ETSI 301 489-17 V1

Sem

Test Report

Controlid Industria e Comercio de Hardware e Servicos De Tecnologia Ltda IDUHFLITE iDUHF 2AKJ4-IDUHFLITE 2AKJ4IDUHFLITE iduhflite

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TEST REPORT

Reference No....................... : FCC ID.................................... : Applicant............................... : Address................................. : Manufacturer........................ : Address................................. : Product Name...................... : Model No............................... : Standards.............................. : Date of Receipt sample..... : Date of Test........................... : Date of Issue........................ : Test Report Form No.......... : Test Result............................ :

WTX24X03058022W 2AKJ4-IDUHFLITE Controlid Industria e Comercio de Hardware e Servicos De Tecnologia Ltda Rua Hungria 888, 8th floor, São Paulo 01455-000, Brazil The same as Applicant The same as Applicant iDUHF iDUHF LITE FCC Part 15.247 2024-03-20 2024-03-20 to 2024-04-18 2024-04-18 WTX_Part 15_247W Pass

Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver.
Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected]

Tested by:

Approved by:

Mike Shi

Jason Su

Waltek Testing Group (Shenzhen) Co., Ltd.

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Reference No.: WTX24X03058022W

TABLE OF CONTENTS
1. GENERAL INFORMATION .....................................................................................................................................5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ........................................................................5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY .......................................................................................................................................................6 1.5 EUT SETUP AND TEST MODE ..............................................................................................................................7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 8 1.7 TEST EQUIPMENT LIST AND DETAILS .................................................................................................................. 9
2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12
3. ANTENNA REQUIREMENT ................................................................................................................................. 13 3.1 STANDARD APPLICABLE ......................................................................................................................................13 3.2 EVALUATION INFORMATION ................................................................................................................................ 13
4. FREQUENCY HOPPING SYSTEM REQUIREMENTS .................................................................................... 14
5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ....................................................16 5.1 STANDARD APPLICABLE ......................................................................................................................................16 5.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................16 5.3 TEST PROCEDURE .............................................................................................................................................. 16 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 17
6. DWELL TIME OF HOPPING CHANNEL ............................................................................................................18 6.1 STANDARD APPLICABLE ......................................................................................................................................18 6.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................18 6.3 TEST PROCEDURE .............................................................................................................................................. 18 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 19
7. 20DB BANDWIDTH ................................................................................................................................................20 7.1 STANDARD APPLICABLE ......................................................................................................................................20 7.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................20 7.3 TEST PROCEDURE .............................................................................................................................................. 20 7.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 21
8. RF OUTPUT POWER ............................................................................................................................................ 22 8.1 STANDARD APPLICABLE ......................................................................................................................................22 8.2 TEST SETUP BLOCK DIAGRAM ...........................................................................................................................22 8.3 TEST PROCEDURE .............................................................................................................................................. 22 8.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 22
9. FIELD STRENGTH OF SPURIOUS EMISSIONS ............................................................................................. 23 9.1 STANDARD APPLICABLE ......................................................................................................................................23 9.2 TEST PROCEDURE .............................................................................................................................................. 23 9.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ..........................................................................................25 9.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................ 25
10. OUT OF BAND EMISSIONS .............................................................................................................................. 33 10.1 STANDARD APPLICABLE ................................................................................................................................... 33 10.2 TEST PROCEDURE ............................................................................................................................................ 33 10.3 SUMMARY OF TEST RESULTS/PLOTS .............................................................................................................. 34
11. CONDUCTED EMISSIONS ................................................................................................................................ 35 11.1 TEST PROCEDURE ............................................................................................................................................ 35 11.2 BASIC TEST SETUP BLOCK DIAGRAM ............................................................................................................. 35 11.3 TEST RECEIVER SETUP ....................................................................................................................................35 11.4 SUMMARY OF TEST RESULTS/PLOTS .............................................................................................................. 35
APPENDIX SUMMARY ..............................................................................................................................................38
APPENDIX A ................................................................................................................................................................39

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Reference No.: WTX24X03058022W
APPENDIX B ................................................................................................................................................................42 APPENDIX C ................................................................................................................................................................45 APPENDIX D ................................................................................................................................................................47 APPENDIX E ................................................................................................................................................................49 APPENDIX PHOTOGRAPHS ................................................................................................................................... 52

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Reference No.: WTX24X03058022W

Report version

Version No. Rev.00 /

Date of issue 2024-04-18
/

Description Original /

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Reference No.: WTX24X03058022W
1. GENERAL INFORMATION
1.1 Product Description for Equipment Under Test (EUT)

General Description of EUT

Product Name:

iDUHF

Trade Name:

/

Model No.:

iDUHF LITE

Adding Model(s):

/

Rated Voltage:

DC12V

Battery Capacity:

/

Power Adapter:

/

Note: The test data is gathered from a production sample, provided by the manufacturer.

Technical Characteristics of EUT

Frequency Range:

902.25-927.75MHz

RF Output Power:

25.10dBm (Conducted)

Modulation:

FHSS

Quantity of Channels:

52

Channel Separation:

500kHz

Type of Antenna:

External Antenna

Antenna Gain:

8.06dBi

Note The Antenna Gain is provided by the customer and can affect the validity of results.

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Reference No.: WTX24X03058022W
1.2 Test Standards
The tests were performed according to following standards:
FCC Rules Part 15.247: Frequency Hopping, Direct Spread Spectrum and Hybrid Systems that are in operation within the bands of 902-928MHz, 2400-2483.5MHz, and 5725-5850MHz. 558074 D01 15.247 Meas Guidance v05r02: Guidance for Compliance Measurements on Digital Transmission System, Frequency Hopping Spread Spectrum System, and Hybrid System Devices Operating under section 15.247 of the FCC rules. ANSI C63.10-2013: American National Standard for Testing Unlicensed Wireless Devices.
Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which result in lowering the emission, should be checked to ensure compliance has been maintained.
1.3 Test Methodology
All measurements contained in this report were conducted with ANSI C63.10-2013, the equipment under test (EUT) was configured to measure its highest possible emission level. The test modes were adapted accordingly in reference to the Operating Instructions.
1.4 Test Facility
Address of the test laboratory Laboratory: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China
FCC ­ Registration No.: 125990 Waltek Testing Group (Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the FCC (Federal Communications Commission). The acceptance letter from the FCC is mai ntained in our files. The Designation Number is CN5010, and Test Firm Registration Number is 125990.
Industry Canada (IC) Registration No.: 11464A The 3m Semi-anechoic chamber of Waltek Testing Group (Shenzhen) Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.: 11464A and the CAB identifier is CN0057.

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Reference No.: WTX24X03058022W
1.5 EUT Setup and Test Mode
The testing channels and the power were set through Control iD's firmware. All testing was performed under maximum output power condition, and to measure its highest possible emissions level, more detailed description as follows:

Test Mode List Test Mode TM1 TM2 TM3 TM4

Description Low Channel Middle Channel High Channel
Hopping

Test Conditions Temperature:
Relative Humidity: ATM Pressure:

EUT Cable List and Details Cable Description /

Length (m) /

Special Cable List and Details Cable Description /

Length (m) /

Remark 902.25MHz 914.75MHz 927.75MHz 902.25-927.75MHz
22~25 C 45~55 %. 1019 mbar

Shielded/Unshielded /

With / Without Ferrite /

Shielded/Unshielded /

With / Without Ferrite /

Auxiliary Equipment List and Details

Description

Manufacturer

Adapter

/

Computer

Lenovo

Model PA-30360W-ZMX
L13 Yoga

Serial Number / /

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1.6 Measurement Uncertainty
Measurement uncertainty Parameter
RF Output Power Occupied Bandwidth Conducted Spurious Emission Conducted Emissions
Transmitter Spurious Emissions

Conditions Conducted Conducted Conducted Conducted
Radiated

Uncertainty ±0.42dB ±1.5% ±2.17dB
9-150kHz ±3.74dB 0.15-30MHz ±3.34dB 30-200MHz ±4.52dB
0.2-1GHz ±5.56dB 1-6GHz ±3.84dB 6-18GHz ±3.92dB

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1.7 Test Equipment List and Details

Fixed asset Number

Description

Manufacturer

WTXE1041A Communication Rohde &

1001

Tester

Schwarz

WTXE1022A 1002

GSM Tester

Rohde & Schwarz

WTXE1005A 1005

Spectrum Analyzer

Agilent

WTXE1084A 1001

Spectrum Analyzer

Agilent

WTXE1044A 1001

Signal Generator

Agilent

WTXE1045A Vector Signal

1001

Generator

Agilent

WTXE1018A Power Divider
1001

Weinschel

Chamber A: Below 1GHz

WTXE1005A Spectrum

Rohde &

1003

Analyzer

Schwarz

WTXE1001A EMI Test

Rohde &

1001

Receiver

Schwarz

WTXE1007A

Amplifier

HP

1001

WTXE1010A Loop Antenna Schwarz beck
1007

WTXE1010A 1006

Broadband Antenna

Schwarz beck

Chamber A: Above 1GHz

WTXE1005A Spectrum

Rohde &

1003

Analyzer

Schwarz

WTXE1001A EMI Test

Rohde &

1001

Receiver

Schwarz

WTXE1065A 1001

Amplifier

C&D

WTXE1010A

Horn Antenna

ETS

1005

WTXE1010A 1010

DRG Horn Antenna

A.H. SYSTEMS

WTXE1003A Pre-amplifier
1001

Schwarzbeck

Model CMW500 CMU200 N9020A N9020A 83752A N5182A
1506A
FSP30 ESPI 8447F FMZB 1516 VULB9163
FSP30 ESPI PAP-1G18 3117 SAS-574 BBV 9721

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Page 9 of 52

Serial No. Cal Date Due. Date

148650 2024-02-24 2025-02-23

114403 2024-02-27 2025-02-26

US471401 02
MY543205 48
3610A014 53
MY470702 02

2024-03-19 2024-02-24 2024-02-24 2024-02-24

2025-03-18 2025-02-23 2025-02-23 2025-02-23

PM204 2024-02-29 2025-02-28

836079/03 2024-02-24 2025-02-23
5 101611 2024-03-19 2025-03-18 2805A034
2024-02-24 2025-02-23 75 9773 2024-02-26 2025-02-25
9163-333 2024-02-24 2025-02-23

836079/03 2024-02-24 2025-02-23
5 101611 2024-03-19 2025-03-18

2002 2024-02-27 2025-02-26

00086197 2024-02-26 2025-02-25

571

2024-03-17 2025-03-16

9721-031 2024-02-29 2025-02-28

Reference No.: WTX24X03058022W

Chamber B:Below 1GHz

WTXE1010A 1006

Trilog Broadband
Antenna

WTXE1038A 1001

Amplifier

WTXE1001A EMI Test

1002

Receiver

Chamber C:Below 1GHz

WTXE1093A EMI Test

1001

Receiver

WTXE1010A 1013-1

Trilog Broadband
Antenna

WTXE1007A 1002

Amplifier

WTXE1010A Loop Antenna
1007

Chamber C: Above 1GHz

WTXE1093A EMI Test

1001

Receiver

WTXE1103A Horn Antenna
1005

WTXE1103A 1006

Amplifier

WTXE1010A DRG Horn

1010

Antenna

WTXE1003A Pre-amplifier
1001

Conducted Room 1#

WTXE1104A EMI Test

1029

Receiver

WTXE1002A Pulse Limiter
1001

WTXE1003A 1001

AC LISN

Conducted Room 2#

WTXE1001A EMI Test

1004

Receiver

WTXE1003A 1003

LISN

Schwarz beck
Agilent Rohde & Schwarz
Rohde & Schwarz
Schwarz beck
HP
Schwarz beck
Rohde & Schwarz POAM
Tonscend
A.H. SYSTEMS
Schwarzbeck
Rohde & Schwarz Rohde & Schwarz Schwarz beck
Rohde & Schwarz Rohde & Schwarz

VULB9163(B) 8447D ESPI
ESIB 26 VULB 9168
8447F FMZB 1516
ESIB 26 RTF-118A TAP01018050 SAS-574 BBV 9721
ESCI ESH3-Z2 NSLK8126
ESPI ENV 216

9163-635 2024-03-17 2027-03-16 2944A104
2024-02-24 2025-02-23 57 101391 2024-02-24 2025-02-23

100401 2024-02-27 2025-02-26
1194 2021-05-28 2024-05-27 2944A038
2024-02-24 2025-02-23 69 9773 2024-02-26 2025-02-25

100401 2024-02-27 2025-02-26

1820 2023-03-10 2026-03-09

AP22E806 2024-02-27 2025-02-26
235

571

2024-03-17 2025-03-16

9721-031 2024-02-29 2025-02-28

100525 2023-12-12 2024-12-11 100911 2024-02-24 2025-02-23 8126-279 2024-02-24 2025-02-23

101259 2024-02-24 2025-02-23 100097 2024-02-24 2025-02-23

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Reference No.: WTX24X03058022W

Description EMI Test Software (Radiated Emission)* EMI Test Software (Conducted Emission Room
1#)* EMI Test Software (Conducted Emission Room
2#)*

Software List Manufacturer
Farad
Farad
SKET

Model EZ-EMC EZ-EMC
EMC-I

*Remark: indicates software version used in the compliance certification testing.

Version RA-03A1 RA-03A1
V2.0

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Reference No.: WTX24X03058022W
2. SUMMARY OF TEST RESULTS

FCC Rules §15.203; §15.247(b)(4)(i)
§15.205 §15.207(a) §15.209(a) §15.247(a)(1)(i) §15.247(a)(1) (i) §15.247(a)(1) (i) §15.247(a) §15.247(b)(2) §15.247(d) §15.247(a)(1) §15.247(g), (h)
N/A: Not applicable.

Description of Test Item Antenna Requirement Restricted Band of Operation Conducted Emission Radiated Spurious Emissions Quantity of Hopping Channel Channel Separation Time of Occupancy (Dwell time)
20dB Bandwidth RF Power Output Band Edge (Out of Band Emissions) Frequency Hopping Sequence Frequency Hopping System

Result Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant Compliant

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3. Antenna Requirement
3.1 Standard Applicable
According to FCC Part 15.203, an intentional radiator shall be designed to ensure that no antenna other than that furnished by the responsible party shall be used with the device. The use of a permanently attached antenna or of an antenna that uses a unique coupling to the intentional radiator shall be considered sufficient to comply with the provisions of this section. 3.2 Evaluation Information This product has an external antenna fulfill the requirement of this section.

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Reference No.: WTX24X03058022W
4. Frequency Hopping System Requirements
4.1 Standard Applicable
According to FCC Part 15.247(a)(1), the system shall hop to channel frequencies that are selected at the system hopping rate from a pseudo randomly ordered list of hopping frequencies. Each frequency must be used equally on the average by each transmitter. The system receivers shall have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shall shift frequencies in synchronization with the transmitted signals.
(g) Frequency hopping spread spectrum systems are not required to employ all available hopping channels during each transmission. However, the system, consisting of both the transmitter and the receiver, must be designed to comply with all of the regulations in this section should the transmitter be presented with a continuous data (or information) stream. In addition, a system employing short transmission bursts must comply with the definition of a frequency hopping system and must distribute its transmissions over the minimum number of hopping channels specified in this section.
(h) The incorporation of intelligence within a frequency hopping spread spectrum system that permits the system to recognize other users within the spectrum band so that it individually and independently chooses and adapts its hopsets to avoid hopping on occupied channels is permitted. The coordination of frequency hopping systems in any other manner for the express purpose of avoiding the simultaneous occupancy of individual hopping frequencies by multiple transmitters is not permitted.
4.2 Frequency Hopping System
This transmitter device is frequency hopping device, and complies with FCC part 15.247 rule.
This device uses transmitter radio which operates in 902-928MHz band. It uses a radio technology called frequency-hopping spread spectrum, which chops up the data being sent and transmits chunks of it on up to 52 bands (0.5MHz each; centred from 902.25 to 927.75MHz) in the range 902-928MHz.
This device was tested with a system receiver to check that the device maintained hopping synchronization, and the device complied with these requirements for 558074 D01 15.247 Meas Guidance v05r02 and FCC Part 15.247 rule.

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Reference No.: WTX24X03058022W
4.3 EUT Pseudorandom Frequency Hopping Sequence
Pseudorandom Frequency Hopping Sequence Table as below: Channel: 34, 40, 3, 16, 27, 7, 31, 22, 1, 29, 15, 39, 47, 50, 38, 52, 10, 44, 17, 8, 49, 13, 2, 48, 14, 25, 51, 6, 37, 12, 30, 46, 18, 42, 23, 19, 36, 43, 11, 28, 5, 45, 24, 9, 32, 20, 41, 26, 4, 33, 21, 35
The system receiver have input bandwidths that match the hopping channel bandwidths of their corresponding transmitters and shift frequencies in synchronization with the transmitted signals.

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5. Quantity of Hopping Channels and Channel Separation
5.1 Standard Applicable
According to FCC 15.247(a)(i), for frequency hopping systems operating in the 902-928MHz band: if the 20dB bandwidth of the hopping channel is less than 250kHz, the system shall use at least 50 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 20 second period; if the 20dB bandwidth of the hopping channel is 250kHz or greater, the system shall use at least 25 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 10 second period. The maximum allowed 20dB bandwidth of the hopping channel is 500kHz.
5.2 Test Setup Block Diagram

5.3 Test Procedure

According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.3, the number of hopping frequencies test method as follows.

a) Span: The frequency band of operation. Depending on the number of channels the device supports, it may be necessary to divide the frequency range of operation across multiple spans, to allow the individual channels to be clearly seen. b) RBW: To identify clearly the individual channels, set the RBW to less than 30% of the channel spacing or the 20 dB bandwidth, whichever is smaller. c) VBW  RBW. d) Sweep: Auto. e) Detector function: Peak. f) Trace: Max hold. g) Allow the trace to stabilize.

According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.2, the EUT shall have its hopping function enabled, the Carrier frequency separation test method as follows:

a) Span: Wide enough to capture the peaks of two adjacent channels.

b) RBW: Start with the RBW set to approximately 30% of the channel spacing; adjust as necessary to best

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Reference No.: WTX24X03058022W
identify the center of each individual channel. c) Video (or average) bandwidth (VBW)  RBW. d) Sweep: Auto. e) Detector function: Peak. f) Trace: Max hold. g) Allow the trace to stabilize. Use the marker-delta function to determine the separation between the peaks of the adjacent channels.
5.4 Summary of Test Results/Plots
Please refer to Appendix A

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6. Dwell Time of Hopping Channel
6.1 Standard Applicable
According to FCC 15.247(a)(i), For frequency hopping systems operating in the 902-928MHz band: if the 20dB bandwidth of the hopping channel is less than 250kHz, the system shall use at least 50 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 20 second period; if the 20dB bandwidth of the hopping channel is 250kHz or greater, the system shall use at least 25 hopping frequencies and the average time of occupancy on any frequency shall not be greater than 0.4 seconds within a 10 second period. The maximum allowed 20dB bandwidth of the hopping channel is 500kHz.
6.2 Test Setup Block Diagram

6.3 Test Procedure
According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.4, the dwell time of a hopping channel test method as follows.

a) Span: Zero span, centered on a hopping channel. b) RBW shall be  channel spacing and where possible RBW should be set >> 1 / T, where T is the expected dwell time per channel. c) Sweep: As necessary to capture the entire dwell time per hopping channel; where possible use a video trigger and trigger delay so that the transmitted signal starts a little to the right of the start of the plot. The trigger level might need slight adjustment to prevent triggering when the system hops on an adjacent channel; a second plot might be needed with a longer sweep time to show two successive hops on a channel. d) Detector function: Peak. e) Trace: Max hold.

Use the marker-delta function to determine the transmit time per hop. If this value varies with different modes

of operation (data rate, modulation format, number of hopping channels, etc.), then repeat this test for each

variation in transmit time.

Repeat the measurement using a longer sweep time to determine the number of hops over the period

specified in the requirements. The sweep time shall be equal to, or less than, the period specified in the

requirements. Determine the number of hops over the sweep time and calculate the total number of hops in

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Reference No.: WTX24X03058022W
the period specified in the requirements, using the following equation: (Number of hops in the period specified in the requirements) = (number of hops on spectrum analyzer) × (period specified in the requirements / analyzer sweep time) The average time of occupancy is calculated from the transmit time per hop multiplied by the number of hops in the period specified in the requirements. If the number of hops in a specific time varies with different modes of operation (data rate, modulation format, number of hopping channels, etc.), then repeat this test for each variation. The measured transmit time and time between hops shall be consistent with the values described in the operational description for the EUT.
6.4 Summary of Test Results/Plots
Please refer to Appendix B

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Reference No.: WTX24X03058022W
7. 20dB Bandwidth
7.1 Standard Applicable
According to 15.247(a) and 15.215(c), 20dB bandwidth is recommended that the fundamental emission be kept within at least the central 80% of the permitted band in order to minimize the possibility of out-of-band operation.
7.2 Test Setup Block Diagram

7.3 Test Procedure
According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 6.9.2, the 20dB bandwidth test method as follows.

a) The spectrum analyzer center frequency is set to the nominal EUT channel center frequency. The span

range for the EMI receiver or spectrum analyzer shall be between two times and five times the OBW.

b) The nominal IF filter bandwidth (3dB RBW) shall be in the range of 1% to 5% of the OBW and video

bandwidth (VBW) shall be approximately three times RBW, unless otherwise specified by the applicable

requirement.

c) Set the reference level of the instrument as required, keeping the signal from exceeding the maximum input

mixer level for linear operation. In general, the peak of the spectral envelope shall be more than [10 log

(OBW/RBW)] below the reference level.

d) Steps a) through c) might require iteration to adjust within the specified tolerances.

e) The dynamic range of the instrument at the selected RBW shall be more than 10 dB below the target "-xx

dB down" requirement; that is, if the requirement calls for measuring the -20dB OBW, the instrument noise

floor at the selected RBW shall be at least 30dB below the reference value.

f) Set detection mode to peak and trace mode to max hold.

g) Determine the reference value: Set the EUT to transmit an unmodulated carrier or modulated signal, as

applicable. Allow the trace to stabilize. Set the spectrum analyzer marker to the highest level of the displayed

trace (this is the reference value).

h) Determine the "-xx dB down amplitude" using [(reference value) - xx]. Alternatively, this calculation may be

made by using the marker-delta function of the instrument.

i) If the reference value is determined by an unmodulated carrier, then turn the EUT modulation ON, and

either clear the existing trace or start a new trace on the spectrum analyzer and allow the new trace to

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Reference No.: WTX24X03058022W
stabilize. Otherwise, the trace from step g) shall be used for step j). j) Place two markers, one at the lowest frequency and the other at the highest frequency of the envelope of the spectral display, such that each marker is at or slightly below the "-xx dB down amplitude" determined in step h). If a marker is below this "-xx dB down amplitude" value, then it shall be as close as possible to this value. The occupied bandwidth is the frequency difference between the two markers. Alternatively, set a marker at the lowest frequency of the envelope of the spectral display, such that the marker is at or slightly below the "-xx dB down amplitude" determined in step h). Reset the marker-delta function and move the marker to the other side of the emission until the delta marker amplitude is at the same level as the reference marker amplitude. The marker-delta frequency reading at this point is the specified emission bandwidth. k) The occupied bandwidth shall be reported by providing plot(s) of the measuring instrument display; the plot axes and the scale units per division shall be clearly labeled. Tabular data may be reported in addition to the plot(s).
7.4 Summary of Test Results/Plots
Please refer to Appendix C

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Reference No.: WTX24X03058022W
8. RF Output Power
8.1 Standard Applicable
According to 15.247(b)(2), for frequency hopping systems operating in the 902-928MHz band: 1 watt for systems employing at least 50 hopping channels; and, 0.25 watts for systems employing less than 50 hopping channels, but at least 25 hopping channels, as permitted under paragraph (a)(1)(i) of this section.
8.2 Test Setup Block Diagram

8.3 Test Procedure
According to KDB 558074 D01 v05r02 Sub clause 9 and ANSI C63.10-2013 section 7.8.5, the output power test method as follows. Remove the antenna from the EUT and then connect a low loss RF cable from the antenna port to the spectrum analyzer. This is an RF-conducted test to evaluate maximum peak output power. Use a direct connection between the antenna port of the unlicensed wireless device and the spectrum analyzer, through suitable attenuation. The hopping shall be disabled for this test: a) Use the following spectrum analyzer settings:
1) Span: Approximately five times the 20dB bandwidth, centered on a hopping channel. 2) RBW > 20dB bandwidth of the emission being measured. 3) VBW  RBW. 4) Sweep: Auto. 5) Detector function: Peak. 6) Trace: Max hold. b) Allow trace to stabilize. c) Use the marker-to-peak function to set the marker to the peak of the emission. d) The indicated level is the peak output power, after any corrections for external attenuators and cables. e) A plot of the test results and setup description shall be included in the test report.
8.4 Summary of Test Results/Plots
Please refer to Appendix D

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Reference No.: WTX24X03058022W
9. Field Strength of Spurious Emissions
9.1 Standard Applicable
According to §15.247(d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a).
The emission limit in this paragraph is based on measurement instrumentation employing an average detector. The provisions in §15.35 for limiting peak emissions apply. Spurious Radiated Emissions measurements starting below or at the lowest crystal frequency.
9.2 Test Procedure
The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.205 15.247(a) and FCC Part 15.209 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm.
The test setup for emission measurement below 30MHz.

Semi-anechoic 3m Chamber Turn Table From 0to 360

3m EUT

0.8m

Turn Table

PC System
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Spectrum Analyzer
Page 23 of 52

AMP

Combining Network

Reference No.: WTX24X03058022W The test setup for emission measurement from 30MHz to 1GHz.

Semi-anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0°to 360°
3m
EUT

0.8m

Turn Table

PC System

Spectrum Analyzer

The test setup for emission measurement above 1GHz.

AMP

Combining Network

Anechoic 3m Chamber

Antenna Elevation Varies From 1 to 4m

Turn Table From 0°to 360°

EUT

3m

1.5m

Turn Table

Absorbers

PC System

Spectrum Analyzer

Frequency :9kHz-30MHz RBW=10KHz, VBW =30KHz Sweep time= Auto Trace = max hold

Frequency :30MHz-1GHz RBW=120KHz, VBW=300KHz Sweep time= Auto
Trace = max hold

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AMP

Combining Network

Frequency :Above 1GHz RBW=1MHz, VBW=3MHz(Peak), 10Hz(AV)
Sweep time= Auto Trace = max hold

Reference No.: WTX24X03058022W

Detector function = peak

Detector function = peak, QP

Detector function = peak, AV

9.3 Corrected Amplitude & Margin Calculation

The Corrected Amplitude is calculated by adding the Antenna Factor and the Cable Factor, and subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows:

Corr. Ampl. = Indicated Reading + Correct Correct = Ant. Factor + Cable Loss ­ Ampl. Gain

The "Margin" column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of -6dBV means the emission is 6dBV below the maximum limit. The equation for margin calculation is as follows:

Margin = Corr. Ampl. ­ FCC Part 15 Limit
9.4 Summary of Test Results/Plots
Note: this EUT was tested in 3 orthogonal positions and the worst case position data was reported. All test modes (different data rate and different modulation) are performed, but only the worst case (GFSK) is recorded in this report.

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Reference No.: WTX24X03058022W

 Spurious Emissions Below 1GHz

Test Channel

Low Channel

Polarity:

Horizontal

No. Frequency Reading Correct Result

Limit Margin Degree Height Remark

(MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm)

1

44.7793

35.55

-8.47

27.08

40.00 -12.92

-

-

QP

2

67.7856

40.85 -10.36 30.49

40.00

-9.51

-

-

QP

3 214.6063 41.76 -12.13 29.63

43.50 -13.87

-

-

QP

4 250.4859 48.01 -10.18 37.83

46.00

-8.17

-

-

QP

5 363.5231 34.50

-6.76

27.74

46.00 -18.26

-

-

QP

6 669.9523 41.54

-1.27

40.27

46.00

-5.73

-

-

QP

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Reference No.: WTX24X03058022W

Test Channel

Low Channel

Polarity:

Vertical

No. Frequency Reading Correct Result

Limit Margin Degree Height Remark

(MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm)

1

45.7333

43.01

-8.41

34.60

40.00

-5.40

-

-

QP

2

56.4662

43.71

-8.72

34.99

40.00

-5.01

-

-

QP

3

68.7450

43.68 -10.54 33.14

40.00

-6.86

-

-

QP

4 343.6506 42.41

-7.22

35.19

46.00 -10.81

-

-

QP

5 628.8936 43.99

-1.38

42.61

46.00

-3.39

-

-

QP

6 655.9766 44.21

-1.30

42.91

46.00

-3.09

-

-

QP

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Reference No.: WTX24X03058022W

Test Channel

Middle Channel

Polarity:

Horizontal

No. Frequency Reading Correct Result

Limit Margin Degree Height Remark

(MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm)

1

35.7617

35.21

-9.39

25.82

40.00 -14.18

-

-

QP

2

65.4452

42.25

-9.93

32.32

40.00

-7.68

-

-

QP

3 156.4259 32.39

-8.60

23.79

43.50 -19.71

-

-

QP

4 250.4859 48.66 -10.18 38.48

46.00

-7.52

-

-

QP

5 628.8936 38.60

-1.38

37.22

46.00

-8.78

-

-

QP

6 665.2610 40.65

-1.27

39.38

46.00

-6.62

-

-

QP

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Reference No.: WTX24X03058022W

Test Channel

Middle Channel

Polarity:

Vertical

No. Frequency Reading Correct Result

Limit Margin Degree Height Remark

(MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm)

1

58.0759

43.52

-8.82

34.70

40.00

-5.30

-

-

QP

2 101.8932 40.78 -12.32 28.46

43.50 -15.04

-

-

QP

3

222.2807

41.42

-11.97

29.45

46.00 -16.55

-

-

QP

4 338.8546 40.67

-7.31

33.36

46.00 -12.64

-

-

QP

5 502.2473 42.45

-3.87

38.58

46.00

-7.42

-

-

QP

6 628.8936 44.56

-1.38

43.18

46.00

-2.82

-

-

QP

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Reference No.: WTX24X03058022W

Test Channel

High Channel

Polarity:

Horizontal

No. Frequency Reading Correct Result

Limit Margin Degree Height Remark

(MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm)

1

35.7617

35.43

-9.39

26.04

40.00 -13.96

-

-

QP

2

65.9067

40.53 -10.02 30.51

40.00

-9.49

-

-

QP

3 207.1968 43.23 -12.13 31.10

43.50 -12.40

-

-

QP

4 250.4859 47.49 -10.18 37.31

46.00

-8.69

-

-

QP

5 628.8936 38.22

-1.38

36.84

46.00

-9.16

-

-

QP

6 669.9523 40.43

-1.27

39.16

46.00

-6.84

-

-

QP

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Reference No.: WTX24X03058022W

Test Channel

High Channel

Polarity:

Vertical

No. Frequency Reading Correct Result

Limit Margin Degree Height Remark

(MHz) (dBuV/m) dB/m (dBuV/m) (dBuV/m) (dB) ( ) (cm)

1

44.7793

43.44

-8.47

34.97

40.00

-5.03

-

-

QP

2

66.3715

45.07

-10.11

34.96

40.00

-5.04

-

-

QP

3 202.8745 43.01 -12.04 30.97

43.50 -12.53

-

-

QP

4 346.0740 42.01

-7.18

34.83

46.00 -11.17

-

-

QP

5 502.2473 43.18

-3.87

39.31

46.00

-6.69

-

-

QP

6 628.8936 43.94

-1.38

42.56

46.00

-3.44

-

-

QP

Remark: `-'Means' the test Degree and Height are not recorded by the test software and only show the worst case in the test report.

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Reference No.: WTX24X03058022W  Spurious Emissions Above 1GHz

Frequency Reading

(MHz)

(dBuV/m)

2706.75 2706.75 3609.00 3609.00 2706.75 2706.75 3609.00 3609.00

69.60 66.58 68.03 65.11 69.76 65.02 68.54 65.02

2744.25 2744.25 3659.00 3659.00 2744.25 2744.25 3659.00 3659.00

73.81 70.95 66.62 63.01 71.67 68.01 64.87 61.22

2783.25 2783.25 3711.00 3711.00 2783.25 2783.25 3711.00 3711.00

73.41 70.25 66.45 63.02 73.3 70.24 62.25 60.02

Correct dB
-18.26 -18.26 -14.32 -14.32 -18.26 -18.26 -14.32 -14.32
-18.16 -18.16 -14.37 -14.37 -18.16 -18.16 -14.37 -14.37
-18.07 -18.07 -14.44 -14.44 -18.07 -18.07 -14.44 -14.44

Result

Limit

(dBuV/m) (dBuV/m)

Low Channel-902.25MHz

51.34

74.00

48.32

54.00

53.71

74.00

50.79

54.00

51.50

74.00

46.76

54.00

54.22

74.00

50.70

54.00

Middle Channel-914.75MHz

55.65

74.00

52.79

54.00

52.25

74.00

48.64

54.00

53.51

74.00

49.85

54.00

50.50

74.00

46.85

54.00

High Channel-927.75MHz

55.34

74.00

52.18

54.00

52.01

74.00

48.58

54.00

55.23

74.00

52.17

54.00

47.81

74.00

45.58

54.00

Margin (dB)
-22.66 -5.68 -20.29 -3.21 -22.50 -7.24 -19.78 -3.30
-18.35 -1.21 -21.75 -5.36 -20.49 -4.15 -23.50 -7.15
-18.66 -1.82 -21.99 -5.42 -18.77 -1.83 -26.19 -8.42

Polar H/V
H H H H V V V V
H H H H V V V V
H H H H V V V V

Detector
PK AV PK AV PK AV PK AV
PK AV PK AV PK AV PK AV
PK AV PK AV PK AV PK AV

Note: Testing is carried out with frequency rang 9kHz to the tenth harmonics, other than listed in the table above are attenuated more than 20dB below the permissible limits or the field strength is too small to be measured.

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Reference No.: WTX24X03058022W

10. Out of Band Emissions

10.1 Standard Applicable
According to §15.247 (d), in any 100kHz bandwidth outside the frequency band in which the spread spectrum or digitally modulated intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20dB below that in the 100kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement, provided the transmitter demonstrates compliance with the peak conducted power limits. If the transmitter complies with the conducted power limits based on the use of RMS averaging over a time interval, as permitted under paragraph (b)(3) of this section, the attenuation required under this paragraph shall be 30dB instead of 20dB. Attenuation below the general limits specified in §15.209(a) is not required. In addition, radiated emissions which fall in the restricted bands, as defined in §15.205(a), must also comply with the radiated emission limits specified in §15.209(a).
10.2 Test Procedure

According to ANSI C63.10-2013 section 7.8.6, the Band-edge measurements for RF conducted emissions test method as follows.

a) Connect the EMI receiver or spectrum analyzer to the EUT using an appropriate RF cable connected to the EUT output. Configure the spectrum analyzer settings as described in step e) (be sure to enter all losses between the unlicensed wireless device output and the spectrum analyzer). b) Set the EUT to the lowest frequency channel (for the hopping on test, the hopping sequence shall include the lowest frequency channel). c) Set the EUT to operate at maximum output power and 100% duty cycle, or equivalent "normal mode of operation" as specified in 6.10.3. d) If using the radiated method, then use the applicable procedure(s) of 6.4, 6.5, or 6.6, and orient the EUT and measurement antenna positions to produce the highest emission level. e) Perform the test as follows:
1) Span: Wide enough to capture the peak level of the emission operating on the channel closest to the band edge, as well as any modulation products that fall outside of the authorized band of operation.
2) Reference level: As required to keep the signal from exceeding the maximum instrument input mixer level for linear operation. In general, the peak of the spectral envelope shall be more than [10 log (OBW/RBW)] below the reference level. Specific guidance is given in 4.1.5.2.
3) Attenuation: Auto (at least 10 dB preferred). 4) Sweep time: Coupled. 5) Resolution bandwidth: 100kHz. 6) Video bandwidth: 300kHz. 7) Detector: Peak. 8) Trace: Max hold. f) Allow the trace to stabilize. For the test with the hopping function turned ON, this can take several minutes

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Reference No.: WTX24X03058022W
to achieve a reasonable probability of intercepting any emissions due to oscillator overshoot. g) Set the marker on the emission at the band edge, or on the highest modulation product outside of the band, if this level is greater than that at the band edge. Enable the marker-delta function, and then use the marker-to-peak function to move the marker to the peak of the in-band emission. h) Repeat step c) through step e) for every applicable modulation. i) Set the EUT to the highest frequency channel (for the hopping on test, the hopping sequence shall include the highest frequency channel) and repeat step c) through step d). j) The band-edge measurement shall be reported by providing plot(s) of the measuring instrument display; the plot axes and the scale units per division shall be clearly labeled. Tabular data may be reported in addition to the plot(s).
Restricted-band band-edge test method please refers to ANSI C63.10-2013 section 6.10.5. The emission must comply with the 15.209 limit for fall in the restricted bands listed in section 15.205. Note that the method of measurement KDB publication number: 913591 may be used for the radiated band-edge measurements.
According to ANSI C63.10-2013 section 7.8.8, Conducted spurious emissions shall be measured for the transmit frequency, per 5.5 and 5.6, and at the maximum transmit powers. Connect the primary antenna port through an attenuator to the spectrum analyzer input; in the results, account for all losses between the unlicensed wireless device output and the spectrum analyzer. The instrument shall span 30MHz to 10 times the operating frequency in GHz, with a resolution bandwidth of 100kHz, video bandwidth of 300kHz, and a coupled sweep time with a peak detector. The band 30MHz to the highest frequency may be split into smaller spans, as long as the entire spectrum is covered.
10.3 Summary of Test Results/Plots
Please refer to Appendix E

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Reference No.: WTX24X03058022W
11. Conducted Emissions
11.1 Test Procedure
The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.207 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm.
11.2 Basic Test Setup Block Diagram

0.4m 0.8m

EUT

LISN

Receiver PC System 0.8m

:50 Terminator
11.3 Test Receiver Setup
During the conducted emission test, the test receiver was set with the following configurations:
Start Frequency............................................................................. 150kHz Stop Frequency............................................................................. 30MHz Sweep Speed.................................................................................Auto IF Bandwidth.................................................................................. 10kHz Quasi-Peak Adapter Bandwidth.................................................. 9kHz Quasi-Peak Adapter Mode...........................................................Normal
11.4 Summary of Test Results/Plots

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Reference No.: WTX24X03058022W

Test Mode

Communication AC120V 60Hz

Polarity:

Neutral

No.

Frequency

Reading Factor

dBuV

dB

Level dBuV

1*

154.000kHz

43.0

9.7

52.7

2*

494.000kHz

37.8

9.6

47.4

3*

5.650MHz

24.2

9.8

34.0

4*

238.000kHz

24.5

9.8

34.3

5*

486.000kHz

26.4

9.7

36.1

6*

19.582MHz

22.6

9.8

32.4

Limit dBuV 65.8 56.1 60.0 52.2 46.2 50.0

Delta dB
-13.1 -8.7 -26.0 -17.8 -10.1 -17.6

Detector
PK PK PK AV AV AV

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Reference No.: WTX24X03058022W

Test Mode

Communication AC120V 60Hz

Polarity:

Line

No.

Frequency

Reading Factor

dBuV

dB

Level dBuV

1*

158.000kHz

42.7

9.9

52.6

2*

498.000kHz

37.5

9.7

47.2

3*

20.322MHz

31.1

10.0

41.1

4*

202.000kHz

26.1

9.6

35.7

5*

510.000kHz

27.0

9.7

36.7

6*

20.322MHz

25.9

10.0

35.9

Limit dBuV 65.6 56.0 60.0 53.5 46.0 50.0

Delta dB
-12.9 -8.9 -18.9 -17.8 -9.3 -14.1

Detector
PK PK PK AV AV AV

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Reference No.: WTX24X03058022W
APPENDIX SUMMARY

Project No. Start date Temperature RF specifications

WTX24X03058022W 2024/4/2 23.1 900MHz-FHSS

Test Engineer Finish date Humidity

BAIdi Zhong 2024/4/3 56%

APPENDIX A B C D E

Description of Test Item Hopping Channels and Channel Separation
Dwell Time of Hopping Channel 20dB Bandwidth & 99% Bandwidth
RF Output Power Conducted Out of Band Emissions

Result Compliant Compliant Compliant Compliant Compliant

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Reference No.: WTX24X03058022W
APPENDIX A

Hopping Channels Number Mode FHSS

Test Result 52

Limit 50

Result Pass

FHSS

Ref 30.5 dBm 30 Of1fset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

* RBW 100 kHz * VBW 300 kHz
SWT 5 ms

Delta 1 [T1 ] 0.52 dB
25.560000000 MHz
Marker 1 [T1 ] 1 24.99 dBm
902.220000000 MHz A

LVL

75 3DB

Start 900 MHz

3 MHz/

Stop 930 MHz

Date: 2.APR.2024 18:32:24

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Reference No.: WTX24X03058022W

Channel Separation Mode
FHSS

Channel Low
Middle High

Carrier Frequencies Separation (kHz) 500 500 500

Result Pass Pass Pass

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Reference No.: WTX24X03058022W

Low Middle High

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Delta 1 [T1 ] -0.04 dB
500.000000000 kHz

1

Mar1ker 1 [T1 ]

25.03 dBm

902.262000000 MHz A

LVL

75 3DB

Center 902.25 MHz

200 kHz/

Span 2 MHz

Date: 2.APR.2024 18:34:21

Ref 30.5 dBm 30 Offset 1 dB 1

* Att 40 dB

20
1 PK MAXH
10

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Delta 1 [T1 ] -0.08 dB
500.000000000 kHz

Marker 1 [T1 ] 1
23.55 dBm
914.262000000 MHz A

LVL

0

-10 -20 -30

75 3DB

-40

-50

-60

Center 914.75 MHz

200 kHz/

Span 2 MHz

Date: 2.APR.2024 19:48:51

Ref 30.5 dBm 30 Offset 1 dB 1

* Att 40 dB

20
1 PK MAXH
10

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms
1

Delta 1 [T1 ] -0.01 dB
500.000000000 kHz
Marker 1 [T1 ] 25.47 dBm
927.262000000 MHz A

LVL

0

-10 -20 -30

75 3DB

-40

-50

-60

Center 927.75 MHz

200 kHz/

Span 2 MHz

Date: 2.APR.2024 18:35:47

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Reference No.: WTX24X03058022W
APPENDIX B

Test Channel
Low Middle High

Test period (s) 20 20 20

Number of Bursts per Hopping Period 3 3 4

Burst Duration (ms) 93.6 93.9 93.9

Dwell time (ms) 280.8 281.7 375.6

Limit (ms) 400 400 400

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Reference No.: WTX24X03058022W

Low Middle

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20
1 PK MAXH
10

TRG 16.4 dBm

0

RBW 100 kHz * VBW 300 kHz
SWT 150 ms

Delta 1 [T1 ] 1.09 dB
93.600000 ms

Marker 1 [T1 ]

-41.32 dBm

-400.000000 µs

A

TRG LVL

-10
-20
-30 1
-40

75 3DB 1

-50

-60

Center 902.25 MHz

15 ms/

Date: 2.APR.2024 18:39:02

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

RBW 100 kHz * VBW 300 kHz
SWT 20 s

Center 902.25 MHz

2 s/

A SGL LVL
75 3DB

Date: 2.APR.2024 18:39:35

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20
1 PK MAXH
10

TRG 16.4 dBm

0

RBW 100 kHz * VBW 300 kHz
SWT 150 ms

Delta 1 [T1 ] -0.42 dB
93.900000 ms

Marker 1 [T1 ]

-39.67 dBm

-700.000000 µs

A

TRG LVL

-10
-20
-30 1
-40

75 3DB 1

-50

-60

Center 914.75 MHz

15 ms/

Date: 2.APR.2024 18:38:07

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 43 of 52

Reference No.: WTX24X03058022W

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

RBW 100 kHz * VBW 300 kHz
SWT 20 s

Center 914.75 MHz

2 s/

A SGL LVL
75 3DB

Date: 2.APR.2024 18:40:10

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20
1 PK MAXH
10

TRG 16.4 dBm

0

RBW 100 kHz * VBW 300 kHz
SWT 150 ms

Delta 1 [T1 ] 0.64 dB
93.900000 ms

Marker 1 [T1 ]

-41.17 dBm

-700.000000 µs

A

TRG LVL

-10
-20
-30 1
-40

75 3DB 1

-50

-60

Center 927.75 MHz

15 ms/

High

Date: 2.APR.2024 18:38:35

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

RBW 100 kHz * VBW 300 kHz
SWT 20 s

Center 927.75 MHz

2 s/

A SGL LVL
75 3DB

Date: 2.APR.2024 18:41:54

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 44 of 52

Reference No.: WTX24X03058022W
APPENDIX C

20 dB Bandwidth Test Mode FHSS

Test Channel MHz Low Middle High

20 dB Bandwidth MHz 0.169 0.168 0.165

Result
Pass Pass Pass

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 45 of 52

Reference No.: WTX24X03058022W

Low

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20

1 PK
MAXH 10

D1 4.74 dBm

1

0

* RBW 3 kHz * VBW 10 kHz
SWT 60 ms

Delta 1 [T1 ] 1.18 dB
169.000000000 kHz

2

Marker 1 [T1 ]

1.16 dBm 902.177000000 MHz A

Marker 2 [T1 ]

24.76 dBm

902.262000000 MHz LVL

1

-10 -20 -30

75 3DB

-40

-50

-60

Center 902.25 MHz

50 kHz/

Span 500 kHz

Middle

Date: 2.APR.2024 18:53:49

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20
1 PK MAXH
10
D1 4.91 dBm 1
0

* RBW 3 kHz * VBW 10 kHz
SWT 60 ms

Delta 1 [T1 ] 1.93 dB
168.000000000 kHz

2

Marker 1 [T1 ]

0.26 dBm 914.677000000 MHz A

Marker 2 [T1 ]

24.91 dBm

914.762000000 MHz LVL

1

-10 -20 -30

75 3DB

-40

-50

-60

Center 914.75 MHz

50 kHz/

Span 500 kHz

High

Date: 2.APR.2024 19:00:02

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20
1 PK MAXH
10 1
D1 5.14 dBm
0

* RBW 3 kHz * VBW 10 kHz
SWT 60 ms

Delta 1 [T1 ] 0.57 dB
165.000000000 kHz

2

Marker 1 [T1 ]

4.69 dBm 927.678000000 MHz A

Marker 2 [T1 ]

25.14 dBm

1

927.763000000 MHz LVL

-10 -20 -30

75 3DB

-40

-50

-60

Center 927.75 MHz

50 kHz/

Span 500 kHz

Date: 2.APR.2024 19:04:40

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 46 of 52

Reference No.: WTX24X03058022W
APPENDIX D

RF Output Power Modulation type
FHSS

Channel Low
Middle High

Output power (dBm) 24.72 24.78 25.10

Limit (dBm) 27.94

Result Pass

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 47 of 52

Reference No.: WTX24X03058022W

Low Middle High

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

* RBW 300 kHz * VBW 1 MHz
SWT 2.5 ms

Marker 1 [T1 ] 24.72 dBm
902.264000000 MHz

1

A

LVL

75 3DB

Center 902.25 MHz

100 kHz/

Span 1 MHz

Date: 2.APR.2024 18:54:01

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

* RBW 300 kHz * VBW 1 MHz
SWT 2.5 ms

Marker 1 [T1 ] 24.78 dBm
914.766000000 MHz

1

A

LVL

75 3DB

Center 914.75 MHz

100 kHz/

Span 1 MHz

Date: 2.APR.2024 19:00:14

Ref 30.5 dBm 30 Offset 1 dB 20
1 PK MAXH
10
0
-10
-20
-30
-40
-50
-60

* Att 40 dB

* RBW 300 kHz * VBW 1 MHz
SWT 2.5 ms

Marker 1 [T1 ] 25.10 dBm
927.772000000 MHz

1

A

LVL

75 3DB

Center 927.75 MHz

100 kHz/

Span 1 MHz

Date: 2.APR.2024 19:03:16

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 48 of 52

Reference No.: WTX24X03058022W
APPENDIX E

Conducted Out of Band Emissions Low

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20 1 PK MAXH
10
0

D1 4.64 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Marker 2 [T1 ] -1.23 dBm
902.000000000 MHz

Marker 11 [T1 ] 24.67 dBm
902.260500000 MHz A

LVL 2

-10 -20 -30

75 3DB

-40

-50

-60

Start 900 MHz

275 kHz/

Stop 902.75 MHz

Date: 2.APR.2024 18:55:15

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20 1 PK MAXH
10
0

D1 4.64 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 1 s

Marker 1 [T1 ] -32.30 dBm
89.820000000 MHz

A

LVL

-10 -20 1-30

75 3DB

-40

-50

-60

Start 30 MHz

997 MHz/

Stop 10 GHz

Date: 2.APR.2024 18:55:43

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 49 of 52

Reference No.: WTX24X03058022W

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20 1 PK MAXH
10
0

D1 4.78 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Marker 2 [T1 ] -13.73 dBm
902.000000000 MHz

Marker 1 [1T1 ] 24.78 dBm
904.260000000 MHz A

LVL

-10

2

-20

-30

75 3DB

-40

-50

-60

Start 900 MHz

500 kHz/

Stop 905 MHz

Date: 2.APR.2024 18:47:57

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20 1 PK MAXH
10
0

D1 4.77 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Marker 1 [T1 ] 24.77 dBm
914.762000000 MHz

1

A

LVL

-10 -20 -30

75 3DB

-40

-50

-60

Center 914.75 MHz

200 kHz/

Span 2 MHz

Middle

Date: 2.APR.2024 19:07:06

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20 1 PK MAXH
10
0

D1 4.77 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 1 s

Marker 1 [T1 ] -30.67 dBm
89.820000000 MHz

A

LVL

-10
-20 1
-30

75 3DB

-40

-50

-60

Start 30 MHz

997 MHz/

Stop 10 GHz

Date: 2.APR.2024 19:07:33

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 50 of 52

Reference No.: WTX24X03058022W

Ref 30.5 dBm 30 Offset 1 dB 1

* Att 40 dB

20 1 PK MAXH
10
0

D1 5.1 dBm

2 -10

-20

-30

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Marker 2 [T1 ] -9.77 dBm
928.000000000 MHz

Marker 1 [T1 ] 25.10 dBm
927.762000000 MHz A

LVL

75 3DB

-40

-50

-60

Start 927 MHz

300 kHz/

Stop 930 MHz

High

Date: 2.APR.2024 19:02:28

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB

20 1 PK MAXH
10
0

D1 5.1 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 1 s

Marker 1 [T1 ] -22.53 dBm
49.940000000 MHz

A

LVL

-10 1-20
-30

75 3DB

-40

-50

-60

Start 30 MHz

997 MHz/

Stop 10 GHz

Date: 2.APR.2024 19:02:43

Ref 30.5 dBm 30 Offset 1 dB

* Att 40 dB 1

20 1 PK MAXH
10
0

D1 5.29 dBm

* RBW 100 kHz * VBW 300 kHz
SWT 2.5 ms

Marker 2 [T1 ] -32.49 dBm
928.000000000 MHz

Marker 1 [T1 ] 25.29 dBm
927.260000000 MHz A

LVL

-10 -20 -30

75
3DB 2

-40

-50

-60

Start 925 MHz

500 kHz/

Stop 930 MHz

Date: 2.APR.2024 18:50:49

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 51 of 52

Reference No.: WTX24X03058022W
APPENDIX PHOTOGRAPHS
Please refer to "ANNEX" ***** END OF REPORT *****

Waltek Testing Group (Shenzhen) Co., Ltd.

Http://www.waltek.com.cn

Page 52 of 52



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