 1001 Receiver WTXE1010A 1013-1 Trilog Broadband Antenna WTXE1007A 1002 Amplifier WTXE1010A Loop Antenna 1007 Chamber C: Above 1GHz WTXE1093A EMI Test 1001 Receiver WTXE1103A Horn Antenna 1005 WTXE1103A 1006 Amplifier WTXE1010A DRG Horn 1010 Antenna WTXE1003A Pre-amplifier 1001 Conducted Room 1# WTXE1104A EMI Test 1029 Receiver WTXE1002A Pulse Limiter 1001 WTXE1003A 1001 AC LISN Conducted Room 2# WTXE1001A EMI Test 1004 Receiver WTXE1003A 1003 LISN Schwarz beck Agilent Rohde & Schwarz Rohde & Schwarz Schwarz beck HP Schwarz beck Rohde & Schwarz POAM Tonscend A.H. SYSTEMS Schwarzbeck Rohde & Schwarz Rohde & Schwarz Schwarz beck Rohde & Schwarz Rohde & Schwarz VULB9163(B) 8447D ESPI ESIB 26 VULB 9168 8447F FMZB 1516 ESIB 26 RTF-118A TAP01018050 SAS-574 BBV 9721 ESCI ESH3-Z2 NSLK8126 ESPI ENV 216 9163-635 2024-03-17 2027-03-16 2944A104 2024-02-24 2025-02-23 57 101391 2024-02-24 2025-02-23 100401 2024-02-27 2025-02-26 1194 2021-05-28 2024-05-27 2944A038 2024-02-24 2025-02-23 69 9773 2024-02-26 2025-02-25 100401 2024-02-27 2025-02-26 1820 2023-03-10 2026-03-09 AP22E806 2024-02-27 2025-02-26 235 571 2024-03-17 2025-03-16 9721-031 2024-02-29 2025-02-28 100525 2023-12-12 2024-12-11 100911 2024-02-24 2025-02-23 8126-279 2024-02-24 2025-02-23 101259 2024-02-24 2025-02-23 100097 2024-02-24 2025-02-23 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 10 of 52 Reference No.: WTX24X03058022W Description EMI Test Software (Radiated Emission)* EMI Test Software (Conducted Emission Room 1#)* EMI Test Software (Conducted Emission Room 2#)* Software List Manufacturer Farad Farad SKET Model EZ-EMC EZ-EMC EMC-I *Remark: indicates software version used in the compliance certification testing. Version RA-03A1 RA-03A1 V2.0 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 11 of 52 Reference No.: WTX24X03058022W 2. SUMMARY OF TEST RESULTS FCC Rules §15.203; §15.247(b)(4)(i) §15.205 §15.207(a) §15.209(a) §15.247(a)(1)(i) §15.247(a)(1) (i) §15.247(a)(1) (i) §15.247(a) §15.247(b)(2) §15.247(d) §15.247(a)(1) §15.247(g), (h) N/A: Not applicable. Description of Test Item Antenna Requirement Restricted Band of Operation Conducted Emission Radiated Spurious Emissions Quantity of Hopping Channel Channel Separation Time of Occupancy (Dwell time) 20dB Bandwidth RF Power Output Band Edge (Out of Band Emissions) Frequency Hopping Sequence Frequency Hopping System Result Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 12 of 52 Reference No.: WTX24X03058022W 3. Antenna Requirement 3.1 Standard Applicable According to FCC Part 15.203, an intentional radiator shall be designed to ensure that no antenna other than that furnished by the responsible party shall be used with the device. The use of a permanently attached antenna or of an antenna that uses a unique coupling to the intentional radiator shall be considered sufficient to comply with the provisions of this section. 3.2 Evaluation Information This product has an external antenna fulfill the requirement of this section. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 13 of 52 Reference No.: WTX24X03058022W 4. Frequency Hopping System Requirements 4.1 Standard Applicable According to FCC Part 15.247(a)(1), the system shall hop to channel frequencies that are selected at the system hopping rate from a pseudo randomly ordered list of hopping frequencies. Each frequency must be used equally on the average by each transmitter. The system receivers shall have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shall shift frequencies in synchronization with the transmitted signals. (g) Frequency hopping spread spectrum systems are not required to employ all available hopping channels during each transmission. However, the system, consisting of both the transmitter and the receiver, must be designed to comply with all of the regulations in this section should the transmitter be presented with a continuous data (or information) stream. In addition, a system employing short transmission bursts must comply with the definition of a frequency hopping system and must distribute its transmissions over the minimum number of hopping channels specified in this section. (h) The incorporation of intelligence within a frequency hopping spread spectrum system that permits the system to recognize other users within the spectrum band so that it individually and independently chooses and adapts its hopsets to avoid hopping on occupied channels is permitted. The coordination of frequency hopping systems in any other manner for the express purpose of avoiding the simultaneous occupancy of individual hopping frequencies by multiple transmitters is not permitted. 4.2 Frequency Hopping System This transmitter device is frequency hopping device, and complies with FCC part 15.247 rule. This device uses transmitter radio which operates in 902-928MHz band. It uses a radio technology called frequency-hopping spread spectrum, which chops up the data being sent and transmits chunks of it on up to 52 bands (0.5MHz each; centred from 902.25 to 927.75MHz) in the range 902-928MHz. This device was tested with a system receiver to check that the device maintained hopping synchronization, and the device complied with these requirements for 558074 D01 15.247 Meas Guidance v05r02 and FCC Part 15.247 rule. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 14 of 52 Reference No.: WTX24X03058022W 4.3 EUT Pseudorandom Frequency Hopping Sequence Pseudorandom Frequency Hopping Sequence Table as below: Channel: 34, 40, 3, 16, 27, 7, 31, 22, 1, 29, 15, 39, 47, 50, 38, 52, 10, 44, 17, 8, 49, 13, 2, 48, 14, 25, 51, 6, 37, 12, 30, 46, 18, 42, 23, 19, 36, 43, 11, 28, 5, 45, 24, 9, 32, 20, 41, 26, 4, 33, 21, 35 The system receiver have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shift frequencies in synchronization with the transmitted signals. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 15 of 52 Reference No.: WTX24X03058022W 5. Quantity of Hopping Channels and Channel Separation 5.1 Standard Applicable According to FCC 15.247(a)(i), for frequency hopping systems operating in the 902-928MHz band: if the 20dB bandwidth of the hopping channel is less than 250kHz, the system shall use at least 50 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 20 second period; if the 20dB bandwidth of the hopping channel is 250kHz or greater, the system shall use at least 25 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 10 second period. The maximum allowed 20dB bandwidth of the hopping channel is 500kHz. 5.2 Test Setup Block Diagram 5.3 Test Procedure According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.3, the number of hopping frequencies test method as follows. a) Span: The frequency band of operation. Depending on the number of channels the device supports, it may be necessary to divide the frequency range of operation across multiple spans, to allow the individual channels to be clearly seen. b) RBW: To identify clearly the individual channels, set the RBW to less than 30% of the channel spacing or the 20 dB bandwidth, whichever is smaller. c) VBW RBW. d) Sweep: Auto. e) Detector function: Peak. f) Trace: Max hold. g) Allow the trace to stabilize. According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.2, the EUT shall have its hopping function enabled, the Carrier frequency separation test method as follows: a) Span: Wide enough to capture the peaks of two adjacent channels. b) RBW: Start with the RBW set to approximately 30% of the channel spacing; adjust as necessary to best Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 16 of 52 Reference No.: WTX24X03058022W identify the center of each individual channel. c) Video (or average) bandwidth (VBW) RBW. d) Sweep: Auto. e) Detector function: Peak. f) Trace: Max hold. g) Allow the trace to stabilize. Use the marker-delta function to determine the separation between the peaks of the adjacent channels. 5.4 Summary of Test Results/Plots Please refer to Appendix A Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 17 of 52 Reference No.: WTX24X03058022W 6. Dwell Time of Hopping Channel 6.1 Standard Applicable According to FCC 15.247(a)(i), For frequency hopping systems operating in the 902-928MHz band: if the 20dB bandwidth of the hopping channel is less than 250kHz, the system shall use at least 50 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 20 second period; if the 20dB bandwidth of the hopping channel is 250kHz or greater, the system shall use at least 25 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 10 second period. The maximum allowed 20dB bandwidth of the hopping channel is 500kHz. 6.2 Test Setup Block Diagram 6.3 Test Procedure According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.4, the dwell time of a hopping channel test method as follows. a) Span: Zero span, centered on a hopping channel. b) RBW shall be channel spacing and where possible RBW should be set >> 1 / T, where T is the expected dwell time per channel. c) Sweep: As necessary to capture the entire dwell time per hopping channel; where possible use a video trigger and trigger delay so that the transmitted signal starts a little to the right of the start of the plot. The trigger level might need slight adjustment to prevent triggering when the system hops on an adjacent channel; a second plot might be needed with a longer sweep time to show two successive hops on a channel. d) Detector function: Peak. e) Trace: Max hold. Use the marker-delta function to determine the transmit time per hop. If this value varies with different modes of operation (data rate, modulation format, number of hopping channels, etc.), then repeat this test for each variation in transmit time. Repeat the measurement using a longer sweep time to determine the number of hops over the period specified in the requirements. The sweep time shall be equal to, or less than, the period specified in the requirements. Determine the number of hops over the sweep time and calculate the total number of hops in Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 18 of 52 Reference No.: WTX24X03058022W the period specified in the requirements, using the following equation: (Number of hops in the period specified in the requirements) = (number of hops on spectrum analyzer) × (period specified in the requirements / analyzer sweep time) The average time of occupancy is calculated from the transmit time per hop multiplied by the number of hops in the period specified in the requirements. If the number of hops in a specific time varies with different modes of operation (data rate, modulation format, number of hopping channels, etc.), then repeat this test for each variation. The measured transmit time and time between hops shall be consistent with the values described in the operational description for the EUT. 6.4 Summary of Test Results/Plots Please refer to Appendix B Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 19 of 52 Reference No.: WTX24X03058022W 7. 20dB Bandwidth 7.1 Standard Applicable According to 15.247(a) and 15.215(c), 20dB bandwidth is recommended that the fundamental emission be kept within at least the central 80% of the permitted band in order to minimize the possibility of out-of-band operation. 7.2 Test Setup Block Diagram 7.3 Test Procedure According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 6.9.2, the 20dB bandwidth test method as follows. a) The spectrum analyzer center frequency is set to the nominal EUT channel center frequency. The span range for the EMI receiver or spectrum analyzer shall be between two times and five times the OBW. b) The nominal IF filter bandwidth (3dB RBW) shall be in the range of 1% to 5% of the OBW and video bandwidth (VBW) shall be approximately three times RBW, unless otherwise specified by the applicable requirement. c) Set the reference level of the instrument as required, keeping the signal from exceeding the maximum input mixer level for linear operation. In general, the peak of the spectral envelope shall be more than [10 log (OBW/RBW)] below the reference level. d) Steps a) through c) might require iteration to adjust within the specified tolerances. e) The dynamic range of the instrument at the selected RBW shall be more than 10 dB below the target "-xx dB down" requirement; that is, if the requirement calls for measuring the -20dB OBW, the instrument noise floor at the selected RBW shall be at least 30dB below the reference value. f) Set detection mode to peak and trace mode to max hold. g) Determine the reference value: Set the EUT to transmit an unmodulated carrier or modulated signal, as applicable. Allow the trace to stabilize. Set the spectrum analyzer marker to the highest level of the displayed trace (this is the reference value). h) Determine the "-xx dB down amplitude" using [(reference value) - xx]. Alternatively, this calculation may be made by using the marker-delta function of the instrument. i) If the reference value is determined by an unmodulated carrier, then turn the EUT modulation ON, and either clear the existing trace or start a new trace on the spectrum analyzer and allow the new trace to Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 20 of 52 Reference No.: WTX24X03058022W stabilize. Otherwise, the trace from step g) shall be used for step j). j) Place two markers, one at the lowest frequency and the other at the highest frequency of the envelope of the spectral display, such that each marker is at or slightly below the "-xx dB down amplitude" determined in step h). If a marker is below this "-xx dB down amplitude" value, then it shall be as close as possible to this value. The occupied bandwidth is the frequency difference between the two markers. Alternatively, set a marker at the lowest frequency of the envelope of the spectral display, such that the marker is at or slightly below the "-xx dB down amplitude" determined in step h). Reset the marker-delta function and move the marker to the other side of the emission until the delta marker amplitude is at the same level as the reference marker amplitude. The marker-delta frequency reading at this point is the specified emission bandwidth. k) The occupied bandwidth shall be reported by providing plot(s) of the measuring instrument display; the plot axes and the scale units per division shall be clearly labeled. Tabular data may be reported in addition to the plot(s). 7.4 Summary of Test Results/Plots Please refer to Appendix C Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 21 of 52 Reference No.: WTX24X03058022W 8. RF Output Power 8.1 Standard Applicable According to 15.247(b)(2), for frequency hopping systems operating in the 902-928MHz band: 1 watt for systems employing at least 50 hopping channels; and, 0.25 watts for systems employing less than 50 hopping channels, but at least 25 hopping channels, as permitted under paragraph (a)(1)(i) of this section. 8.2 Test Setup Block Diagram 8.3 Test Procedure According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.5, the output power test method as follows. Remove the antenna from the EUT and then connect a low loss RF cable from the antenna port to the spectrum analyzer. This is an RF-conducted test to evaluate maximum peak output power. Use a direct connection between the antenna port of the unlicensed wireless device and the spectrum analyzer, through suitable attenuation. The hopping shall be disabled for this test: a) Use the following spectrum analyzer settings: 1) Span: Approximately five times the 20dB bandwidth, centered on a hopping channel. 2) RBW > 20dB bandwidth of the emission being measured. 3) VBW RBW. 4) Sweep: Auto. 5) Detector function: Peak. 6) Trace: Max hold. b) Allow trace to stabilize. c) Use the marker-to-peak function to set the marker to the peak of the emission. d) The indicated level is the peak output power, after any corrections for external attenuators and cables. e) A plot of the test results and setup description shall be included in the test report. 8.4 Summary of Test Results/Plots Please refer to Appendix D Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 22 of 52 Reference No.: WTX24X03058022W 9. Field Strength of Spurious Emissions 9.1 Standard Applicable According to §15.247(d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a). The emission limit in this paragraph is based on measurement instrumentation employing an average detector. The provisions in §15.35 for limiting peak emissions apply. Spurious Radiated Emissions measurements starting below or at the lowest crystal frequency. 9.2 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.205 15.247(a) and FCC Part 15.209 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. The test setup for emission measurement below 30MHz. Semi-anechoic 3m Chamber Turn Table From 0to 360 3m EUT 0.8m Turn Table PC System Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Spectrum Analyzer Page 23 of 52 AMP Combining Network Reference No.: WTX24X03058022W The test setup for emission measurement from 30MHz to 1GHz. Semi-anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360° 3m EUT 0.8m Turn Table PC System Spectrum Analyzer The test setup for emission measurement above 1GHz. AMP Combining Network Anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360° EUT 3m 1.5m Turn Table Absorbers PC System Spectrum Analyzer Frequency :9kHz-30MHz RBW=10KHz, VBW =30KHz Sweep time= Auto Trace = max hold Frequency :30MHz-1GHz RBW=120KHz, VBW=300KHz Sweep time= Auto Trace = max hold Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 24 of 52 AMP Combining Network Frequency :Above 1GHz RBW=1MHz, VBW=3MHz(Peak), 10Hz(AV) Sweep time= Auto Trace = max hold Reference No.: WTX24X03058022W Detector function = peak Detector function = peak, QP Detector function = peak, AV 9.3 Corrected Amplitude & Margin Calculation The Corrected Amplitude is calculated by adding the Antenna Factor and the Cable Factor, and subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows: Corr. Ampl. = Indicated Reading + Correct Correct = Ant. Factor + Cable Loss Ampl. Gain The "Margin" column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of -6dBV means the emission is 6dBV below the maximum limit. The equation for margin calculation is as follows: Margin = Corr. Ampl. FCC Part 15 Limit 9.4 Summary of Test Results/Plots Note: this EUT was tested in 3 orthogonal positions and the worst case position data was reported. All test modes (different data rate and different modulation) are performed, but only the worst case (GFSK) is recorded in this report. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 25 of 52 Reference No.: WTX24X03058022W Spurious Emissions Below 1GHz Test Channel Low Channel Polarity: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 44.7793 35.55 -8.47 27.08 40.00 -12.92 - - QP 2 67.7856 40.85 -10.36 30.49 40.00 -9.51 - - QP 3 214.6063 41.76 -12.13 29.63 43.50 -13.87 - - QP 4 250.4859 48.01 -10.18 37.83 46.00 -8.17 - - QP 5 363.5231 34.50 -6.76 27.74 46.00 -18.26 - - QP 6 669.9523 41.54 -1.27 40.27 46.00 -5.73 - - QP Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 26 of 52 Reference No.: WTX24X03058022W Test Channel Low Channel Polarity: Vertical No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 45.7333 43.01 -8.41 34.60 40.00 -5.40 - - QP 2 56.4662 43.71 -8.72 34.99 40.00 -5.01 - - QP 3 68.7450 43.68 -10.54 33.14 40.00 -6.86 - - QP 4 343.6506 42.41 -7.22 35.19 46.00 -10.81 - - QP 5 628.8936 43.99 -1.38 42.61 46.00 -3.39 - - QP 6 655.9766 44.21 -1.30 42.91 46.00 -3.09 - - QP Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 27 of 52 Reference No.: WTX24X03058022W Test Channel Middle Channel Polarity: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 35.7617 35.21 -9.39 25.82 40.00 -14.18 - - QP 2 65.4452 42.25 -9.93 32.32 40.00 -7.68 - - QP 3 156.4259 32.39 -8.60 23.79 43.50 -19.71 - - QP 4 250.4859 48.66 -10.18 38.48 46.00 -7.52 - - QP 5 628.8936 38.60 -1.38 37.22 46.00 -8.78 - - QP 6 665.2610 40.65 -1.27 39.38 46.00 -6.62 - - QP Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 28 of 52 Reference No.: WTX24X03058022W Test Channel Middle Channel Polarity: Vertical No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 58.0759 43.52 -8.82 34.70 40.00 -5.30 - - QP 2 101.8932 40.78 -12.32 28.46 43.50 -15.04 - - QP 3 222.2807 41.42 -11.97 29.45 46.00 -16.55 - - QP 4 338.8546 40.67 -7.31 33.36 46.00 -12.64 - - QP 5 502.2473 42.45 -3.87 38.58 46.00 -7.42 - - QP 6 628.8936 44.56 -1.38 43.18 46.00 -2.82 - - QP Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 29 of 52 Reference No.: WTX24X03058022W Test Channel High Channel Polarity: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 35.7617 35.43 -9.39 26.04 40.00 -13.96 - - QP 2 65.9067 40.53 -10.02 30.51 40.00 -9.49 - - QP 3 207.1968 43.23 -12.13 31.10 43.50 -12.40 - - QP 4 250.4859 47.49 -10.18 37.31 46.00 -8.69 - - QP 5 628.8936 38.22 -1.38 36.84 46.00 -9.16 - - QP 6 669.9523 40.43 -1.27 39.16 46.00 -6.84 - - QP Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 30 of 52 Reference No.: WTX24X03058022W Test Channel High Channel Polarity: Vertical No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm) 1 44.7793 43.44 -8.47 34.97 40.00 -5.03 - - QP 2 66.3715 45.07 -10.11 34.96 40.00 -5.04 - - QP 3 202.8745 43.01 -12.04 30.97 43.50 -12.53 - - QP 4 346.0740 42.01 -7.18 34.83 46.00 -11.17 - - QP 5 502.2473 43.18 -3.87 39.31 46.00 -6.69 - - QP 6 628.8936 43.94 -1.38 42.56 46.00 -3.44 - - QP Remark: `-'Means' the test Degree and Height are not recorded by the test software and only show the worst case in the test report. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 31 of 52 Reference No.: WTX24X03058022W Spurious Emissions Above 1GHz Frequency Reading (MHz) (dBuV/m) 2706.75 2706.75 3609.00 3609.00 2706.75 2706.75 3609.00 3609.00 69.60 66.58 68.03 65.11 69.76 65.02 68.54 65.02 2744.25 2744.25 3659.00 3659.00 2744.25 2744.25 3659.00 3659.00 73.81 70.95 66.62 63.01 71.67 68.01 64.87 61.22 2783.25 2783.25 3711.00 3711.00 2783.25 2783.25 3711.00 3711.00 73.41 70.25 66.45 63.02 73.3 70.24 62.25 60.02 Correct dB -18.26 -18.26 -14.32 -14.32 -18.26 -18.26 -14.32 -14.32 -18.16 -18.16 -14.37 -14.37 -18.16 -18.16 -14.37 -14.37 -18.07 -18.07 -14.44 -14.44 -18.07 -18.07 -14.44 -14.44 Result Limit (dBuV/m) (dBuV/m) Low Channel-902.25MHz 51.34 74.00 48.32 54.00 53.71 74.00 50.79 54.00 51.50 74.00 46.76 54.00 54.22 74.00 50.70 54.00 Middle Channel-914.75MHz 55.65 74.00 52.79 54.00 52.25 74.00 48.64 54.00 53.51 74.00 49.85 54.00 50.50 74.00 46.85 54.00 High Channel-927.75MHz 55.34 74.00 52.18 54.00 52.01 74.00 48.58 54.00 55.23 74.00 52.17 54.00 47.81 74.00 45.58 54.00 Margin (dB) -22.66 -5.68 -20.29 -3.21 -22.50 -7.24 -19.78 -3.30 -18.35 -1.21 -21.75 -5.36 -20.49 -4.15 -23.50 -7.15 -18.66 -1.82 -21.99 -5.42 -18.77 -1.83 -26.19 -8.42 Polar H/V H H H H V V V V H H H H V V V V H H H H V V V V Detector PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV Note: Testing is carried out with frequency rang 9kHz to the tenth harmonics, other than listed in the table above are attenuated more than 20dB below the permissible limits or the field strength is too small to be measured. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 32 of 52 Reference No.: WTX24X03058022W 10. Out of Band Emissions 10.1 Standard Applicable According to §15.247 (d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a). 10.2 Test Procedure According to ANSI C63.10-2013 section 7.8.6, the Band-edge measurements for RF conducted emissions test method as follows. a) Connect the EMI receiver or spectrum analyzer to the EUT using an appropriate RF cable connected to the EUT output. Configure the spectrum analyzer settings as described in step e) (be sure to enter all losses between the unlicensed wireless device output and the spectrum analyzer). b) Set the EUT to the lowest frequency channel (for the hopping on test, the hopping sequence shall include the lowest frequency channel). c) Set the EUT to operate at maximum output power and 100% duty cycle, or equivalent "normal mode of operation" as specified in 6.10.3. d) If using the radiated method, then use the applicable procedure(s) of 6.4, 6.5, or 6.6, and orient the EUT and measurement antenna positions to produce the highest emission level. e) Perform the test as follows: 1) Span: Wide enough to capture the peak level of the emission operating on the channel closest to the band edge, as well as any modulation products that fall outside of the authorized band of operation. 2) Reference level: As required to keep the signal from exceeding the maximum instrument input mixer level for linear operation. In general, the peak of the spectral envelope shall be more than [10 log (OBW/RBW)] below the reference level. Specific guidance is given in 4.1.5.2. 3) Attenuation: Auto (at least 10 dB preferred). 4) Sweep time: Coupled. 5) Resolution bandwidth: 100kHz. 6) Video bandwidth: 300kHz. 7) Detector: Peak. 8) Trace: Max hold. f) Allow the trace to stabilize. For the test with the hopping function turned ON, this can take several minutes Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 33 of 52 Reference No.: WTX24X03058022W to achieve a reasonable probability of intercepting any emissions due to oscillator overshoot. g) Set the marker on the emission at the band edge, or on the highest modulation product outside of the band, if this level is greater than that at the band edge. Enable the marker-delta function, and then use the marker-to-peak function to move the marker to the peak of the in-band emission. h) Repeat step c) through step e) for every applicable modulation. i) Set the EUT to the highest frequency channel (for the hopping on test, the hopping sequence shall include the highest frequency channel) and repeat step c) through step d). j) The band-edge measurement shall be reported by providing plot(s) of the measuring instrument display; the plot axes and the scale units per division shall be clearly labeled. Tabular data may be reported in addition to the plot(s). Restricted-band band-edge test method please refers to ANSI C63.10-2013 section 6.10.5. The emission must comply with the 15.209 limit for fall in the restricted bands listed in section 15.205. Note that the method of measurement KDB publication number: 913591 may be used for the radiated band-edge measurements. According to ANSI C63.10-2013 section 7.8.8, Conducted spurious emissions shall be measured for the transmit frequency, per 5.5 and 5.6, and at the maximum transmit powers. Connect the primary antenna port through an attenuator to the spectrum analyzer input; in the results, account for all losses between the unlicensed wireless device output and the spectrum analyzer. The instrument shall span 30MHz to 10 times the operating frequency in GHz, with a resolution bandwidth of 100kHz, video bandwidth of 300kHz, and a coupled sweep time with a peak detector. The band 30MHz to the highest frequency may be split into smaller spans, as long as the entire spectrum is covered. 10.3 Summary of Test Results/Plots Please refer to Appendix E Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 34 of 52 Reference No.: WTX24X03058022W 11. Conducted Emissions 11.1 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.207 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. 11.2 Basic Test Setup Block Diagram 0.4m 0.8m EUT LISN Receiver PC System 0.8m :50 Terminator 11.3 Test Receiver Setup During the conducted emission test, the test receiver was set with the following configurations: Start Frequency............................................................................. 150kHz Stop Frequency............................................................................. 30MHz Sweep Speed.................................................................................Auto IF Bandwidth.................................................................................. 10kHz Quasi-Peak Adapter Bandwidth.................................................. 9kHz Quasi-Peak Adapter Mode...........................................................Normal 11.4 Summary of Test Results/Plots Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 35 of 52 Reference No.: WTX24X03058022W Test Mode Communication AC120V 60Hz Polarity: Neutral No. Frequency Reading Factor dBuV dB Level dBuV 1* 154.000kHz 43.0 9.7 52.7 2* 494.000kHz 37.8 9.6 47.4 3* 5.650MHz 24.2 9.8 34.0 4* 238.000kHz 24.5 9.8 34.3 5* 486.000kHz 26.4 9.7 36.1 6* 19.582MHz 22.6 9.8 32.4 Limit dBuV 65.8 56.1 60.0 52.2 46.2 50.0 Delta dB -13.1 -8.7 -26.0 -17.8 -10.1 -17.6 Detector PK PK PK AV AV AV Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 36 of 52 Reference No.: WTX24X03058022W Test Mode Communication AC120V 60Hz Polarity: Line No. Frequency Reading Factor dBuV dB Level dBuV 1* 158.000kHz 42.7 9.9 52.6 2* 498.000kHz 37.5 9.7 47.2 3* 20.322MHz 31.1 10.0 41.1 4* 202.000kHz 26.1 9.6 35.7 5* 510.000kHz 27.0 9.7 36.7 6* 20.322MHz 25.9 10.0 35.9 Limit dBuV 65.6 56.0 60.0 53.5 46.0 50.0 Delta dB -12.9 -8.9 -18.9 -17.8 -9.3 -14.1 Detector PK PK PK AV AV AV Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 37 of 52 Reference No.: WTX24X03058022W APPENDIX SUMMARY Project No. Start date Temperature RF specifications WTX24X03058022W 2024/4/2 23.1 900MHz-FHSS Test Engineer Finish date Humidity BAIdi Zhong 2024/4/3 56% APPENDIX A B C D E Description of Test Item Hopping Channels and Channel Separation Dwell Time of Hopping Channel 20dB Bandwidth & 99% Bandwidth RF Output Power Conducted Out of Band Emissions Result Compliant Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 38 of 52 Reference No.: WTX24X03058022W APPENDIX A Hopping Channels Number Mode FHSS Test Result 52 Limit 50 Result Pass FHSS Ref 30.5 dBm 30 Of1fset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB * RBW 100 kHz * VBW 300 kHz SWT 5 ms Delta 1 [T1 ] 0.52 dB 25.560000000 MHz Marker 1 [T1 ] 1 24.99 dBm 902.220000000 MHz A LVL 75 3DB Start 900 MHz 3 MHz/ Stop 930 MHz Date: 2.APR.2024 18:32:24 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 39 of 52 Reference No.: WTX24X03058022W Channel Separation Mode FHSS Channel Low Middle High Carrier Frequencies Separation (kHz) 500 500 500 Result Pass Pass Pass Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 40 of 52 Reference No.: WTX24X03058022W Low Middle High Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Delta 1 [T1 ] -0.04 dB 500.000000000 kHz 1 Mar1ker 1 [T1 ] 25.03 dBm 902.262000000 MHz A LVL 75 3DB Center 902.25 MHz 200 kHz/ Span 2 MHz Date: 2.APR.2024 18:34:21 Ref 30.5 dBm 30 Offset 1 dB 1 * Att 40 dB 20 1 PK MAXH 10 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Delta 1 [T1 ] -0.08 dB 500.000000000 kHz Marker 1 [T1 ] 1 23.55 dBm 914.262000000 MHz A LVL 0 -10 -20 -30 75 3DB -40 -50 -60 Center 914.75 MHz 200 kHz/ Span 2 MHz Date: 2.APR.2024 19:48:51 Ref 30.5 dBm 30 Offset 1 dB 1 * Att 40 dB 20 1 PK MAXH 10 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms 1 Delta 1 [T1 ] -0.01 dB 500.000000000 kHz Marker 1 [T1 ] 25.47 dBm 927.262000000 MHz A LVL 0 -10 -20 -30 75 3DB -40 -50 -60 Center 927.75 MHz 200 kHz/ Span 2 MHz Date: 2.APR.2024 18:35:47 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 41 of 52 Reference No.: WTX24X03058022W APPENDIX B Test Channel Low Middle High Test period (s) 20 20 20 Number of Bursts per Hopping Period 3 3 4 Burst Duration (ms) 93.6 93.9 93.9 Dwell time (ms) 280.8 281.7 375.6 Limit (ms) 400 400 400 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 42 of 52 Reference No.: WTX24X03058022W Low Middle Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 TRG 16.4 dBm 0 RBW 100 kHz * VBW 300 kHz SWT 150 ms Delta 1 [T1 ] 1.09 dB 93.600000 ms Marker 1 [T1 ] -41.32 dBm -400.000000 µs A TRG LVL -10 -20 -30 1 -40 75 3DB 1 -50 -60 Center 902.25 MHz 15 ms/ Date: 2.APR.2024 18:39:02 Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB RBW 100 kHz * VBW 300 kHz SWT 20 s Center 902.25 MHz 2 s/ A SGL LVL 75 3DB Date: 2.APR.2024 18:39:35 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 TRG 16.4 dBm 0 RBW 100 kHz * VBW 300 kHz SWT 150 ms Delta 1 [T1 ] -0.42 dB 93.900000 ms Marker 1 [T1 ] -39.67 dBm -700.000000 µs A TRG LVL -10 -20 -30 1 -40 75 3DB 1 -50 -60 Center 914.75 MHz 15 ms/ Date: 2.APR.2024 18:38:07 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 43 of 52 Reference No.: WTX24X03058022W Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB RBW 100 kHz * VBW 300 kHz SWT 20 s Center 914.75 MHz 2 s/ A SGL LVL 75 3DB Date: 2.APR.2024 18:40:10 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 TRG 16.4 dBm 0 RBW 100 kHz * VBW 300 kHz SWT 150 ms Delta 1 [T1 ] 0.64 dB 93.900000 ms Marker 1 [T1 ] -41.17 dBm -700.000000 µs A TRG LVL -10 -20 -30 1 -40 75 3DB 1 -50 -60 Center 927.75 MHz 15 ms/ High Date: 2.APR.2024 18:38:35 Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB RBW 100 kHz * VBW 300 kHz SWT 20 s Center 927.75 MHz 2 s/ A SGL LVL 75 3DB Date: 2.APR.2024 18:41:54 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 44 of 52 Reference No.: WTX24X03058022W APPENDIX C 20 dB Bandwidth Test Mode FHSS Test Channel MHz Low Middle High 20 dB Bandwidth MHz 0.169 0.168 0.165 Result Pass Pass Pass Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 45 of 52 Reference No.: WTX24X03058022W Low Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 D1 4.74 dBm 1 0 * RBW 3 kHz * VBW 10 kHz SWT 60 ms Delta 1 [T1 ] 1.18 dB 169.000000000 kHz 2 Marker 1 [T1 ] 1.16 dBm 902.177000000 MHz A Marker 2 [T1 ] 24.76 dBm 902.262000000 MHz LVL 1 -10 -20 -30 75 3DB -40 -50 -60 Center 902.25 MHz 50 kHz/ Span 500 kHz Middle Date: 2.APR.2024 18:53:49 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 D1 4.91 dBm 1 0 * RBW 3 kHz * VBW 10 kHz SWT 60 ms Delta 1 [T1 ] 1.93 dB 168.000000000 kHz 2 Marker 1 [T1 ] 0.26 dBm 914.677000000 MHz A Marker 2 [T1 ] 24.91 dBm 914.762000000 MHz LVL 1 -10 -20 -30 75 3DB -40 -50 -60 Center 914.75 MHz 50 kHz/ Span 500 kHz High Date: 2.APR.2024 19:00:02 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 1 D1 5.14 dBm 0 * RBW 3 kHz * VBW 10 kHz SWT 60 ms Delta 1 [T1 ] 0.57 dB 165.000000000 kHz 2 Marker 1 [T1 ] 4.69 dBm 927.678000000 MHz A Marker 2 [T1 ] 25.14 dBm 1 927.763000000 MHz LVL -10 -20 -30 75 3DB -40 -50 -60 Center 927.75 MHz 50 kHz/ Span 500 kHz Date: 2.APR.2024 19:04:40 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 46 of 52 Reference No.: WTX24X03058022W APPENDIX D RF Output Power Modulation type FHSS Channel Low Middle High Output power (dBm) 24.72 24.78 25.10 Limit (dBm) 27.94 Result Pass Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 47 of 52 Reference No.: WTX24X03058022W Low Middle High Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB * RBW 300 kHz * VBW 1 MHz SWT 2.5 ms Marker 1 [T1 ] 24.72 dBm 902.264000000 MHz 1 A LVL 75 3DB Center 902.25 MHz 100 kHz/ Span 1 MHz Date: 2.APR.2024 18:54:01 Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB * RBW 300 kHz * VBW 1 MHz SWT 2.5 ms Marker 1 [T1 ] 24.78 dBm 914.766000000 MHz 1 A LVL 75 3DB Center 914.75 MHz 100 kHz/ Span 1 MHz Date: 2.APR.2024 19:00:14 Ref 30.5 dBm 30 Offset 1 dB 20 1 PK MAXH 10 0 -10 -20 -30 -40 -50 -60 * Att 40 dB * RBW 300 kHz * VBW 1 MHz SWT 2.5 ms Marker 1 [T1 ] 25.10 dBm 927.772000000 MHz 1 A LVL 75 3DB Center 927.75 MHz 100 kHz/ Span 1 MHz Date: 2.APR.2024 19:03:16 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 48 of 52 Reference No.: WTX24X03058022W APPENDIX E Conducted Out of Band Emissions Low Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 0 D1 4.64 dBm * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -1.23 dBm 902.000000000 MHz Marker 11 [T1 ] 24.67 dBm 902.260500000 MHz A LVL 2 -10 -20 -30 75 3DB -40 -50 -60 Start 900 MHz 275 kHz/ Stop 902.75 MHz Date: 2.APR.2024 18:55:15 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 0 D1 4.64 dBm * RBW 100 kHz * VBW 300 kHz SWT 1 s Marker 1 [T1 ] -32.30 dBm 89.820000000 MHz A LVL -10 -20 1-30 75 3DB -40 -50 -60 Start 30 MHz 997 MHz/ Stop 10 GHz Date: 2.APR.2024 18:55:43 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 49 of 52 Reference No.: WTX24X03058022W Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 0 D1 4.78 dBm * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -13.73 dBm 902.000000000 MHz Marker 1 [1T1 ] 24.78 dBm 904.260000000 MHz A LVL -10 2 -20 -30 75 3DB -40 -50 -60 Start 900 MHz 500 kHz/ Stop 905 MHz Date: 2.APR.2024 18:47:57 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 0 D1 4.77 dBm * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 1 [T1 ] 24.77 dBm 914.762000000 MHz 1 A LVL -10 -20 -30 75 3DB -40 -50 -60 Center 914.75 MHz 200 kHz/ Span 2 MHz Middle Date: 2.APR.2024 19:07:06 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 0 D1 4.77 dBm * RBW 100 kHz * VBW 300 kHz SWT 1 s Marker 1 [T1 ] -30.67 dBm 89.820000000 MHz A LVL -10 -20 1 -30 75 3DB -40 -50 -60 Start 30 MHz 997 MHz/ Stop 10 GHz Date: 2.APR.2024 19:07:33 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 50 of 52 Reference No.: WTX24X03058022W Ref 30.5 dBm 30 Offset 1 dB 1 * Att 40 dB 20 1 PK MAXH 10 0 D1 5.1 dBm 2 -10 -20 -30 * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -9.77 dBm 928.000000000 MHz Marker 1 [T1 ] 25.10 dBm 927.762000000 MHz A LVL 75 3DB -40 -50 -60 Start 927 MHz 300 kHz/ Stop 930 MHz High Date: 2.APR.2024 19:02:28 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 20 1 PK MAXH 10 0 D1 5.1 dBm * RBW 100 kHz * VBW 300 kHz SWT 1 s Marker 1 [T1 ] -22.53 dBm 49.940000000 MHz A LVL -10 1-20 -30 75 3DB -40 -50 -60 Start 30 MHz 997 MHz/ Stop 10 GHz Date: 2.APR.2024 19:02:43 Ref 30.5 dBm 30 Offset 1 dB * Att 40 dB 1 20 1 PK MAXH 10 0 D1 5.29 dBm * RBW 100 kHz * VBW 300 kHz SWT 2.5 ms Marker 2 [T1 ] -32.49 dBm 928.000000000 MHz Marker 1 [T1 ] 25.29 dBm 927.260000000 MHz A LVL -10 -20 -30 75 3DB 2 -40 -50 -60 Start 925 MHz 500 kHz/ Stop 930 MHz Date: 2.APR.2024 18:50:49 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 51 of 52 Reference No.: WTX24X03058022W APPENDIX PHOTOGRAPHS Please refer to "ANNEX" ***** END OF REPORT ***** Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 52 of 52
Related FCC IDs:
- 2AKJ4-IDUHFLITE - Controlid Industria e Comercio de Hardware e Servicos De Tecnologia Ltda iDUHF [-IDUHFLITE] WPS 文字